Focusing Sensor Design for Open Electrical Impedance Tomography Based on Shape Conformal Transformation

Electrical Impedance Tomography (EIT) is a non-invasive detection method to image the conductivity changes inside an observation region by using the electrical measurements at the boundary of this region. In some applications of EIT, the observation domain is infinite and is only accessible from one side, which leads to the so-called open EIT (OEIT) problem. Compared with conventional EIT problems, the observation region in OEIT can only be measured from limited projection directions, which makes high resolution imaging much more challenging. To improve the imaging quality of OEIT, a focusing sensor design strategy is proposed based on shape conformal theory. The conformal bijection is used to map a standard EIT sensor defined at a unit circle to a focusing OEIT sensor defined at an upper half plane. A series of numerical and experimental testes are conducted. Compared with the traditional sensor structure, the proposed focusing sensor has higher spatial resolution at the near-electrode region and is good at distinguishing multi-inclusions which are close to each other

Focusing Sensor Design for Open Electrical Impedance Tomography Based on Shape Conformal Transformation

Electrical Impedance Tomography (EIT) is a non-invasive detection method to image the conductivity changes inside an observation region by using the electrical measurements at the boundary of this region. In some applications of EIT, the observation domain is infinite and is only accessible from one side, which leads to the so-called open EIT (OEIT) problem. Compared with conventional EIT problems, the observation region in OEIT can only be measured from limited projection directions, which makes high resolution imaging much more challenging. To improve the imaging quality of OEIT, a focusing sensor design strategy is proposed based on shape conformal theory. The conformal bijection is used to map a standard EIT sensor defined at a unit circle to a focusing OEIT sensor defined at an upper half plane. A series of numerical and experimental testes are conducted. Compared with the traditional sensor structure, the proposed focusing sensor has higher spatial resolution at the near-electrode region and is good at distinguishing multi-inclusions which are close to each other