Impact of local stacking on the graphene-impurity interaction: theory and experiments

We investigate the graphene-impurity interaction problem by combining experimental - scanning tunneling microscopy (STM) and spectroscopy (STS) - and theoretical - Anderson impurity model and density functional theory (DFT) calculations - techniques. We use graphene on the SiC(000-1)(2x2)_C reconstruction as a model system. The SiC substrate reconstruction is based on silicon adatoms. Graphene mainly interacts with the dangling bonds of these adatoms which act as impurities. Graphene grown on SiC(000-1)(2x2)_C shows domains with various orientations relative to the substrate so that very different local graphene/Si adatom stacking configurations can be probed on a given grain. The position and width of the adatom (impurity) state can be analyzed by STM/STS and related to its local environment owing to the high bias electronic transparency of graphene. The experimental results are compared to Anderson's model predictions and complemented by DFT calculations for some specific local environments. We conclude that the adatom resonance shows a smaller width and a larger shift toward the Dirac point for an adatom at the center of a graphene hexagon than for an adatom just on top of a C graphene atom.Comment: 13 pages, 6 figures, Accepted for publication in Phys. Rev.

Electrostatic charging artefacts in Lorentz electron tomography of MFM tip stray fields

Using the technique of differential phase contrast (DPC) Lorentz electron microscopy, the magnetic stray field distribution from magnetic force microscopy (MFM) tips can be calculated in a plane in front of the tip using tomographic reconstruction techniques. Electrostatic charging of the tip during DPC imaging can significantly distort these field reconstructions. Using a simple point charge model, this paper illustrates the effect of electrostatic charging of the sample on the accuracy of tomographic field reconstructions. A procedure for separating electrostatic and magnetic effects is described, and is demonstrated using experimental tomographic data obtained from a modified MFM tip

Interpreting motion and force for narrow-band intermodulation atomic force microscopy

Intermodulation atomic force microscopy (ImAFM) is a mode of dynamic atomic force microscopy that probes the nonlinear tip-surface force by measurement of the mixing of multiple tones in a frequency comb. A high $Q$ cantilever resonance and a suitable drive comb will result in tip motion described by a narrow-band frequency comb. We show by a separation of time scales, that such motion is equivalent to rapid oscillations at the cantilever resonance with a slow amplitude and phase or frequency modulation. With this time domain perspective we analyze single oscillation cycles in ImAFM to extract the Fourier components of the tip-surface force that are in-phase with tip motion ($F_I$) and quadrature to the motion ($F_Q$). Traditionally, these force components have been considered as a function of the static probe height only. Here we show that $F_I$ and $F_Q$ actually depend on both static probe height and oscillation amplitude. We demonstrate on simulated data how to reconstruct the amplitude dependence of $F_I$ and $F_Q$ from a single ImAFM measurement. Furthermore, we introduce ImAFM approach measurements with which we reconstruct the full amplitude and probe height dependence of the force components $F_I$ and $F_Q$, providing deeper insight into the tip-surface interaction. We demonstrate the capabilities of ImAFM approach measurements on a polystyrene polymer surface.Comment: 12 pages, 7 figure

Interaction imaging with amplitude-dependence force spectroscopy

Knowledge of surface forces is the key to understanding a large number of processes in fields ranging from physics to material science and biology. The most common method to study surfaces is dynamic atomic force microscopy (AFM). Dynamic AFM has been enormously successful in imaging surface topography, even to atomic resolution, but the force between the AFM tip and the surface remains unknown during imaging. Here, we present a new approach that combines high accuracy force measurements and high resolution scanning. The method, called amplitude-dependence force spectroscopy (ADFS) is based on the amplitude-dependence of the cantilever's response near resonance and allows for separate determination of both conservative and dissipative tip-surface interactions. We use ADFS to quantitatively study and map the nano-mechanical interaction between the AFM tip and heterogeneous polymer surfaces. ADFS is compatible with commercial atomic force microscopes and we anticipate its wide-spread use in taking AFM toward quantitative microscopy

Imaging of atomic orbitals with the Atomic Force Microscope - experiments and simulations

Atomic force microscopy (AFM) is a mechanical profiling technique that allows to image surfaces with atomic resolution. Recent progress in reducing the noise of this technique has led to a resolution level where previously undetectable symmetries of the images of single atoms are observed. These symmetries are related to the nature of the interatomic forces. The Si(111)-(7x7) surface is studied by AFM with various tips and AFM images are simulated with chemical and electrostatic model forces. The calculation of images from the tip-sample forces is explained in detail and the implications of the imaging parameters are discussed. Because the structure of the Si(111)-(7x7) surface is known very well, the shape of the adatom images is used to determine the tip structure. The observability of atomic orbitals by AFM and scanning tunneling microscopy is discussed.Comment: 21 pages, 17 figure

Towards visualisation of central-cell-effects in scanning-tunnelling-microscope images of subsurface dopant qubits in silicon

Atomic-scale understanding of phosphorous donor wave functions underpins the design and optimisation of silicon based quantum devices. The accuracy of large-scale theoretical methods to compute donor wave functions is dependent on descriptions of central-cell-corrections, which are empirically fitted to match experimental binding energies, or other quantities associated with the global properties of the wave function. Direct approaches to understanding such effects in donor wave functions are of great interest. Here, we apply a comprehensive atomistic theoretical framework to compute scanning tunnelling microscopy (STM) images of subsurface donor wave functions with two central-cell-correction formalisms previously employed in the literature. The comparison between central-cell models based on real-space image features and the Fourier transform profiles indicate that the central-cell effects are visible in the simulated STM images up to ten monolayers below the silicon surface. Our study motivates a future experimental investigation of the central-cell effects via STM imaging technique with potential of fine tuning theoretical models, which could play a vital role in the design of donor-based quantum systems in scalable quantum computer architectures.Comment: Nanoscale 201

The magnetic-resonance force microscope: a new tool for high-resolution, 3-D, subsurface scanned probe imaging

The magnetic-resonance force microscope (MRFM) is a novel scanned probe instrument which combines the three-dimensional (3-D) imaging capabilities of magnetic-resonance imaging with the high sensitivity and resolution of atomic-force microscopy. It will enable nondestructive, chemical-specific, high-resolution microscopic studies and imaging of subsurface properties of a broad range of materials. The MRFM has demonstrated its utility for study of microscopic ferromagnets, and it will enable microscopic understanding of the nonequilibrium spin polarization resulting from spin injection. Microscopic MRFM studies will provide unprecedented insight into the physics of magnetic and spin-based materials. We will describe the principles and the state-of-the-art in magnetic-resonance force microscopy, discuss existing cryogenic MRFM instruments incorporating high-Q, single-crystal microresonators with integral submicrometer probe magnets, and indicate future directions for enhancing MRFM instrument capabilities