A New SVDD-Based Multivariate Non-parametric Process Capability Index

Process capability index (PCI) is a commonly used statistic to measure ability of a process to operate within the given specifications or to produce products which meet the required quality specifications. PCI can be univariate or multivariate depending upon the number of process specifications or quality characteristics of interest. Most PCIs make distributional assumptions which are often unrealistic in practice. This paper proposes a new multivariate non-parametric process capability index. This index can be used when distribution of the process or quality parameters is either unknown or does not follow commonly used distributions such as multivariate normal

COOPER-framework: A Unified Standard Process for Non-parametric Projects

Practitioners assess performance of entities in increasingly large and complicated datasets. If non-parametric models, such as Data Envelopment Analysis, were ever considered as simple push-button technologies, this is impossible when many variables are available or when data have to be compiled from several sources. This paper introduces by the ‘COOPER-framework’ a comprehensive model for carrying out non-parametric projects. The framework consists of six interrelated phases: Concepts and objectives, On structuring data, Operational models, Performance comparison model, Evaluation, and Result and deployment. Each of the phases describes some necessary steps a researcher should examine for a well defined and repeatable analysis. The COOPER-framework provides for the novice analyst guidance, structure and advice for a sound non-parametric analysis. The more experienced analyst benefits from a check list such that important issues are not forgotten. In addition, by the use of a standardized framework non-parametric assessments will be more reliable, more repeatable, more manageable, faster and less costly.DEA, non-parametric efficiency, unified standard process, COOPER-framework.

Regression modeling for digital test of ΣΔ modulators

The cost of Analogue and Mixed-Signal circuit testing is an important bottleneck in the industry, due to timeconsuming verification of specifications that require state-ofthe- art Automatic Test Equipment. In this paper, we apply the concept of Alternate Test to achieve digital testing of converters. By training an ensemble of regression models that maps simple digital defect-oriented signatures onto Signal to Noise and Distortion Ratio (SNDR), an average error of 1:7% is achieved. Beyond the inference of functional metrics, we show that the approach can provide interesting diagnosis information.Ministerio de Educación y Ciencia TEC2007-68072/MICJunta de Andalucía TIC 5386, CT 30

Image mining: issues, frameworks and techniques

[Abstract]: Advances in image acquisition and storage technology have led to tremendous growth in significantly large and detailed image databases. These images, if analyzed, can reveal useful information to the human users. Image mining deals with the extraction of implicit knowledge, image data relationship, or other patterns not explicitly stored in the images. Image mining is more than just an extension of data mining to image domain. It is an interdisciplinary endeavor that draws upon expertise in computer vision, image processing, image retrieval, data mining, machine learning, database, and artificial intelligence. Despite the development of many applications and algorithms in the individual research fields cited above, research in image mining is still in its infancy. In this paper, we will examine the research issues in image mining, current developments in image mining, particularly, image mining frameworks, state-of-the-art techniques and systems. We will also identify some future research directions for image mining at the end of this paper

Redesign of technical systems

The paper describes a systematic approach to support the redesign process. Redesign is the adaptation of a technical system in order to meet new specifications. The approach presented is based on techniques developed in model-based diagnosis research. The essence of the approach is to find the part of the system which causes the discrepancy between a formal specification of the system to be designed and the description of the existing technical system. Furthermore, new specifications are generated, describing the new behaviour for the `faulty¿ part. These specifications guide the actual design of this part. Both the specification and design description are based on YMIR, an ontology for structuring engineering design knowledge

Closed-Loop Statistical Verification of Stochastic Nonlinear Systems Subject to Parametric Uncertainties

This paper proposes a statistical verification framework using Gaussian processes (GPs) for simulation-based verification of stochastic nonlinear systems with parametric uncertainties. Given a small number of stochastic simulations, the proposed framework constructs a GP regression model and predicts the system's performance over the entire set of possible uncertainties. Included in the framework is a new metric to estimate the confidence in those predictions based on the variance of the GP's cumulative distribution function. This variance-based metric forms the basis of active sampling algorithms that aim to minimize prediction error through careful selection of simulations. In three case studies, the new active sampling algorithms demonstrate up to a 35% improvement in prediction error over other approaches and are able to correctly identify regions with low prediction confidence through the variance metric.Comment: 8 pages, submitted to ACC 201

Robust Model Predictive Control for Signal Temporal Logic Synthesis

Most automated systems operate in uncertain or adversarial conditions, and have to be capable of reliably reacting to changes in the environment. The focus of this paper is on automatically synthesizing reactive controllers for cyber-physical systems subject to signal temporal logic (STL) specifications. We build on recent work that encodes STL specifications as mixed integer linear constraints on the variables of a discrete-time model of the system and environment dynamics. To obtain a reactive controller, we present solutions to the worst-case model predictive control (MPC) problem using a suite of mixed integer linear programming techniques. We demonstrate the comparative effectiveness of several existing worst-case MPC techniques, when applied to the problem of control subject to temporal logic specifications; our empirical results emphasize the need to develop specialized solutions for this domain