STT-MRAM characterization and its test implications

Spin torque transfer (STT)-magnetoresistive random-access memory (MRAM) has come a long way in research to meet the speed and power consumption requirements for future memory applications. The state-of-the-art STT-MRAM bit-cells employ magnetic tunnel junction (MTJ) with perpendicular magnetic anisotropy (PMA). The process repeatabil- ity and yield stability for wafer fabrication are some of the critical issues encountered in STT-MRAM mass production. Some of the yield improvement techniques to combat the e ect of process variations have been previously explored. However, little research has been done on defect oriented testing of STT-MRAM arrays. In this thesis, the author investi- gates the parameter deviation and non-idealities encountered during the development of a novel MTJ stack con guration. The characterization result provides motivation for the development of the design for testability (DFT) scheme that can help test and characterize STT-MRAM bit-cells and the CMOS peripheral circuitry e ciently. The primary factors for wafer yield degradation are the device parameter variation and its non-uniformity across the wafer due to the fabrication process non-idealities. There- fore, e ective in-process testing strategies for exploring and verifying the impact of the parameter variation on the wafer yield will be needed to achieve fabrication process opti- mization. While yield depends on the CMOS process variability, quality of the deposited MTJ lm, and other process non-idealities, test platform can enable parametric optimiza- tion and veri cation using the CMOS-based DFT circuits. In this work, we develop a DFT algorithm and implement a DFT circuit for parametric testing and prequali cation of the critical circuits in the CMOS wafer. The DFT circuit successfully replicates the electrical characteristics of MTJ devices and captures their spatial variation across the wafer with an error of less than 4%. We estimate the yield of the read sensing path by implement- ing the DFT circuit, which can replicate the resistance-area product variation up to 50% from its nominal value. The yield data from the read sensing path at di erent wafer loca- tions are analyzed, and a usable wafer radius has been estimated. Our DFT scheme can provide quantitative feedback based on in-die measurement, enabling fabrication process optimization through iterative estimation and veri cation of the calibrated parameters. Another concern that prevents mass production of STT-MRAM arrays is the defect formation in MTJ devices due to aging. Identifying manufacturing defects in the magnetic tunnel junction (MTJ) device is crucial for the yield and reliability of spin-torque-transfer (STT) magnetic random-access memory (MRAM) arrays. Several of the MTJ defects result in parametric deviations of the device that deteriorate over time. We extend our work on the DFT scheme by monitoring the electrical parameter deviations occurring due to the defect formation over time. A programmable DFT scheme was implemented for a sub-arrayin 65 nm CMOS technology to evaluate the feasibility of the test scheme. The scheme utilizes the read sense path to compare the bit-cell electrical parameters against known DFT cells characteristics. Built-in-self-test (BIST) methodology is utilized to trigger the onset of the fault once the device parameter crosses a threshold value. We demonstrate the operation and evaluate the accuracy of detection with the proposed scheme. The DFT scheme can be exploited for monitoring aging defects, modeling their behavior and optimization of the fabrication process. DFT scheme could potentially nd numerous applications for parametric characteriza- tion and fault monitoring of STT-MRAM bit-cell arrays during mass production. Some of the applications include a) Fabrication process feedback to improve wafer turnaround time, b) STT-MRAM bit-cell health monitoring, c) Decoupled characterization of the CMOS pe- ripheral circuitry such as read-sensing path and sense ampli er characterization within the STT-MRAM array. Additionally, the DFT scheme has potential applications for detec- tion of fault formation that could be utilized for deploying redundancy schemes, providing a graceful degradation in MTJ-based bit-cell array due to aging of the device, and also providing feedback to improve the fabrication process and yield learning

Memory Management for Emerging Memory Technologies

The Memory Wall, or the gap between CPU speed and main memory latency, is ever increasing. The latency of Dynamic Random-Access Memory (DRAM) is now of the order of hundreds of CPU cycles. Additionally, the DRAM main memory is experiencing power, performance and capacity constraints that limit process technology scaling. On the other hand, the workloads running on such systems are themselves changing due to virtualization and cloud computing demanding more performance of the data centers. Not only do these workloads have larger working set sizes, but they are also changing the way memory gets used, resulting in higher sharing and increased bandwidth demands. New Non-Volatile Memory technologies (NVM) are emerging as an answer to the current main memory issues. This thesis looks at memory management issues as the emerging memory technologies get integrated into the memory hierarchy. We consider the problems at various levels in the memory hierarchy, including sharing of CPU LLC, traffic management to future non-volatile memories behind the LLC, and extending main memory through the employment of NVM. The first solution we propose is “Adaptive Replacement and Insertion" (ARI), an adaptive approach to last-level CPU cache management, optimizing the cache miss rate and writeback rate simultaneously. Our specific focus is to reduce writebacks as much as possible while maintaining or improving miss rate relative to conventional LRU replacement policy, with minimal hardware overhead. ARI reduces writebacks on benchmarks from SPEC2006 suite on average by 32.9% while also decreasing misses on average by 4.7%. In a PCM based memory system, this decreases energy consumption by 23% compared to LRU and provides a 49% lifetime improvement beyond what is possible with randomized wear-leveling. Our second proposal is “Variable-Timeslice Thread Scheduling" (VATS), an OS kernel-level approach to CPU cache sharing. With modern, large, last-level caches (LLC), the time to fill the LLC is greater than the OS scheduling window. As a result, when a thread aggressively thrashes the LLC by replacing much of the data in it, another thread may not be able to recover its working set before being rescheduled. We isolate the threads in time by increasing their allotted time quanta, and allowing larger periods of time between interfering threads. Our approach, compared to conventional scheduling, mitigates up to 100% of the performance loss caused by CPU LLC interference. The system throughput is boosted by up to 15%. As an unconventional approach to utilizing emerging memory technologies, we present a Ternary Content-Addressable Memory (TCAM) design with Flash transistors. TCAM is successfully used in network routing but can also be utilized in the OS Virtual Memory applications. Based on our layout and circuit simulation experiments, we conclude that our FTCAM block achieves an area improvement of 7.9× and a power improvement of 1.64× compared to a CMOS approach. In order to lower the cost of Main Memory in systems with huge memory demand, it is becoming practical to extend the DRAM in the system with the less-expensive NVMe Flash, for a much lower system cost. However, given the relatively high Flash devices access latency, naively using them as main memory leads to serious performance degradation. We propose OSVPP, a software-only, OS swap-based page prefetching scheme for managing such hybrid DRAM + NVM systems. We show that it is possible to gain about 50% of the lost performance due to swapping into the NVM and thus enable the utilization of such hybrid systems for memory-hungry applications, lowering the memory cost while keeping the performance comparable to the DRAM-only system

Memory Management for Emerging Memory Technologies

The Memory Wall, or the gap between CPU speed and main memory latency, is ever increasing. The latency of Dynamic Random-Access Memory (DRAM) is now of the order of hundreds of CPU cycles. Additionally, the DRAM main memory is experiencing power, performance and capacity constraints that limit process technology scaling. On the other hand, the workloads running on such systems are themselves changing due to virtualization and cloud computing demanding more performance of the data centers. Not only do these workloads have larger working set sizes, but they are also changing the way memory gets used, resulting in higher sharing and increased bandwidth demands. New Non-Volatile Memory technologies (NVM) are emerging as an answer to the current main memory issues. This thesis looks at memory management issues as the emerging memory technologies get integrated into the memory hierarchy. We consider the problems at various levels in the memory hierarchy, including sharing of CPU LLC, traffic management to future non-volatile memories behind the LLC, and extending main memory through the employment of NVM. The first solution we propose is “Adaptive Replacement and Insertion" (ARI), an adaptive approach to last-level CPU cache management, optimizing the cache miss rate and writeback rate simultaneously. Our specific focus is to reduce writebacks as much as possible while maintaining or improving miss rate relative to conventional LRU replacement policy, with minimal hardware overhead. ARI reduces writebacks on benchmarks from SPEC2006 suite on average by 32.9% while also decreasing misses on average by 4.7%. In a PCM based memory system, this decreases energy consumption by 23% compared to LRU and provides a 49% lifetime improvement beyond what is possible with randomized wear-leveling. Our second proposal is “Variable-Timeslice Thread Scheduling" (VATS), an OS kernel-level approach to CPU cache sharing. With modern, large, last-level caches (LLC), the time to fill the LLC is greater than the OS scheduling window. As a result, when a thread aggressively thrashes the LLC by replacing much of the data in it, another thread may not be able to recover its working set before being rescheduled. We isolate the threads in time by increasing their allotted time quanta, and allowing larger periods of time between interfering threads. Our approach, compared to conventional scheduling, mitigates up to 100% of the performance loss caused by CPU LLC interference. The system throughput is boosted by up to 15%. As an unconventional approach to utilizing emerging memory technologies, we present a Ternary Content-Addressable Memory (TCAM) design with Flash transistors. TCAM is successfully used in network routing but can also be utilized in the OS Virtual Memory applications. Based on our layout and circuit simulation experiments, we conclude that our FTCAM block achieves an area improvement of 7.9× and a power improvement of 1.64× compared to a CMOS approach. In order to lower the cost of Main Memory in systems with huge memory demand, it is becoming practical to extend the DRAM in the system with the less-expensive NVMe Flash, for a much lower system cost. However, given the relatively high Flash devices access latency, naively using them as main memory leads to serious performance degradation. We propose OSVPP, a software-only, OS swap-based page prefetching scheme for managing such hybrid DRAM + NVM systems. We show that it is possible to gain about 50% of the lost performance due to swapping into the NVM and thus enable the utilization of such hybrid systems for memory-hungry applications, lowering the memory cost while keeping the performance comparable to the DRAM-only system

Cumulative index to NASA Tech Briefs, 1986-1990, volumes 10-14

Tech Briefs are short announcements of new technology derived from the R&D activities of the National Aeronautics and Space Administration. These briefs emphasize information considered likely to be transferrable across industrial, regional, or disciplinary lines and are issued to encourage commercial application. This cumulative index of Tech Briefs contains abstracts and four indexes (subject, personal author, originating center, and Tech Brief number) and covers the period 1986 to 1990. The abstract section is organized by the following subject categories: electronic components and circuits, electronic systems, physical sciences, materials, computer programs, life sciences, mechanics, machinery, fabrication technology, and mathematics and information sciences