289 research outputs found

    On the testing of special memories in GPGPUs

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    Nowadays, data-intensive processing applications, such as multimedia, high-performance computing and safety-critical ones (e.g., in automotive) employ General Purpose Graphics Processing Units (GPGPUs) due to their parallel processing capabilities and high performance. In these devices, multiple levels of memories are employed in GPGPUs to hide latency and increase the performance during the operation of a kernel. Moreover, modern GPGPU architectures implement cutting-edge semiconductor technologies, reducing their size and power consumption. However, some studies proved that these technologies are prone to faults during the operative life of a device, so compromising reliability. In this work, we developed functional test techniques based on parallel Software-Based Self-Test routines to test memory structures in the memory hierarchy of a GPGPU (FlexGripPlus) implementing the G80 architecture of Nvidia

    Tackling Choke Point Induced Performance Bottlenecks in a Near-Threshold GPGPU

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    Over the last decade, General Purpose Graphics Processing Units (GPGPUs) have garnered a substantial attention in the research community due to their extensive thread-level parallelism. GPGPUs provide a remarkable performance improvement over Central Processing Units (CPUs), for highly parallel applications. However, GPGPUs typically achieve this extensive thread-level parallelism at the cost of a large power consumption. Consequently, Near-Threshold Computing (NTC) provides a promising opportunity for designing energy-efficient GPGPUs (NTC-GPUs). However, NTC-GPUs suffer from a crucial Process Variation (PV)-inflicted performance bottleneck, which is called Choke Point. Choke Point is defined as one or small group of gates which is affected by PV. Choke Point is capable of varying the path-delay of circuit and causing different forms of timing violation. In this work, a cross-layer design technique is proposed to tackle the performance impediments caused by choke points in NTC-GPUs

    DYRE: a DYnamic REconfigurable solution to increase GPGPU's reliability

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    General-purpose graphics processing units (GPGPUs) are extensively used in high-performance computing. However, it is well known that these devices’ reliability may be limited by the rising of faults at the hardware level. This work introduces a flexible solution to detect and mitigate permanent faults affecting the execution units in these parallel devices. The proposed solution is based on adding some spare modules to perform two in-field operations: detecting and mitigating faults. The solution takes advantage of the regularity of the execution units in the device to avoid significant design changes and reduce the overhead. The proposed solution was evaluated in terms of reliability improvement and area, performance, and power overhead costs. For this purpose, we resorted to a micro-architectural open-source GPGPU model (FlexGripPlus). Experimental results show that the proposed solution can extend the reliability by up to 57%, with overhead costs lower than 2% and 8% in area and power, respectively
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