Wearable Communications in 5G: Challenges and Enabling Technologies

As wearable devices become more ingrained in our daily lives, traditional communication networks primarily designed for human being-oriented applications are facing tremendous challenges. The upcoming 5G wireless system aims to support unprecedented high capacity, low latency, and massive connectivity. In this article, we evaluate key challenges in wearable communications. A cloud/edge communication architecture that integrates the cloud radio access network, software defined network, device to device communications, and cloud/edge technologies is presented. Computation offloading enabled by this multi-layer communications architecture can offload computation-excessive and latency-stringent applications to nearby devices through device to device communications or to nearby edge nodes through cellular or other wireless technologies. Critical issues faced by wearable communications such as short battery life, limited computing capability, and stringent latency can be greatly alleviated by this cloud/edge architecture. Together with the presented architecture, current transmission and networking technologies, including non-orthogonal multiple access, mobile edge computing, and energy harvesting, can greatly enhance the performance of wearable communication in terms of spectral efficiency, energy efficiency, latency, and connectivity.Comment: This work has been accepted by IEEE Vehicular Technology Magazin

5G Cellular: Key Enabling Technologies and Research Challenges

The evolving fifth generation (5G) cellular wireless networks are envisioned to provide higher data rates, enhanced end-user quality-of-experience (QoE), reduced end-to-end latency, and lower energy consumption. This article presents several emerging technologies, which will enable and define the 5G mobile communications standards. The major research problems, which these new technologies breed, as well as the measurement and test challenges for 5G systems are also highlighted.Comment: IEEE Instrumentation and Measurement Magazine, to appear in the June 2015 issue. arXiv admin note: text overlap with arXiv:1406.6470 by other author