Efficient Simulation of Structural Faults for the Reliability Evaluation at System-Level

In recent technology nodes, reliability is considered a part of the standard design ¿ow at all levels of embedded system design. While techniques that use only low-level models at gate- and register transfer-level offer high accuracy, they are too inefficient to consider the overall application of the embedded system. Multi-level models with high abstraction are essential to efficiently evaluate the impact of physical defects on the system. This paper provides a methodology that leverages state-of-the-art techniques for efficient fault simulation of structural faults together with transaction-level modeling. This way it is possible to accurately evaluate the impact of the faults on the entire hardware/software system. A case study of a system consisting of hardware and software for image compression and data encryption is presented and the method is compared to a standard gate/RT mixed-level approac

Measurements, Models, Systems and Design

531 s.

Sequential Circuit Design for Embedded Cryptographic Applications Resilient to Adversarial Faults

In the relatively young field of fault-tolerant cryptography, the main research effort has focused exclusively on the protection of the data path of cryptographic circuits. To date, however, we have not found any work that aims at protecting the control logic of these circuits against fault attacks, which thus remains the proverbial Achilles’ heel. Motivated by a hypothetical yet realistic fault analysis attack that, in principle, could be mounted against any modular exponentiation engine, even one with appropriate data path protection, we set out to close this remaining gap. In this paper, we present guidelines for the design of multifault-resilient sequential control logic based on standard Error-Detecting Codes (EDCs) with large minimum distance. We introduce a metric that measures the effectiveness of the error detection technique in terms of the effort the attacker has to make in relation to the area overhead spent in implementing the EDC. Our comparison shows that the proposed EDC-based technique provides superior performance when compared against regular N-modular redundancy techniques. Furthermore, our technique scales well and does not affect the critical path delay

NASA Thesaurus Supplement: A three part cumulative supplement to the 1982 edition of the NASA Thesaurus (supplement 2)

The three part cumulative NASA Thesaurus Supplement to the 1982 edition of the NASA Thesaurus includes: part 1, hierarchical listing; part 2, access vocabulary, and part 3, deletions. The semiannual supplement gives complete hierarchies for new terms and includes new term indications for terms new to this supplement

Automated Synthesis of SEU Tolerant Architectures from OO Descriptions

SEU faults are a well-known problem in aerospace environment but recently their relevance grew up also at ground level in commodity applications coupled, in this frame, with strong economic constraints in terms of costs reduction. On the other hand, latest hardware description languages and synthesis tools allow reducing the boundary between software and hardware domains making the high-level descriptions of hardware components very similar to software programs. Moving from these considerations, the present paper analyses the possibility of reusing Software Implemented Hardware Fault Tolerance (SIHFT) techniques, typically exploited in micro-processor based systems, to design SEU tolerant architectures. The main characteristics of SIHFT techniques have been examined as well as how they have to be modified to be compatible with the synthesis flow. A complete environment is provided to automate the design instrumentation using the proposed techniques, and to perform fault injection experiments both at behavioural and gate level. Preliminary results presented in this paper show the effectiveness of the approach in terms of reliability improvement and reduced design effort

Fault-tolerant sub-lithographic design with rollback recovery

Shrinking feature sizes and energy levels coupled with high clock rates and decreasing node capacitance lead us into a regime where transient errors in logic cannot be ignored. Consequently, several recent studies have focused on feed-forward spatial redundancy techniques to combat these high transient fault rates. To complement these studies, we analyze fine-grained rollback techniques and show that they can offer lower spatial redundancy factors with no significant impact on system performance for fault rates up to one fault per device per ten million cycles of operation (Pf = 10^-7) in systems with 10^12 susceptible devices. Further, we concretely demonstrate these claims on nanowire-based programmable logic arrays. Despite expensive rollback buffers and general-purpose, conservative analysis, we show the area overhead factor of our technique is roughly an order of magnitude lower than a gate level feed-forward redundancy scheme

Efficient Error detection Architectures for Low-Energy Block Ciphers with the Case Study of Midori Benchmarked on FPGA

Achieving secure, high performance implementations for constrained applications such as implantable and wearable medical devices is a priority in efficient block ciphers. However, security of these algorithms is not guaranteed in presence of malicious and natural faults. Recently, a new lightweight block cipher, Midori, has been proposed which optimizes the energy consumption besides having low latency and hardware complexity. This algorithm is proposed in two energy-efficient varients, i.e., Midori64 and Midori128, with block sizes equal to 64 and 128 bits. In this thesis, fault diagnosis schemes for variants of Midori are proposed. To the best of the our knowledge, there has been no fault diagnosis scheme presented in the literature for Midori to date. The fault diagnosis schemes are provided for the nonlinear S-box layer and for the round structures with both 64-bit and 128-bit Midori symmetric key ciphers. The proposed schemes are benchmarked on field-programmable gate array (FPGA) and their error coverage is assessed with fault-injection simulations. These proposed error detection architectures make the implementations of this new low-energy lightweight block cipher more reliable

Reliable and Fault-Resilient Schemes for Efficient Radix-4 Complex Division

Complex division is commonly used in various applications in signal processing and control theory including astronomy and nonlinear RF measurements. Nevertheless, unless reliability and assurance are embedded into the architectures of such structures, the suboptimal (and thus erroneous) results could undermine the objectives of such applications. As such, in this thesis, we present schemes to provide complex number division architectures based on (Sweeney, Robertson, and Tocher) SRT-division with fault diagnosis mechanisms. Different fault resilient architectures are proposed in this thesis which can be tailored based on the eventual objectives of the designs in terms of area and time requirements, among which we pinpoint carefully the schemes based on recomputing with shifted operands (RESO) to be able to detect both natural and malicious faults and with proper modification achieve high throughputs. The design also implements a minimized look up table approach which favors in error detection based designs and provides high fault coverage with relatively-low overhead. Additionally, to benchmark the effectiveness of the proposed schemes, extensive fault diagnosis assessments are performed for the proposed designs through fault simulations and FPGA implementations; the design is implemented on Xilinx Spartan-VI and Xilinx Virtex-VI FPGA families