Heterogeneous Cross-Project Defect Prediction using Encoder and Transfer Learning

Heterogeneous cross-project defect prediction (HCPDP) aims to predict defects in new software projects using defect data from previous software projects where the source and target projects have some different metrics. Most existing methods only find linear relationships in the software defect features and datasets. Additionally, these methods use multiple defect datasets from different projects as source datasets. In this paper, we propose a novel method called heterogeneous cross-project defect prediction using encoder and transfer learning (ETL). ETL uses encoders to extract the important features from source and target datasets. Also, to minimize negative transfer during transfer learning, we used an augmented dataset that contains pseudo-labels and the source dataset. Additionally, we have used very limited data to train the model. To evaluate the performance of the ETL approach, 16 datasets from four publicly available software defect projects were used. Furthermore, we compared the proposed method with four HCPDP methods namely EGW, HDP&amp;#x005F;KS, CTKCCA and EMKCA, and one WPDP method from existing literature. The proposed method on average outperforms the baseline methods in terms of PD, PF, F1-score, G-mean and AUC.</p

A Cross-project Defect Prediction Model Using Feature Transfer and Ensemble Learning

Cross-project defect prediction (CPDP) trains the prediction models with existing data from other projects (the source projects) and uses the trained model to predict the target projects. To solve two major problems in CPDP, namely, variability in data distribution and class imbalance, in this paper we raise a CPDP model combining feature transfer and ensemble learning, with two stages of feature transfer and the classification. The feature transfer method is based on Pearson correlation coefficient, which reduces the dimension of feature space and the difference of feature distribution between items. The class imbalance is solved by SMOTE and Voting on both algorithm and data levels. The experimental results on 20 source-target projects show that our method can yield significant improvement on CPDP

BagStack Classification for Data Imbalance Problems with Application to Defect Detection and Labeling in Semiconductor Units

abstract: Despite the fact that machine learning supports the development of computer vision applications by shortening the development cycle, finding a general learning algorithm that solves a wide range of applications is still bounded by the ”no free lunch theorem”. The search for the right algorithm to solve a specific problem is driven by the problem itself, the data availability and many other requirements. Automated visual inspection (AVI) systems represent a major part of these challenging computer vision applications. They are gaining growing interest in the manufacturing industry to detect defective products and keep these from reaching customers. The process of defect detection and classification in semiconductor units is challenging due to different acceptable variations that the manufacturing process introduces. Other variations are also typically introduced when using optical inspection systems due to changes in lighting conditions and misalignment of the imaged units, which makes the defect detection process more challenging. In this thesis, a BagStack classification framework is proposed, which makes use of stacking and bagging concepts to handle both variance and bias errors. The classifier is designed to handle the data imbalance and overfitting problems by adaptively transforming the multi-class classification problem into multiple binary classification problems, applying a bagging approach to train a set of base learners for each specific problem, adaptively specifying the number of base learners assigned to each problem, adaptively specifying the number of samples to use from each class, applying a novel data-imbalance aware cross-validation technique to generate the meta-data while taking into account the data imbalance problem at the meta-data level and, finally, using a multi-response random forest regression classifier as a meta-classifier. The BagStack classifier makes use of multiple features to solve the defect classification problem. In order to detect defects, a locally adaptive statistical background modeling is proposed. The proposed BagStack classifier outperforms state-of-the-art image classification techniques on our dataset in terms of overall classification accuracy and average per-class classification accuracy. The proposed detection method achieves high performance on the considered dataset in terms of recall and precision.Dissertation/ThesisDoctoral Dissertation Computer Engineering 201

Predictive Analytics and Software Defect Severity: A Systematic Review and Future Directions

Software testing identifies defects in software products with varying multiplying effects based on their severity levels and sequel to instant rectifications, hence the rate of a research study in the software engineering domain. In this paper, a systematic literature review (SLR) on machine learning-based software defect severity prediction was conducted in the last decade. The SLR was aimed at detecting germane areas central to efficient predictive analytics, which are seldom captured in existing software defect severity prediction reviews. The germane areas include the analysis of techniques or approaches which have a significant influence on the threats to the validity of proposed models, and the bias-variance tradeoff considerations techniques in data science-based approaches. A population, intervention, and outcome model is adopted for better search terms during the literature selection process, and subsequent quality assurance scrutiny yielded fifty-two primary studies. A subsequent thoroughbred systematic review was conducted on the final selected studies to answer eleven main research questions, which uncovers approaches that speak to the aforementioned germane areas of interest. The results indicate that while the machine learning approach is ubiquitous for predicting software defect severity, germane techniques central to better predictive analytics are infrequent in literature. This study is concluded by summarizing prominent study trends in a mind map to stimulate future research in the software engineering industry.publishedVersio