5,264 research outputs found

    Online Tool Condition Monitoring Based on Parsimonious Ensemble+

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    Accurate diagnosis of tool wear in metal turning process remains an open challenge for both scientists and industrial practitioners because of inhomogeneities in workpiece material, nonstationary machining settings to suit production requirements, and nonlinear relations between measured variables and tool wear. Common methodologies for tool condition monitoring still rely on batch approaches which cannot cope with a fast sampling rate of metal cutting process. Furthermore they require a retraining process to be completed from scratch when dealing with a new set of machining parameters. This paper presents an online tool condition monitoring approach based on Parsimonious Ensemble+, pENsemble+. The unique feature of pENsemble+ lies in its highly flexible principle where both ensemble structure and base-classifier structure can automatically grow and shrink on the fly based on the characteristics of data streams. Moreover, the online feature selection scenario is integrated to actively sample relevant input attributes. The paper presents advancement of a newly developed ensemble learning algorithm, pENsemble+, where online active learning scenario is incorporated to reduce operator labelling effort. The ensemble merging scenario is proposed which allows reduction of ensemble complexity while retaining its diversity. Experimental studies utilising real-world manufacturing data streams and comparisons with well known algorithms were carried out. Furthermore, the efficacy of pENsemble was examined using benchmark concept drift data streams. It has been found that pENsemble+ incurs low structural complexity and results in a significant reduction of operator labelling effort.Comment: this paper has been published by IEEE Transactions on Cybernetic

    AI/ML Algorithms and Applications in VLSI Design and Technology

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    An evident challenge ahead for the integrated circuit (IC) industry in the nanometer regime is the investigation and development of methods that can reduce the design complexity ensuing from growing process variations and curtail the turnaround time of chip manufacturing. Conventional methodologies employed for such tasks are largely manual; thus, time-consuming and resource-intensive. In contrast, the unique learning strategies of artificial intelligence (AI) provide numerous exciting automated approaches for handling complex and data-intensive tasks in very-large-scale integration (VLSI) design and testing. Employing AI and machine learning (ML) algorithms in VLSI design and manufacturing reduces the time and effort for understanding and processing the data within and across different abstraction levels via automated learning algorithms. It, in turn, improves the IC yield and reduces the manufacturing turnaround time. This paper thoroughly reviews the AI/ML automated approaches introduced in the past towards VLSI design and manufacturing. Moreover, we discuss the scope of AI/ML applications in the future at various abstraction levels to revolutionize the field of VLSI design, aiming for high-speed, highly intelligent, and efficient implementations

    CPS Data Streams Analytics based on Machine Learning for Cloud and Fog Computing: A Survey

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    Cloud and Fog computing has emerged as a promising paradigm for the Internet of things (IoT) and cyber-physical systems (CPS). One characteristic of CPS is the reciprocal feedback loops between physical processes and cyber elements (computation, software and networking), which implies that data stream analytics is one of the core components of CPS. The reasons for this are: (i) it extracts the insights and the knowledge from the data streams generated by various sensors and other monitoring components embedded in the physical systems; (ii) it supports informed decision making; (iii) it enables feedback from the physical processes to the cyber counterparts; (iv) it eventually facilitates the integration of cyber and physical systems. There have been many successful applications of data streams analytics, powered by machine learning techniques, to CPS systems. Thus, it is necessary to have a survey on the particularities of the application of machine learning techniques to the CPS domain. In particular, we explore how machine learning methods should be deployed and integrated in cloud and fog architectures for better fulfilment of the requirements, e.g. mission criticality and time criticality, arising in CPS domains. To the best of our knowledge, this paper is the first to systematically study machine learning techniques for CPS data stream analytics from various perspectives, especially from a perspective that leads to the discussion and guidance of how the CPS machine learning methods should be deployed in a cloud and fog architecture

    On-line anomaly detection with advanced independent component analysis of multi-variate residual signals from causal relation networks.

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    Anomaly detection in todays industrial environments is an ambitious challenge to detect possible faults/problems which may turn into severe waste during production, defects, or systems components damage, at an early stage. Data-driven anomaly detection in multi-sensor networks rely on models which are extracted from multi-sensor measurements and which characterize the anomaly-free reference situation. Therefore, significant deviations to these models indicate potential anomalies. In this paper, we propose a new approach which is based on causal relation networks (CRNs) that represent the inner causes and effects between sensor channels (or sensor nodes) in form of partial sub-relations, and evaluate its functionality and performance on two distinct production phases within a micro-fluidic chip manufacturing scenario. The partial relations are modeled by non-linear (fuzzy) regression models for characterizing the (local) degree of influences of the single causes on the effects. An advanced analysis of the multi-variate residual signals, obtained from the partial relations in the CRNs, is conducted. It employs independent component analysis (ICA) to characterize hidden structures in the fused residuals through independent components (latent variables) as obtained through the demixing matrix. A significant change in the energy content of latent variables, detected through automated control limits, indicates an anomaly. Suppression of possible noise content in residuals—to decrease the likelihood of false alarms—is achieved by performing the residual analysis solely on the dominant parts of the demixing matrix. Our approach could detect anomalies in the process which caused bad quality chips (with the occurrence of malfunctions) with negligible delay based on the process data recorded by multiple sensors in two production phases: injection molding and bonding, which are independently carried out with completely different process parameter settings and on different machines (hence, can be seen as two distinct use cases). Our approach furthermore i.) produced lower false alarm rates than several related and well-known state-of-the-art methods for (unsupervised) anomaly detection, and ii.) also caused much lower parametrization efforts (in fact, none at all). Both aspects are essential for the useability of an anomaly detection approach

    Techniques of EMG signal analysis: detection, processing, classification and applications

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    Electromyography (EMG) signals can be used for clinical/biomedical applications, Evolvable Hardware Chip (EHW) development, and modern human computer interaction. EMG signals acquired from muscles require advanced methods for detection, decomposition, processing, and classification. The purpose of this paper is to illustrate the various methodologies and algorithms for EMG signal analysis to provide efficient and effective ways of understanding the signal and its nature. We further point up some of the hardware implementations using EMG focusing on applications related to prosthetic hand control, grasp recognition, and human computer interaction. A comparison study is also given to show performance of various EMG signal analysis methods. This paper provides researchers a good understanding of EMG signal and its analysis procedures. This knowledge will help them develop more powerful, flexible, and efficient applications
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