Oscillator phase noise: a tutorial

Linear time-invariant (LTI) phase noise theories provide important qualitative design insights but are limited in their quantitative predictive power. Part of the difficulty is that device noise undergoes multiple frequency translations to become oscillator phase noise. A quantitative understanding of this process requires abandoning the principle of time invariance assumed in most older theories of phase noise. Fortunately, the noise-to-phase transfer function of oscillators is still linear, despite the existence of the nonlinearities necessary for amplitude stabilization. In addition to providing a quantitative reconciliation between theory and measurement, the time-varying phase noise model presented in this tutorial identifies the importance of symmetry in suppressing the upconversion of 1/f noise into close-in phase noise, and provides an explicit appreciation of cyclostationary effects and AM-PM conversion. These insights allow a reinterpretation of why the Colpitts oscillator exhibits good performance, and suggest new oscillator topologies. Tuned LC and ring oscillator circuit examples are presented to reinforce the theoretical considerations developed. Simulation issues and the accommodation of amplitude noise are considered in appendixes

Noise propagation issues in Belle II pixel detector power cable

The vertex detector used in the upgrade of High-Energy physics experiment Belle II includes DEPFET pixel detector (PXD) technology. In this complex topology the power supply units and the front-end electronics are connected through a PXD power cable bundle which may propagate the output noise from the power supplies to the vertex area. This paper presents a study of the propagation of noise caused by power converters in the PXD cable bundle based on Multi-conductor Transmission Line (MTL) theory. The work exposes the effect of the complex cable topology and shield connections on the noise propagation, which has an impact on the requirements of the power supplies. This analysis is part of the electromagnetic compatibility based design focused on functional safety to define the shield connections and power supply specifications required to ensure the successful integration of the detector and, specifically, to achieve the designed performance of the front-end electronics

Study and application of direct RF power injection methodology and mitigation of electromagnetic interference in ADCs

There are many publications available in literature regarding the DPI (Direct Power Injection) technique for electronic systems, but few works specifically addressed for mixed-signal converters, which are components existent in almost all electronic devices. IEC 62132-4(International Electrotechnical Commission, 2006) and 62132-1(International Electrotechnical Commission, 2006) standards describe a method for measuring immunity of integrated circuits (IC) in the presence of conducted RF disturbances. This method ensures a high degree of repeatability and correlation of immunity measurements. Knowledge of the electromagnetic immunity of an IC allows the designer to decide if the system will need external protection, and how much effort should be directed to this solution. In this context, the purpose of this work is the study and application of the DPI methodology for injection of EMI in a mixed-signal programmable device, evaluating mitigation possibilities, with special focus on the analog-to-digital converters (ADCs). The main objective is to evaluate the impact of electromagnetic interference (EMI) on different converters (two Successive Approximation Register ADCs, operating with distinct sampling rate and a Sigma-Delta ADC) of the Cypress Semiconductor Programmable SoC (System-on-Chip), PSoC 5LP. Additionally a previously proposed fault tolerance methodology, based on triplication with hardware and time diversity is tested. Results show distinct behaviors of each converter to conducted EMI. Finally, the tested tolerance technique showed to be suitable to reduce error rate of such data acquisition system operating under EMI disturbance.Existem muitas publicações disponíveis na literatura sobre a técnica de DPI (Direct Power Injection ou injeção direta de energia) para sistemas eletrônicos, mas poucos trabalhos direcionados para conversores de sinais mistos, que são componentes existentes em quase todos os dispositivos eletrônicos. As normas IEC 62132-4 (IEC, 2006) e 62132-1 (IEC, 2006) descrevem um método para medir a imunidade de circuitos integrados (CI) na presença de distúrbios de RF conduzidos. Este método garante um alto grau de repetibilidade e correlação das medições da imunidade. O conhecimento da imunidade eletromagnética de um CI permite que o projetista decida se o sistema precisará de proteção externa e quanto esforço deve ser direcionado para esta solução. Nesse contexto, o objetivo deste trabalho é o estudo e aplicação da metodologia DPI para injeção de interferência eletromagnética em um dispositivo programável de sinal misto, avaliando as possibilidades de mitigação, com foco especial em conversores analógico-digitais (ADCs). O principal objetivo é avaliar o impacto da interferência eletromagnética em diferentes conversores (dois ADCs baseados em aproximação sucessiva, operando com taxa de amostragem distintas e um ADC do tipo Sigma-Delta) do SoC(System-on-Chip) programável da Cypress Semiconductor, PSoC 5LP. Além disso, é testada uma metodologia de tolerância a falhas proposta anteriormente, baseada em triplicação com diversidade de hardware e temporal. Os resultados mostram comportamentos distintos de cada conversor para a interferência eletromagnética conduzida. Finalmente, a técnica de tolerância testada mostrou-se adequada para reduzir a taxa de erros desse sistema de aquisição de dados operando sob perturbação eletromagnética

Single-Chip Isolated DC-DC Converter with Self-Tuned Maximum Power Transfer Frequency

abstract: There is an increasing demand for fully integrated point-of-load (POL) isolated DC-DC converters that can provide an isolation barrier between the primary and the secondary side, while delivering a low ripple, low noise regulated voltage at their isolated sides to a high dynamic range, sensitive mixed signal devices, such as sensors, current-shunt-monitors and ADCs. For these applications, smaller system size and integration level is important because the whole system may need to fit to limited space. Traditional methods for providing isolated power are discrete solutions using bulky transformers. Miniaturization of isolated POL regulators is becoming highly desirable for low power applications. A fully integrated, low noise isolated point-of-load DC-DC converter for supply regulation of high dynamic range analog and mixed signal sensor signal-chains is presented. The isolated DC-DC converter utilizes an integrated planar air-core micro-transformer as a coupled resonator and isolation barrier and enables direct connection of low-voltage mixed signal circuits to higher supply rails. The air core transformer is driven at its primary resonant frequency of 100 MHz to achieve maximum power transfer. A mixed-signal perturb-and-observe based frequency search algorithm is developed to improve maximum power transfer efficiency by 60% across the isolation barrier compared to fixed driving frequency method. The isolated converter’s output ripple is reduced by utilizing spread spectrum clocking in the driver. An isolated PMOS LDO in the secondary side is used to suppress switching noise and ripple by 21dB. Conducted and radiated EMI distribution on the IC is measured by a set of integrated ring oscillator based noise sensors with -68dBm noise sensitivity. The proposed isolated converter achieves highest level of integration with respect to earlier reported integrated isolated converters, while providing 50V on-chip junction isolation without the need for extra silicon post-processing steps.Dissertation/ThesisDoctoral Dissertation Electrical Engineering 201