Variable Body Biasing (VBB) based VLSI Design Approach to Reduce Static Power

The static power consumption is an important parameter concern in IC design due to t for a higher integration numbers of transistor to achieve greater performance in a single chip. Leakage current is the main issues for static power dissipation in standby mode as the size of transistor been scale. Therefore, the subthreshold leakage current rises due to threshold voltage scaling and gate leakage current increases due to scale down of oxide thickness. In this paper, a Variable Body Biasing (VBB) technique was applied to reduce static power consumption in VLSI design. The VBB technique used a DC bias at body terminal to control the threshold voltage efficiently. The Synopsys Custom Designer EDA tools in 90nm MOSFET technology was used to design a 1-bit full adder with VBB technique in full custom methodology. The simulation of 1-bit full adder was carried out with operation voltage   supply was compared in conventional technique and VBB technique. The results achieved the reduction in term of peak power,   and average power,   in static CMOS 1-bit full adder compared with conventional bias and VBB technique

FORCED STACK SLEEP TRANSISTOR (FORTRAN): A NEW LEAKAGE CURRENT REDUCTION APPROACH IN CMOS BASED CIRCUIT DESIGNING

Reduction in leakage current has become a significant concern in nanotechnology-based low-power, low-voltage, and high-performance VLSI applications. This research article discusses a new low-power circuit design the approach of FORTRAN (FORced stack sleep TRANsistor), which decreases the leakage power efficiency in the CMOS-based circuit outline in VLSI domain. FORTRAN approach reduces leakage current in both active as well as standby modes of operation. Furthermore, it is not time intensive when the circuit goes from active mode to standby mode and vice-versa. To validate the proposed design approach, experiments are conducted in the Tanner EDA tool of mentor graphics bundle on projected circuit designs for the full adder, a chain of 4-inverters, and 4-bit multiplier designs utilizing 180nm, 130nm, and 90nm TSMC technology node. The outcomes obtained show the result of a 95-98% vital reduction in leakage power as well as a 15-20% reduction in dynamic power with a minor increase in delay. The result outcomes are compared for accuracy with the notable design approaches that are accessible for both active and standby modes of operation