ReMeCo:Reliable Memristor-Based in-Memory Neuromorphic Computation

Memristor-based in-memory neuromorphic computing systems promise a highly efficient implementation of vector-matrix multiplications, commonly used in artificial neural networks (ANNs). However, the immature fabrication process of memristors and circuit level limitations, i.e., stuck-at-fault (SAF), IR-drop, and device-to-device (D2D) variation, degrade the reliability of these platforms and thus impede their wide deployment. In this paper, we present ReMeCo, a redundancy-based reliability improvement framework. It addresses the non-idealities while constraining the induced overhead. It achieves this by performing a sensitivity analysis on ANN. With the acquired insight, ReMeCo avoids the redundant calculation of least sensitive neurons and layers. ReMeCo uses a heuristic approach to find the balance between recovered accuracy and imposed overhead. ReMeCo further decreases hardware redundancy by exploiting the bit-slicing technique. In addition, the framework employs the ensemble averaging method at the output of every ANN layer to incorporate the redundant neurons. The efficacy of the ReMeCo is assessed using two well-known ANN models, i.e., LeNet, and AlexNet, running the MNIST and CIFAR10 datasets. Our results show 98.5% accuracy recovery with roughly 4% redundancy which is more than 20× lower than the state-of-the-art.</p

Computing-In-Memory Neural Network Accelerators for Safety-Critical Systems: Can Small Device Variations Be Disastrous?

Computing-in-Memory (CiM) architectures based on emerging non-volatile memory (NVM) devices have demonstrated great potential for deep neural network (DNN) acceleration thanks to their high energy efficiency. However, NVM devices suffer from various non-idealities, especially device-to-device variations due to fabrication defects and cycle-to-cycle variations due to the stochastic behavior of devices. As such, the DNN weights actually mapped to NVM devices could deviate significantly from the expected values, leading to large performance degradation. To address this issue, most existing works focus on maximizing average performance under device variations. This objective would work well for general-purpose scenarios. But for safety-critical applications, the worst-case performance must also be considered. Unfortunately, this has been rarely explored in the literature. In this work, we formulate the problem of determining the worst-case performance of CiM DNN accelerators under the impact of device variations. We further propose a method to effectively find the specific combination of device variation in the high-dimensional space that leads to the worst-case performance. We find that even with very small device variations, the accuracy of a DNN can drop drastically, causing concerns when deploying CiM accelerators in safety-critical applications. Finally, we show that surprisingly none of the existing methods used to enhance average DNN performance in CiM accelerators are very effective when extended to enhance the worst-case performance, and further research down the road is needed to address this problem