2,458 research outputs found

    Quantified Derandomization of Linear Threshold Circuits

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    One of the prominent current challenges in complexity theory is the attempt to prove lower bounds for TC0TC^0, the class of constant-depth, polynomial-size circuits with majority gates. Relying on the results of Williams (2013), an appealing approach to prove such lower bounds is to construct a non-trivial derandomization algorithm for TC0TC^0. In this work we take a first step towards the latter goal, by proving the first positive results regarding the derandomization of TC0TC^0 circuits of depth d>2d>2. Our first main result is a quantified derandomization algorithm for TC0TC^0 circuits with a super-linear number of wires. Specifically, we construct an algorithm that gets as input a TC0TC^0 circuit CC over nn input bits with depth dd and n1+exp(d)n^{1+\exp(-d)} wires, runs in almost-polynomial-time, and distinguishes between the case that CC rejects at most 2n11/5d2^{n^{1-1/5d}} inputs and the case that CC accepts at most 2n11/5d2^{n^{1-1/5d}} inputs. In fact, our algorithm works even when the circuit CC is a linear threshold circuit, rather than just a TC0TC^0 circuit (i.e., CC is a circuit with linear threshold gates, which are stronger than majority gates). Our second main result is that even a modest improvement of our quantified derandomization algorithm would yield a non-trivial algorithm for standard derandomization of all of TC0TC^0, and would consequently imply that NEXP⊈TC0NEXP\not\subseteq TC^0. Specifically, if there exists a quantified derandomization algorithm that gets as input a TC0TC^0 circuit with depth dd and n1+O(1/d)n^{1+O(1/d)} wires (rather than n1+exp(d)n^{1+\exp(-d)} wires), runs in time at most 2nexp(d)2^{n^{\exp(-d)}}, and distinguishes between the case that CC rejects at most 2n11/5d2^{n^{1-1/5d}} inputs and the case that CC accepts at most 2n11/5d2^{n^{1-1/5d}} inputs, then there exists an algorithm with running time 2n1Ω(1)2^{n^{1-\Omega(1)}} for standard derandomization of TC0TC^0.Comment: Changes in this revision: An additional result (a PRG for quantified derandomization of depth-2 LTF circuits); rewrite of some of the exposition; minor correction

    Non-Malleable Codes for Small-Depth Circuits

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    We construct efficient, unconditional non-malleable codes that are secure against tampering functions computed by small-depth circuits. For constant-depth circuits of polynomial size (i.e. AC0\mathsf{AC^0} tampering functions), our codes have codeword length n=k1+o(1)n = k^{1+o(1)} for a kk-bit message. This is an exponential improvement of the previous best construction due to Chattopadhyay and Li (STOC 2017), which had codeword length 2O(k)2^{O(\sqrt{k})}. Our construction remains efficient for circuit depths as large as Θ(log(n)/loglog(n))\Theta(\log(n)/\log\log(n)) (indeed, our codeword length remains nk1+ϵ)n\leq k^{1+\epsilon}), and extending our result beyond this would require separating P\mathsf{P} from NC1\mathsf{NC^1}. We obtain our codes via a new efficient non-malleable reduction from small-depth tampering to split-state tampering. A novel aspect of our work is the incorporation of techniques from unconditional derandomization into the framework of non-malleable reductions. In particular, a key ingredient in our analysis is a recent pseudorandom switching lemma of Trevisan and Xue (CCC 2013), a derandomization of the influential switching lemma from circuit complexity; the randomness-efficiency of this switching lemma translates into the rate-efficiency of our codes via our non-malleable reduction.Comment: 26 pages, 4 figure

    Improved Extractors for Recognizable and Algebraic Sources

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    Randomness Extraction in AC0 and with Small Locality

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    Randomness extractors, which extract high quality (almost-uniform) random bits from biased random sources, are important objects both in theory and in practice. While there have been significant progress in obtaining near optimal constructions of randomness extractors in various settings, the computational complexity of randomness extractors is still much less studied. In particular, it is not clear whether randomness extractors with good parameters can be computed in several interesting complexity classes that are much weaker than P. In this paper we study randomness extractors in the following two models of computation: (1) constant-depth circuits (AC0), and (2) the local computation model. Previous work in these models, such as [Vio05a], [GVW15] and [BG13], only achieve constructions with weak parameters. In this work we give explicit constructions of randomness extractors with much better parameters. As an application, we use our AC0 extractors to study pseudorandom generators in AC0, and show that we can construct both cryptographic pseudorandom generators (under reasonable computational assumptions) and unconditional pseudorandom generators for space bounded computation with very good parameters. Our constructions combine several previous techniques in randomness extractors, as well as introduce new techniques to reduce or preserve the complexity of extractors, which may be of independent interest. These include (1) a general way to reduce the error of strong seeded extractors while preserving the AC0 property and small locality, and (2) a seeded randomness condenser with small locality.Comment: 62 page

    Improved Pseudorandom Generators from Pseudorandom Multi-Switching Lemmas

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    We give the best known pseudorandom generators for two touchstone classes in unconditional derandomization: an ε\varepsilon-PRG for the class of size-MM depth-dd AC0\mathsf{AC}^0 circuits with seed length log(M)d+O(1)log(1/ε)\log(M)^{d+O(1)}\cdot \log(1/\varepsilon), and an ε\varepsilon-PRG for the class of SS-sparse F2\mathbb{F}_2 polynomials with seed length 2O(logS)log(1/ε)2^{O(\sqrt{\log S})}\cdot \log(1/\varepsilon). These results bring the state of the art for unconditional derandomization of these classes into sharp alignment with the state of the art for computational hardness for all parameter settings: improving on the seed lengths of either PRG would require breakthrough progress on longstanding and notorious circuit lower bounds. The key enabling ingredient in our approach is a new \emph{pseudorandom multi-switching lemma}. We derandomize recently-developed \emph{multi}-switching lemmas, which are powerful generalizations of H{\aa}stad's switching lemma that deal with \emph{families} of depth-two circuits. Our pseudorandom multi-switching lemma---a randomness-efficient algorithm for sampling restrictions that simultaneously simplify all circuits in a family---achieves the parameters obtained by the (full randomness) multi-switching lemmas of Impagliazzo, Matthews, and Paturi [IMP12] and H{\aa}stad [H{\aa}s14]. This optimality of our derandomization translates into the optimality (given current circuit lower bounds) of our PRGs for AC0\mathsf{AC}^0 and sparse F2\mathbb{F}_2 polynomials

    Better Pseudorandom Generators from Milder Pseudorandom Restrictions

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    We present an iterative approach to constructing pseudorandom generators, based on the repeated application of mild pseudorandom restrictions. We use this template to construct pseudorandom generators for combinatorial rectangles and read-once CNFs and a hitting set generator for width-3 branching programs, all of which achieve near-optimal seed-length even in the low-error regime: We get seed-length O(log (n/epsilon)) for error epsilon. Previously, only constructions with seed-length O(\log^{3/2} n) or O(\log^2 n) were known for these classes with polynomially small error. The (pseudo)random restrictions we use are milder than those typically used for proving circuit lower bounds in that we only set a constant fraction of the bits at a time. While such restrictions do not simplify the functions drastically, we show that they can be derandomized using small-bias spaces.Comment: To appear in FOCS 201

    Limits to Non-Malleability

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    There have been many successes in constructing explicit non-malleable codes for various classes of tampering functions in recent years, and strong existential results are also known. In this work we ask the following question: When can we rule out the existence of a non-malleable code for a tampering class ?? First, we start with some classes where positive results are well-known, and show that when these classes are extended in a natural way, non-malleable codes are no longer possible. Specifically, we show that no non-malleable codes exist for any of the following tampering classes: - Functions that change d/2 symbols, where d is the distance of the code; - Functions where each input symbol affects only a single output symbol; - Functions where each of the n output bits is a function of n-log n input bits. Furthermore, we rule out constructions of non-malleable codes for certain classes ? via reductions to the assumption that a distributional problem is hard for ?, that make black-box use of the tampering functions in the proof. In particular, this yields concrete obstacles for the construction of efficient codes for NC, even assuming average-case variants of P ? NC

    DNF Sparsification and a Faster Deterministic Counting Algorithm

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    Given a DNF formula on n variables, the two natural size measures are the number of terms or size s(f), and the maximum width of a term w(f). It is folklore that short DNF formulas can be made narrow. We prove a converse, showing that narrow formulas can be sparsified. More precisely, any width w DNF irrespective of its size can be ϵ\epsilon-approximated by a width ww DNF with at most (wlog(1/ϵ))O(w)(w\log(1/\epsilon))^{O(w)} terms. We combine our sparsification result with the work of Luby and Velikovic to give a faster deterministic algorithm for approximately counting the number of satisfying solutions to a DNF. Given a formula on n variables with poly(n) terms, we give a deterministic nO~(loglog(n))n^{\tilde{O}(\log \log(n))} time algorithm that computes an additive ϵ\epsilon approximation to the fraction of satisfying assignments of f for \epsilon = 1/\poly(\log n). The previous best result due to Luby and Velickovic from nearly two decades ago had a run-time of nexp(O(loglogn))n^{\exp(O(\sqrt{\log \log n}))}.Comment: To appear in the IEEE Conference on Computational Complexity, 201
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