Image Super-Resolution via Dual-Dictionary Learning And Sparse Representation

Learning-based image super-resolution aims to reconstruct high-frequency (HF) details from the prior model trained by a set of high- and low-resolution image patches. In this paper, HF to be estimated is considered as a combination of two components: main high-frequency (MHF) and residual high-frequency (RHF), and we propose a novel image super-resolution method via dual-dictionary learning and sparse representation, which consists of the main dictionary learning and the residual dictionary learning, to recover MHF and RHF respectively. Extensive experimental results on test images validate that by employing the proposed two-layer progressive scheme, more image details can be recovered and much better results can be achieved than the state-of-the-art algorithms in terms of both PSNR and visual perception.Comment: 4 pages, 4 figures, 1 table, to be published at IEEE Int. Symposium of Circuits and Systems (ISCAS) 201

Context-Patch Face Hallucination Based on Thresholding Locality-Constrained Representation and Reproducing Learning

Face hallucination is a technique that reconstruct high-resolution (HR) faces from low-resolution (LR) faces, by using the prior knowledge learned from HR/LR face pairs. Most state-of-the-arts leverage position-patch prior knowledge of human face to estimate the optimal representation coefficients for each image patch. However, they focus only the position information and usually ignore the context information of image patch. In addition, when they are confronted with misalignment or the Small Sample Size (SSS) problem, the hallucination performance is very poor. To this end, this study incorporates the contextual information of image patch and proposes a powerful and efficient context-patch based face hallucination approach, namely Thresholding Locality-constrained Representation and Reproducing learning (TLcR-RL). Under the context-patch based framework, we advance a thresholding based representation method to enhance the reconstruction accuracy and reduce the computational complexity. To further improve the performance of the proposed algorithm, we propose a promotion strategy called reproducing learning. By adding the estimated HR face to the training set, which can simulates the case that the HR version of the input LR face is present in the training set, thus iteratively enhancing the final hallucination result. Experiments demonstrate that the proposed TLcR-RL method achieves a substantial increase in the hallucinated results, both subjectively and objectively. Additionally, the proposed framework is more robust to face misalignment and the SSS problem, and its hallucinated HR face is still very good when the LR test face is from the real-world. The MATLAB source code is available at https://github.com/junjun-jiang/TLcR-RL

Solving Inverse Problems with Piecewise Linear Estimators: From Gaussian Mixture Models to Structured Sparsity

A general framework for solving image inverse problems is introduced in this paper. The approach is based on Gaussian mixture models, estimated via a computationally efficient MAP-EM algorithm. A dual mathematical interpretation of the proposed framework with structured sparse estimation is described, which shows that the resulting piecewise linear estimate stabilizes the estimation when compared to traditional sparse inverse problem techniques. This interpretation also suggests an effective dictionary motivated initialization for the MAP-EM algorithm. We demonstrate that in a number of image inverse problems, including inpainting, zooming, and deblurring, the same algorithm produces either equal, often significantly better, or very small margin worse results than the best published ones, at a lower computational cost.Comment: 30 page

Sparsity-Based Super Resolution for SEM Images

The scanning electron microscope (SEM) produces an image of a sample by scanning it with a focused beam of electrons. The electrons interact with the atoms in the sample, which emit secondary electrons that contain information about the surface topography and composition. The sample is scanned by the electron beam point by point, until an image of the surface is formed. Since its invention in 1942, SEMs have become paramount in the discovery and understanding of the nanometer world, and today it is extensively used for both research and in industry. In principle, SEMs can achieve resolution better than one nanometer. However, for many applications, working at sub-nanometer resolution implies an exceedingly large number of scanning points. For exactly this reason, the SEM diagnostics of microelectronic chips is performed either at high resolution (HR) over a small area or at low resolution (LR) while capturing a larger portion of the chip. Here, we employ sparse coding and dictionary learning to algorithmically enhance LR SEM images of microelectronic chips up to the level of the HR images acquired by slow SEM scans, while considerably reducing the noise. Our methodology consists of two steps: an offline stage of learning a joint dictionary from a sequence of LR and HR images of the same region in the chip, followed by a fast-online super-resolution step where the resolution of a new LR image is enhanced. We provide several examples with typical chips used in the microelectronics industry, as well as a statistical study on arbitrary images with characteristic structural features. Conceptually, our method works well when the images have similar characteristics. This work demonstrates that employing sparsity concepts can greatly improve the performance of SEM, thereby considerably increasing the scanning throughput without compromising on analysis quality and resolution.Comment: Final publication available at ACS Nano Letter