Detection of Electromagnetic Inclusions using Topological Sensitivity

In this article a topological sensitivity framework for far field detection of a diametrically small electromagnetic inclusion is established. The cases of single and multiple measurements of the electric far field scattering amplitude at a fixed frequency are taken into account. The performance of the algorithm is analyzed theoretically in terms of its resolution and sensitivity for locating an inclusion. The stability of the framework with respect to measurement and medium noises is discussed. Moreover, the quantitative results for signal-to-noise ratio are presented. A few numerical results are presented to illustrate the detection capabilities of the proposed framework with single and multiple measurements.Comment: 31 pages, 5 figure

Topological Sensitivity Based Far-Field Detection of Elastic Inclusions

The aim of this article is to present and rigorously analyze topological sensitivity based algorithms for detection of diametrically small inclusions in an isotropic homogeneous elastic formation using single and multiple measurements of the far-field scattering amplitudes. A $L^2-$cost functional is considered and a location indicator is constructed from its topological derivative. The performance of the indicator is analyzed in terms of the topological sensitivity for location detection and stability with respect to measurement and medium noises. It is established that the location indicator does not guarantee inclusion detection and achieves only a low resolution when there is mode-conversion in an elastic formation. Accordingly, a weighted location indicator is designed to tackle the mode-conversion phenomenon. It is substantiated that the weighted function renders the location of an inclusion stably with resolution as per Rayleigh criterion.Comment: 31 pages, 1 figur