No-reference bitstream-based visual quality impairment detection for high definition H.264/AVC encoded video sequences

Ensuring and maintaining adequate Quality of Experience towards end-users are key objectives for video service providers, not only for increasing customer satisfaction but also as service differentiator. However, in the case of High Definition video streaming over IP-based networks, network impairments such as packet loss can severely degrade the perceived visual quality. Several standard organizations have established a minimum set of performance objectives which should be achieved for obtaining satisfactory quality. Therefore, video service providers should continuously monitor the network and the quality of the received video streams in order to detect visual degradations. Objective video quality metrics enable automatic measurement of perceived quality. Unfortunately, the most reliable metrics require access to both the original and the received video streams which makes them inappropriate for real-time monitoring. In this article, we present a novel no-reference bitstream-based visual quality impairment detector which enables real-time detection of visual degradations caused by network impairments. By only incorporating information extracted from the encoded bitstream, network impairments are classified as visible or invisible to the end-user. Our results show that impairment visibility can be classified with a high accuracy which enables real-time validation of the existing performance objectives

Layout to circuit extraction for three-dimensional thermal-electrical circuit simulation of device structures

In this paper, a method is proposed for extraction of coupled networks from layout information for simulation of electrothermal device behavior. The networks represent a three-dimensional (3-D) device structure with circuit elements. The electrical and thermal characteristics of this circuit representation are calculated with a circuit simulator. Spatial potential distributions, current flows, and temperature distributions in the device structure are calculated on the spatial coordinates. This simulation method can be placed between device simulation and (conventional) circuit simulation. It has been implemented in a circuit simulator and is demonstrated for simulation of self-heating in a bipolar low frequency power transistor. The main advantage of this simulation method is that not only the 3-D thermal behavior of the whole chip is simulated, but that this is also directly coupled to the electrical device behavior by means of the power dissipation and temperature distribution in the device. This offers the possibility for the circuit designer to simulate 3-D, coupled, thermal-electrical problems with a circuit simulator. As an example, the influence of the emitter contacting on the internal temperature and current distribution of a BJT is investigate

Modular switched reluctance machines to be used in automotive applications

In the last decades industry, including also that of electrical machines and drives, was pushed near to its limits by the high market demands and fierce competition. As a response to the demanding challenges, improvements were made both in the design and manufacturing of electrical machines and drives. One of the introduced advanced technological solutions was the modular construction. This approach enables on a hand easier and higher productivity manufacturing, and on the other hand fast repairing in exploitation. Switched reluctance machines (SRMs) are very well fitted for modular construction, since the magnetic insulation of the phases is a basic design requirement. The paper is a survey of the main achievements in the field of modular electrical machines, (especially SRMs), setting the focus on the machines designed to be used in automotive applications