Tele-Autonomous control involving contact

Object localization and its application in tele-autonomous systems are studied. Two object localization algorithms are presented together with the methods of extracting several important types of object features. The first algorithm is based on line-segment to line-segment matching. Line range sensors are used to extract line-segment features from an object. The extracted features are matched to corresponding model features to compute the location of the object. The inputs of the second algorithm are not limited only to the line features. Featured points (point to point matching) and featured unit direction vectors (vector to vector matching) can also be used as the inputs of the algorithm, and there is no upper limit on the number of the features inputed. The algorithm will allow the use of redundant features to find a better solution. The algorithm uses dual number quaternions to represent the position and orientation of an object and uses the least squares optimization method to find an optimal solution for the object's location. The advantage of using this representation is that the method solves for the location estimation by minimizing a single cost function associated with the sum of the orientation and position errors and thus has a better performance on the estimation, both in accuracy and speed, than that of other similar algorithms. The difficulties when the operator is controlling a remote robot to perform manipulation tasks are also discussed. The main problems facing the operator are time delays on the signal transmission and the uncertainties of the remote environment. How object localization techniques can be used together with other techniques such as predictor display and time desynchronization to help to overcome these difficulties are then discussed

A scale-space approach with wavelets to singularity estimation

This paper is concerned with the problem of determining the typical features of a curve when it is observed with noise. It has been shown that one can characterize the Lipschitz singularities of a signal by following the propagation across scales of the modulus maxima of its continuous wavelet transform. A nonparametric approach, based on appropriate thresholding of the empirical wavelet coefficients, is proposed to estimate the wavelet maxima of a signal observed with noise at various scales. In order to identify the singularities of the unknown signal, we introduce a new tool, "the structural intensity", that computes the "density" of the location of the modulus maxima of a wavelet representation along various scales. This approach is shown to be an effective technique for detecting the significant singularities of a signal corrupted by noise and for removing spurious estimates. The asymptotic properties of the resulting estimators are studied and illustrated by simulations. An application to a real data set is also proposed

Simultaneously Sparse Solutions to Linear Inverse Problems with Multiple System Matrices and a Single Observation Vector

A linear inverse problem is proposed that requires the determination of multiple unknown signal vectors. Each unknown vector passes through a different system matrix and the results are added to yield a single observation vector. Given the matrices and lone observation, the objective is to find a simultaneously sparse set of unknown vectors that solves the system. We will refer to this as the multiple-system single-output (MSSO) simultaneous sparsity problem. This manuscript contrasts the MSSO problem with other simultaneous sparsity problems and conducts a thorough initial exploration of algorithms with which to solve it. Seven algorithms are formulated that approximately solve this NP-Hard problem. Three greedy techniques are developed (matching pursuit, orthogonal matching pursuit, and least squares matching pursuit) along with four methods based on a convex relaxation (iteratively reweighted least squares, two forms of iterative shrinkage, and formulation as a second-order cone program). The algorithms are evaluated across three experiments: the first and second involve sparsity profile recovery in noiseless and noisy scenarios, respectively, while the third deals with magnetic resonance imaging radio-frequency excitation pulse design.Comment: 36 pages; manuscript unchanged from July 21, 2008, except for updated references; content appears in September 2008 PhD thesi

A Survey on Metric Learning for Feature Vectors and Structured Data

The need for appropriate ways to measure the distance or similarity between data is ubiquitous in machine learning, pattern recognition and data mining, but handcrafting such good metrics for specific problems is generally difficult. This has led to the emergence of metric learning, which aims at automatically learning a metric from data and has attracted a lot of interest in machine learning and related fields for the past ten years. This survey paper proposes a systematic review of the metric learning literature, highlighting the pros and cons of each approach. We pay particular attention to Mahalanobis distance metric learning, a well-studied and successful framework, but additionally present a wide range of methods that have recently emerged as powerful alternatives, including nonlinear metric learning, similarity learning and local metric learning. Recent trends and extensions, such as semi-supervised metric learning, metric learning for histogram data and the derivation of generalization guarantees, are also covered. Finally, this survey addresses metric learning for structured data, in particular edit distance learning, and attempts to give an overview of the remaining challenges in metric learning for the years to come.Comment: Technical report, 59 pages. Changes in v2: fixed typos and improved presentation. Changes in v3: fixed typos. Changes in v4: fixed typos and new method

Inverse Analysis of Multiple Indentation Unloading Curves for Thin Film Young's Modulus Evaluation

International audienceThe Oliver and Pharr method is the prevailing process for thin films Young's modulus evaluation. Introduced initially for homogeneous materials, this method does not account for the substrate and can consequently lead to significant error, especially at large indentation depths. We suggest here possible methods to improve the accuracy by making use of inverse analysis and finite element computations of the one layer elastic indentation problem