6 research outputs found

    A New Technique for the Design of Multi-Phase Voltage Controlled Oscillators

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    © 2017 World Scientific Publishing Company.In this work, a novel circuit structure for second-harmonic multi-phase voltage controlled oscillator (MVCO) is presented. The proposed MVCO is composed of (Formula presented.) ((Formula presented.) being an integer number and (Formula presented.)2) identical inductor–capacitor ((Formula presented.)) tank VCOs. In theory, this MVCO can provide 2(Formula presented.) different phase sinusoidal signals. A six-phase VCO based on the proposed structure is designed in a TSMC 0.18(Formula presented.)um CMOS process. Simulation results show that at the supply voltage of 0.8(Formula presented.)V, the total power consumption of the six-phase VCO circuit is about 1(Formula presented.)mW, the oscillation frequency is tunable from 2.3(Formula presented.)GHz to 2.5(Formula presented.)GHz when the control voltage varies from 0(Formula presented.)V to 0.8(Formula presented.)V, and the phase noise is lower than (Formula presented.)128(Formula presented.)dBc/Hz at 1(Formula presented.)MHz offset frequency. The proposed MVCO has lower phase noise, lower power consumption and more outputs than other related works in the literature.Peer reviewedFinal Accepted Versio

    Design of 5.1 GHz ultra-low power and wide tuning range hybrid oscillator

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    The objective of the proposed work is to demonstrate the use of a hybrid approach for the design of a voltage-controlled oscillator (VCO) which can lead to higher performance. The performance is improved in terms of the tuning range, frequency of oscillation, voltage swing, and power consumption. The proposed hybrid VCO is designed using an active load common source amplifier and current starved inverter that are cascaded alternatively to achieve low power consumption. The proposed VCO achieves a measured phase noise of -74 dBc/Hz and a figure of merit (FOM) of -152.6 dBc/Hz at a 1 MHz offset when running at 5.1 GHz frequency. The hybrid current starved-current starved VCO (CS-CS VCO) consumes a power of 289 µW using a 1.8 V supply and attains a wide tuning range of 96.98%. Hybrid VCO is designed using 0.09 µm complementary metal–oxide–semiconductor (CMOS) technology. To justify the robustness, reliability, and scalability of the circuit different corner analysis is performed through 500 runs of Monte-Carlo simulation

    Frequency Synthesizers and Oscillator Architectures Based on Multi-Order Harmonic Generation

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    Frequency synthesizers are essential components for modern wireless and wireline communication systems as they provide the local oscillator signal required to transmit and receive data at very high rates. They are also vital for computing devices and microcontrollers as they generate the clocks required to run all the digital circuitry responsible for the high speed computations. Data rates and clocking speeds are continuously increasing to accommodate for the ever growing demand on data and computational power. This places stringent requirements on the performance metrics of frequency synthesizers. They are required to run at higher speeds, cover a wide range of frequencies, provide a low jitter/phase noise output and consume minimum power and area. In this work, we present new techniques and architectures for implementing high speed frequency synthesizers which fulfill the aforementioned requirements. We propose a new architecture and design approach for the realization of wideband millimeter-wave frequency synthesizers. This architecture uses two-step multi-order harmonic generation of a low frequency phase-locked signal to generate wideband mm-wave frequencies. A prototype of the proposed system is designed and fabricated in 90nm Complementary Metal Oxide Semiconductor (CMOS) technology. Measurement results demonstrated that a very wide tuning range of 5 to 32 GHz can be achieved, which is costly to implement using conventional techniques. Moreover the power consumption per octave resembles that of state-of-the art reports. Next, we propose the N-Push cyclic coupled ring oscillator (CCRO) architecture to implement two high performance oscillators: (1) a wideband N-Push/M-Push CCRO operating from 3.16-12.8GHz implemented by two harmonic generation operations using the availability of different phases from the CCRO, and (2) a 13-25GHz millimeter-wave N-Push CCRO with a low phase noise performance of -118dBc/Hz at 10MHz. The proposed oscillators achieve low phase noise with higher FOM than state of the art work. Finally, we present some improvement techniques applied to the performance of phase locked loops (PLLs). We present an adaptive low pass filtering technique which can reduce the reference spur of integer-N charge-pump based PLLs by around 20dB while maintaining the settling time of the original PLL. Another PLL is presented, which features very low power consumption targeting the Medical Implantable Communication Standard. It operates at 402-405 MHz while consuming 600microW from a 1V supply

    Design techniques for safe, reliable, and trustworthy analog circuits

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    Rapid developments in communication, automation, and smart technologies continue to drive the trend of increasingly large-scale integration of electronics. The number of ICs embedded in various systems continues to rise to realize more sophisticated functions and capabilities, and as a result we rely more and more on the smooth, safe, and secure operation of ICs. Quality assurance of ICs is of paramount importance in critical missions because faults can incur heavy consequences. To ensure reliability, IC designs undergo a thorough verification process prior to fabrication and comprehensive testing and measurements before distribution. These steps provide confidence in parts shortly after their deployment into operation. Many critical ICs also embed functions to detect abnormal or faulty behavior in the field and add another layer of safety to the operation. The methodology for creating these built-in self-tests (BISTs) for digital circuits is fairly mature, yet analog and mixed signal (AMS) circuits still present a significant challenge for verification and testing. The development of in-field tests for AMS circuits is relatively new. Part of the difficulty is the many constraints that define satisfactory function. Complicated signal generators and observers are usually required to stimulate the circuit and measure its response in order to accurately determine if it meets specifications. These are available in a production test environment in the form of external equipment, but the amount of hardware, power, and other resources required for these tests make it impractical for in-field operation. To address this issue, some simple, low-resource test circuits have been developed to test some fundamental AMS blocks. The test results allow one to infer faulty behavior of circuit rather than explicitly confirming specifications are not met, which makes the design of test inputs and observers significantly easier. These test circuits use simple analog-digital interfaces which aid the integration of the designs into existing digital test architectures. The AMS test circuits were implemented on a PCB to demonstrate their feasibility. For ICs targeting high reliability, the parts are designed such that the probability of a fault occurring is extremely low, at least for a time. BISTs for in-field testing are intended to detect faults originating from a single source because of a defect or some other unpredictable event. But every IC will reach a time when devices start to fail independently of each other because of normal wear from use. The physical mechanisms causing transistor degradation, called transistor aging, have a predictable trend for a given history of use. On-chip monitors that track device aging over the life of a part can provide warnings before widespread failure occurs and allow confident operation of IC right up to its effective end of life (EOL). A bias and temperature instability (BTI) monitor was designed to estimate the evolving probability of BTI degradation in a device or devices during its operation. In addition to the chance of random failures in critical ICs, designers and customers must also concern themselves with intentionally induced failures. The important role these parts play in their respective systems makes them potential targets of attack by third parties whose goal is contrary to the parts’ primary missions. One potential class of threats is the hardware Trojan horse, a hidden and malicious function physically embedded in the design. These are high- risk/high-reward attacks because insertion of the Trojan is generally considered difficult but successful activation is potentially devastating. Much research and resources have been dedicated to developing threat models, identifying potential means of insertion and operation, and detection of Trojans during production tests. However, these efforts are almost entirely focused on the security of digital circuits while threats to AMS circuits have been ignored. One of the main reasons for this is the inherent sensitivity of AMS circuits, which leads to the assumption that any tampering would be obvious. This assumption falls short when a well- known problem in AMS circuit design is considered: multi-stable operation. A definitive taxonomy of this sub-class of hardware Trojans was constructed to complement existing definitions and efforts on Trojan classification. An example of an AMS circuit with such a Trojan is provided to validate the threat this class of Trojans poses
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