Miniaturized Transistors, Volume II

In this book, we aim to address the ever-advancing progress in microelectronic device scaling. Complementary Metal-Oxide-Semiconductor (CMOS) devices continue to endure miniaturization, irrespective of the seeming physical limitations, helped by advancing fabrication techniques. We observe that miniaturization does not always refer to the latest technology node for digital transistors. Rather, by applying novel materials and device geometries, a significant reduction in the size of microelectronic devices for a broad set of applications can be achieved. The achievements made in the scaling of devices for applications beyond digital logic (e.g., high power, optoelectronics, and sensors) are taking the forefront in microelectronic miniaturization. Furthermore, all these achievements are assisted by improvements in the simulation and modeling of the involved materials and device structures. In particular, process and device technology computer-aided design (TCAD) has become indispensable in the design cycle of novel devices and technologies. It is our sincere hope that the results provided in this Special Issue prove useful to scientists and engineers who find themselves at the forefront of this rapidly evolving and broadening field. Now, more than ever, it is essential to look for solutions to find the next disrupting technologies which will allow for transistor miniaturization well beyond silicon’s physical limits and the current state-of-the-art. This requires a broad attack, including studies of novel and innovative designs as well as emerging materials which are becoming more application-specific than ever before

Circuits Techniques for Wireless Sensing Systems in High-Temperature Environments

RÉSUMÉ Dans ce projet, nous proposons de nouvelles techniques d’intégration basées sur la technologie de nitrure de gallium (GaN). Ces techniques permettent de mettre en œuvre un système de transmission de données sans fil entièrement intégré dédié aux capteurs de surveillance pour des applications d'environnement hostile. Le travail nécessite de trouver une technologie capable de résister à l'environnement sévère, principalement à haute température, et de permettre un niveau d'intégration élevé. Le système réalisé serait le premier dispositif de transmission de données basé sur la technologie GaN. En plus de supporter les conditions de haute température (HT) dépassant 600 oC, le système de transmission sans fil attendu devrait fonctionner à travers une barrière métallique séparant le module émetteur du récepteur. Une revue de la littérature sur les applications en environnements hostiles ainsi que sur l'électronique correspondante a été réalisée pour sélectionner la technologie AlGaN/GaN HEMT (transistor à haute mobilité d'électrons) comme une technologie appropriée. Le kit de conception GaN500, fourni par le Conseil national de recherches du Canada (CNRC), a été adopté pour concevoir et mettre en œuvre le système proposé. Cette technologie a été initialement introduite pour desservir les applications radiofréquences (RF) et micro-ondes. Par conséquent, elle n'avait pas été validée pour concevoir et fabriquer des circuits intégrés analogiques et numériques complexes et son utilisation à des températures extrêmes n’était pas validée. Nous avons donc caractérisé à haute température des dispositifs fabriqués en GaN500 et des éléments passifs intégrés correspondants ont été réalisés. Ces composants ont été testés sur la plage de température comprise entre 25 et 600 oC dans cette thèse. Les résultats de caractérisation ont été utilisés pour extraire les modèles HT des HEMT intégrés et des éléments passifs à utiliser dans les simulations. En outre, plusieurs composants intégrés basés sur la technologie GaN500, notamment des NOT, NOR, NAND, XOR, XNOR, registres, éléments de délais et oscillateurs ont été mis en œuvre et testés en HT. Des circuits analogiques à base de GaN500, comprenant un amplificateur de tension, un comparateur, un redresseur simple alternance, un redresseur double alternance, une pompe de charge et une référence de tension ont également été mis en œuvre et testés en HT. Le système de transmission de données mis en œuvre se compose d'un module de modulation situé dans la partie émettrice et d'un module de démodulation situé dans la partie réceptrice.----------ABSTRACT In this project, we propose new integrated-circuit design techniques based on the Gallium Nitride (GaN) technology to implement a fully-integrated data transmission system dedicated to wireless sensing in harsh environment applications. The goal in this thesis is to find a proper technology able to withstand harsh-environments (HEs), mainly characterized by high temperatures, and to allow a high-integration level. The reported design is the first data transmission system based on GaN technology. In addition to high temperature (HT) environment exceeding 600 oC, the expected wireless transmission systems may need to operate through metallic barriers separating the transmitting from the receiving modules. A wide literature review on the HE applications and corresponding electronics has been done to select the AlGaN/GaN HEMT (high-electron-mobility transistor) technology. The GaN500 design kit, provided by National Research Council of Canada (NRC), was adopted to design and implement the proposed system. This technology was initially provided to serve radio frequency (RF) and microwave circuits and applications. Consequently, it was not validated to implement complex integrated systems and to withstand extreme temperatures. Therefore, the high-temperature characterization of fabricated GaN500 devices and corresponding integrated passive elements was performed over the temperature range 25-600 oC in this thesis. The characterization results were used to extract HT models of the integrated HEMTs and passive elements to be used in simulations. Also, several GaN500-based digital circuits including NOT, NOR, NAND, XOR, XNOR, register, Delay and Ring oscillator were implemented and tested at HT. GaN500-based Analog circuits including front-end amplifier, comparator, half-bridge rectifier, full-bridge rectifier, charge pump and voltage reference were implemented and tested at HT as well. The implemented data transmission system consists of a modulation module located in the transmitting part and a demodulation block located in the receiving part. The proposed modulation system is based on the delta-sigma modulation technique and composed of a front-end amplifier, a comparator, a register, a charge pump and a ring oscillator. The output stage of the transmitter is intended to perform the load-shift-keying (LSK) modulation required to accomplish the data transmission through the dedicated inductive link. At the receiver level, three demodulation topologies were proposed to acquire the delivered LSK-modulated signals

Wide Bandgap Based Devices

Emerging wide bandgap (WBG) semiconductors hold the potential to advance the global industry in the same way that, more than 50 years ago, the invention of the silicon (Si) chip enabled the modern computer era. SiC- and GaN-based devices are starting to become more commercially available. Smaller, faster, and more efficient than their counterpart Si-based components, these WBG devices also offer greater expected reliability in tougher operating conditions. Furthermore, in this frame, a new class of microelectronic-grade semiconducting materials that have an even larger bandgap than the previously established wide bandgap semiconductors, such as GaN and SiC, have been created, and are thus referred to as “ultra-wide bandgap” materials. These materials, which include AlGaN, AlN, diamond, Ga2O3, and BN, offer theoretically superior properties, including a higher critical breakdown field, higher temperature operation, and potentially higher radiation tolerance. These attributes, in turn, make it possible to use revolutionary new devices for extreme environments, such as high-efficiency power transistors, because of the improved Baliga figure of merit, ultra-high voltage pulsed power switches, high-efficiency UV-LEDs, and electronics. This Special Issue aims to collect high quality research papers, short communications, and review articles that focus on wide bandgap device design, fabrication, and advanced characterization. The Special Issue will also publish selected papers from the 43rd Workshop on Compound Semiconductor Devices and Integrated Circuits, held in France (WOCSDICE 2019), which brings together scientists and engineers working in the area of III–V, and other compound semiconductor devices and integrated circuits

MODELLING AND DESIGN OF DIAMOND POWER SEMICONDUCTOR DEVICES

With its remarkable electro-thermal properties such as the highest known thermal conductivity (~22 W/cm∙ K at room temperature) of any material, high hole mobility (>2000 cm2/V∙s), high critical electric field (>10 MV/cm), and large bandgap (5.47 eV), Diamond has overwhelming advantages over Silicon and wide bandgap semiconductors (WBG) for ultra-high voltage and high temperature applications (>3 kV and >450 K, respectively). However, despite its tremendous potential, fabricated devices based on this material have not yet delivered the expected high-performance. This is due to three main reasons: (i) the lack of consistent physical models and design approaches specific to diamond-based devices that could significantly accelerate their development; (ii) the absence of shallow acceptor and donor dopant species which has resulted in poor room temperature performance; (iii) the technological issues of the manufacturing process. With the principal aim of modelling the next generation of diamond devices, this Ph.D dissertation endeavours to numerically model the main electro-thermal properties of diamond devices for power electronic applications. Optimized unipolar mode diamond field effect transistors have been designed by means of finite element simulations and their performance has been assessed against the state-of-the-art diamond FETs. Particular attention is given to the static and dynamic properties of deep dopant levels and their effects in WBG semiconductor-based devices. Moreover, by means of a more global comparison technique and through accurate theoretical analysis, diamond FETs and diodes’ performance have been projected and compared with that of GaN and SiC devices. This work concludes with possible implementations of diamond devices in power converters and provides a roadmap of diamond devices for power electronics. These promising results give a new impetus to the rather small, but growing diamond community and enable future research in the field with the goal of bringing diamond to the commercial world.U.K. Engineering and Physical Sciences Research Council for the University of Cambridge Centre for Doctoral Training under Grant EP/M506485/

Physics and Technology of Silicon Carbide Devices

Recently, some SiC power devices such as Schottky-barrier diodes (SBDs), metal-oxide-semiconductor field-effect-transistors (MOSFETs), junction FETs (JFETs), and their integrated modules have come onto the market. However, to stably supply them and reduce their cost, further improvements for material characterizations and those for device processing are still necessary. This book abundantly describes recent technologies on manufacturing, processing, characterization, modeling, and so on for SiC devices. In particular, for explanation of technologies, I was always careful to argue physics underlying the technologies as much as possible. If this book could be a little helpful to progress of SiC devices, it will be my unexpected happiness

Feature Papers in Electronic Materials Section

This book entitled "Feature Papers in Electronic Materials Section" is a collection of selected papers recently published on the journal Materials, focusing on the latest advances in electronic materials and devices in different fields (e.g., power- and high-frequency electronics, optoelectronic devices, detectors, etc.). In the first part of the book, many articles are dedicated to wide band gap semiconductors (e.g., SiC, GaN, Ga2O3, diamond), focusing on the current relevant materials and devices technology issues. The second part of the book is a miscellaneous of other electronics materials for various applications, including two-dimensional materials for optoelectronic and high-frequency devices. Finally, some recent advances in materials and flexible sensors for bioelectronics and medical applications are presented at the end of the book

An Analytic model for high electron mobility transistors.

Thesis (Ph.D.)-University of Natal, Durban, 1986.The last six years has seen the emergence and rapid development of a new type of field effect transistor, the High Electron Mobility Transistor (HEMT), which offers improved performance in both digital and analogue circuits compared with circuits incorporating either MEtal Semiconductor (MES) or Metal Oxide Semiconductor (MOS) FETs. A new physically-based analytic model for HEMTs, which predicts the DC and RF electrical performance from the material and structural parameters of the device, is presented. The efficacy of the model is demonstrated with comparisons between simulated and measured device characteristics, at DC and microwave frequencies. The good agreement with experiment obtained with the model indicates that velocity overshoot effects are considerably less important in HEMTs than has been widely assumed, and that the electron transit velocity in submicron devices is approximately 10 cm/s, rather than around 2x10 cm/s. The Inverted HEMT, one of the major HEMT structural variants, is emphasized throughout this work because of its potential advantages over other variants, and practical results from 0.5 micron gate length Inverted HEMTs are presented