LOT: Logic Optimization with Testability - new transformations for logic synthesis

A new approach to optimize multilevel logic circuits is introduced. Given a multilevel circuit, the synthesis method optimizes its area while simultaneously enhancing its random pattern testability. The method is based on structural transformations at the gate level. New transformations involving EX-OR gates as well as Reed–Muller expansions have been introduced in the synthesis of multilevel circuits. This method is augmented with transformations that specifically enhance random-pattern testability while reducing the area. Testability enhancement is an integral part of our synthesis methodology. Experimental results show that the proposed methodology not only can achieve lower area than other similar tools, but that it achieves better testability compared to available testability enhancement tools such as tstfx. Specifically for ISCAS-85 benchmark circuits, it was observed that EX-OR gate-based transformations successfully contributed toward generating smaller circuits compared to other state-of-the-art logic optimization tools

Testing a Quantum Computer

The problem of quantum test is formally addressed. The presented method attempts the quantum role of classical test generation and test set reduction methods known from standard binary and analog circuits. QuFault, the authors software package generates test plans for arbitrary quantum circuits using the very efficient simulator QuIDDPro[1]. The quantum fault table is introduced and mathematically formalized, and the test generation method explained.Comment: 15 pages, 17 equations, 27 tables, 8 figure

Metastability-Containing Circuits

In digital circuits, metastability can cause deteriorated signals that neither are logical 0 or logical 1, breaking the abstraction of Boolean logic. Unfortunately, any way of reading a signal from an unsynchronized clock domain or performing an analog-to-digital conversion incurs the risk of a metastable upset; no digital circuit can deterministically avoid, resolve, or detect metastability (Marino, 1981). Synchronizers, the only traditional countermeasure, exponentially decrease the odds of maintained metastability over time. Trading synchronization delay for an increased probability to resolve metastability to logical 0 or 1, they do not guarantee success. We propose a fundamentally different approach: It is possible to contain metastability by fine-grained logical masking so that it cannot infect the entire circuit. This technique guarantees a limited degree of metastability in---and uncertainty about---the output. At the heart of our approach lies a time- and value-discrete model for metastability in synchronous clocked digital circuits. Metastability is propagated in a worst-case fashion, allowing to derive deterministic guarantees, without and unlike synchronizers. The proposed model permits positive results and passes the test of reproducing Marino's impossibility results. We fully classify which functions can be computed by circuits with standard registers. Regarding masking registers, we show that they become computationally strictly more powerful with each clock cycle, resulting in a non-trivial hierarchy of computable functions

Efficient Simulation of Structural Faults for the Reliability Evaluation at System-Level

In recent technology nodes, reliability is considered a part of the standard design ¿ow at all levels of embedded system design. While techniques that use only low-level models at gate- and register transfer-level offer high accuracy, they are too inefficient to consider the overall application of the embedded system. Multi-level models with high abstraction are essential to efficiently evaluate the impact of physical defects on the system. This paper provides a methodology that leverages state-of-the-art techniques for efficient fault simulation of structural faults together with transaction-level modeling. This way it is possible to accurately evaluate the impact of the faults on the entire hardware/software system. A case study of a system consisting of hardware and software for image compression and data encryption is presented and the method is compared to a standard gate/RT mixed-level approac