Design for validation: An approach to systems validation

Every complex system built is validated in some manner. Computer validation begins with review of the system design. As systems became too complicated for one person to review, validation began to rely on the application of adhoc methods by many individuals. As the cost of the changes mounted and the expense of failure increased, more organized procedures became essential. Attempts at devising and carrying out those procedures showed that validation is indeed a difficult technical problem. The successful transformation of the validation process into a systematic series of formally sound, integrated steps is necessary if the liability inherent in the future digita-system-based avionic and space systems is to be minimized. A suggested framework and timetable for the transformtion are presented. Basic working definitions of two pivotal ideas (validation and system life-cyle) are provided and show how the two concepts interact. Many examples are given of past and present validation activities by NASA and others. A conceptual framework is presented for the validation process. Finally, important areas are listed for ongoing development of the validation process at NASA Langley Research Center

Autonomous spacecraft maintenance study group

A plan to incorporate autonomous spacecraft maintenance (ASM) capabilities into Air Force spacecraft by 1989 is outlined. It includes the successful operation of the spacecraft without ground operator intervention for extended periods of time. Mechanisms, along with a fault tolerant data processing system (including a nonvolatile backup memory) and an autonomous navigation capability, are needed to replace the routine servicing that is presently performed by the ground system. The state of the art fault handling capabilities of various spacecraft and computers are described, and a set conceptual design requirements needed to achieve ASM is established. Implementations for near term technology development needed for an ASM proof of concept demonstration by 1985, and a research agenda addressing long range academic research for an advanced ASM system for 1990s are established

Assessment team report on flight-critical systems research at NASA Langley Research Center

The quality, coverage, and distribution of effort of the flight-critical systems research program at NASA Langley Research Center was assessed. Within the scope of the Assessment Team's review, the research program was found to be very sound. All tasks under the current research program were at least partially addressing the industry needs. General recommendations made were to expand the program resources to provide additional coverage of high priority industry needs, including operations and maintenance, and to focus the program on an actual hardware and software system that is under development

A bibliography on formal methods for system specification, design and validation

Literature on the specification, design, verification, testing, and evaluation of avionics systems was surveyed, providing 655 citations. Journal papers, conference papers, and technical reports are included. Manual and computer-based methods were employed. Keywords used in the online search are listed

The Art of Fault Injection

Classical greek philosopher considered the foremost virtues to be temperance, justice, courage, and prudence. In this paper we relate these cardinal virtues to the correct methodological approaches that researchers should follow when setting up a fault injection experiment. With this work we try to understand where the "straightforward pathway" lies, in order to highlight those common methodological errors that deeply influence the coherency and the meaningfulness of fault injection experiments. Fault injection is like an art, where the success of the experiments depends on a very delicate balance between modeling, creativity, statistics, and patience

Multilevel Clustering Fault Model for IC Manufacture

A hierarchical approach to the construction of compound distributions for process-induced faults in IC manufacture is proposed. Within this framework, the negative binomial distribution is treated as level-1 models. The hierarchical approach to fault distribution offers an integrated picture of how fault density varies from region to region within a wafer, from wafer to wafer within a batch, and so on. A theory of compound-distribution hierarchies is developed by means of generating functions. A study of correlations, which naturally appears in microelectronics due to the batch character of IC manufacture, is proposed. Taking these correlations into account is of significant importance for developing procedures for statistical quality control in IC manufacture. With respect to applications, hierarchies of yield means and yield probability-density functions are considered.Comment: 10 pages, the International Conference "Micro- and Nanoelectronics- 2003" (ICMNE-2003),Zvenigorod, Moscow district, Russia, October 6-10, 200

Closed-form solution of decomposable stochastic models

Markov and semi-Markov processes are increasingly being used in the modeling of complex reconfigurable systems (fault tolerant computers). The estimation of the reliability (or some measure of performance) of the system reduces to solving the process for its state probabilities. Such a model may exhibit numerous states and complicated transition distributions, contributing to an expensive and numerically delicate solution procedure. Thus, when a system exhibits a decomposition property, either structurally (autonomous subsystems), or behaviorally (component failure versus reconfiguration), it is desirable to exploit this decomposition in the reliability calculation. In interesting cases there can be failure states which arise from non-failure states of the subsystems. Equations are presented which allow the computation of failure probabilities of the total (combined) model without requiring a complete solution of the combined model. This material is presented within the context of closed-form functional representation of probabilities as utilized in the Symbolic Hierarchical Automated Reliability and Performance Evaluator (SHARPE) tool. The techniques adopted enable one to compute such probability functions for a much wider class of systems at a reduced computational cost. Several examples show how the method is used, especially in enhancing the versatility of the SHARPE tool