Communication Subsystems for Emerging Wireless Technologies

The paper describes a multi-disciplinary design of modern communication systems. The design starts with the analysis of a system in order to define requirements on its individual components. The design exploits proper models of communication channels to adapt the systems to expected transmission conditions. Input filtering of signals both in the frequency domain and in the spatial domain is ensured by a properly designed antenna. Further signal processing (amplification and further filtering) is done by electronics circuits. Finally, signal processing techniques are applied to yield information about current properties of frequency spectrum and to distribute the transmission over free subcarrier channels

Low-Resolution Fault Localization Using Phasor Measurement Units with Community Detection

A significant portion of the literature on fault localization assumes (more or less explicitly) that there are sufficient reliable measurements to guarantee that the system is observable. While several heuristics exist to break the observability barrier, they mostly rely on recognizing spatio-temporal patterns, without giving insights on how the performance are tied with the system features and the sensor deployment. In this paper, we try to fill this gap and investigate the limitations and performance limits of fault localization using Phasor Measurement Units (PMUs), in the low measurements regime, i.e., when the system is unobservable with the measurements available. Our main contribution is to show how one can leverage the scarce measurements to localize different type of distribution line faults (three-phase, single-phase to ground, ...) at the level of sub-graph, rather than with the resolution of a line. We show that the resolution we obtain is strongly tied with the graph clustering notion in network science.Comment: Accepted in IEEE SmartGridComm 2018 Conferenc

Spectrum-Based Fault Localization in Model Transformations

Model transformations play a cornerstone role in Model-Driven Engineering (MDE), as they provide the essential mechanisms for manipulating and transforming models. The correctness of software built using MDE techniques greatly relies on the correctness of model transformations. However, it is challenging and error prone to debug them, and the situation gets more critical as the size and complexity of model transformations grow, where manual debugging is no longer possible. Spectrum-Based Fault Localization (SBFL) uses the results of test cases and their corresponding code coverage information to estimate the likelihood of each program component (e.g., statements) of being faulty. In this article we present an approach to apply SBFL for locating the faulty rules in model transformations. We evaluate the feasibility and accuracy of the approach by comparing the effectiveness of 18 different stateof- the-art SBFL techniques at locating faults in model transformations. Evaluation results revealed that the best techniques, namely Kulcynski2, Mountford, Ochiai, and Zoltar, lead the debugger to inspect a maximum of three rules to locate the bug in around 74% of the cases. Furthermore, we compare our approach with a static approach for fault localization in model transformations, observing a clear superiority of the proposed SBFL-based method.Comisión Interministerial de Ciencia y Tecnología TIN2015-70560-RJunta de Andalucía P12-TIC-186

Towards Structural Testing of Superconductor Electronics

Many of the semiconductor technologies are already\ud facing limitations while new-generation data and\ud telecommunication systems are implemented. Although in\ud its infancy, superconductor electronics (SCE) is capable of\ud handling some of these high-end tasks. We have started a\ud defect-oriented test methodology for SCE, so that reliable\ud systems can be implemented in this technology. In this\ud paper, the details of the study on the Rapid Single-Flux\ud Quantum (RSFQ) process are presented. We present\ud common defects in the SCE processes and corresponding\ud test methodologies to detect them. The (measurement)\ud results prove that we are able to detect possible random\ud defects for statistical purposes in yield analysis. This\ud paper also presents possible test methodologies for RSFQ\ud circuits based on defect oriented testing (DOT)

Testing a Quantum Computer

The problem of quantum test is formally addressed. The presented method attempts the quantum role of classical test generation and test set reduction methods known from standard binary and analog circuits. QuFault, the authors software package generates test plans for arbitrary quantum circuits using the very efficient simulator QuIDDPro[1]. The quantum fault table is introduced and mathematically formalized, and the test generation method explained.Comment: 15 pages, 17 equations, 27 tables, 8 figure