In this article a topological sensitivity framework for far field detection
of a diametrically small electromagnetic inclusion is established. The cases of
single and multiple measurements of the electric far field scattering amplitude
at a fixed frequency are taken into account. The performance of the algorithm
is analyzed theoretically in terms of its resolution and sensitivity for
locating an inclusion. The stability of the framework with respect to
measurement and medium noises is discussed. Moreover, the quantitative results
for signal-to-noise ratio are presented. A few numerical results are presented
to illustrate the detection capabilities of the proposed framework with single
and multiple measurements.Comment: 31 pages, 5 figure