A simulation and diagnosis system incorporating various time delay models and functional elements

The application of digital simulation to all phases of digital network design is considered here as oppossed [sic] to development of simulation for one or two restricted parts of the digital process. For this reason a simulator is presented which can be consistent by varying the level of expression from the simulation of architectural structures to such detailed simulation requirements as race analysis of asynchronous sequential circuits. In order to make system simulation more than just an idea, it must be capable of handling large circuits in reasonable times. It is demonstrated that functional simulation has the potential to increase simulation speed while reducing the required storage. This potential is realized with the following features of this simulator structure: 1) a modular structure for specification and execution, 2) the capability of being easily interfaced with gate level simulation, 3) the capability of utilizing the highest level of expression for simulation, 4) a variable level of expression, 5) a relatively unrestricted type of logic that can be simulated, 6) the capabilities of using standard functional modules, 7) a fairly universal means of expressing functional modules and, 8) the use of data and control signals to further force selective trace capabilities on a module level. Greater gate level simulation capabilities are obtained by extending the basic simulator to perform the simulation of undefined signal values and the simulation of ambiguities in signal propagation speeds. The simulator presented here is part of a Test Generation and Simulation System. This system includes preprocessing, combinational test generation, automatic fault insertion as well as simulation --Abstract, page ii

Testing mixed-signal cores: a practical oscillation-based test in an analog macrocell

A formal set of design decisions can aid in using oscillation-based test (OBT) for analog subsystems in SoCs. The goal is to offer designers testing options that do not have significant area overhead, performance degradation, or test time. This work shows that OBT is a potential candidate for IP providers to use in combination with functional test techniques. We have shown how to modify the basic concept of OBT to come up with a practical method. Using our approach, designers can use OBT to pave the way for future developments in SoC testing, and it is simple to extend this idea to BIST.European Union 2635

Immunotronics - novel finite-state-machine architectures with built-in self-test using self-nonself differentiation

A novel approach to hardware fault tolerance is demonstrated that takes inspiration from the human immune system as a method of fault detection. The human immune system is a remarkable system of interacting cells and organs that protect the body from invasion and maintains reliable operation even in the presence of invading bacteria or viruses. This paper seeks to address the field of electronic hardware fault tolerance from an immunological perspective with the aim of showing how novel methods based upon the operation of the immune system can both complement and create new approaches to the development of fault detection mechanisms for reliable hardware systems. In particular, it is shown that by use of partial matching, as prevalent in biological systems, high fault coverage can be achieved with the added advantage of reducing memory requirements. The development of a generic finite-state-machine immunization procedure is discussed that allows any system that can be represented in such a manner to be "immunized" against the occurrence of faulty operation. This is demonstrated by the creation of an immunized decade counter that can detect the presence of faults in real tim

The Synthesis of Cyclic Combinatorial Circuits

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