An Extended Review on Fabric Defects and Its Detection Techniques

In Textile Industry, Quality of the Fabric is the main important factor. At the initial stage, it is very essential to identify and avoid the fabrics faults/defects and hence human perception consumes lot of time and cost to reveal the fabrics faults. Now-a-days Automated Inspection Systems are very useful to decrease the fault prediction time and gives best visualizing clarity- based on computer vision and image processing techniques. This paper made an extended review about the quality parameters in the fiber-to-fabric process, fabrics defects detection terminologies applied on major three clusters of fabric defects knitting, woven and sewing fabric defects. And this paper also explains about the statistical performance measures which are used to analyze the defect detection process. Also, comparison among the methods proposed in the field of fabric defect detection

GLCM-based chi-square histogram distance for automatic detection of defects on patterned textures

Chi-square histogram distance is one of the distance measures that can be used to find dissimilarity between two histograms. Motivated by the fact that texture discrimination by human vision system is based on second-order statistics, we make use of histogram of gray-level co-occurrence matrix (GLCM) that is based on second-order statistics and propose a new machine vision algorithm for automatic defect detection on patterned textures. Input defective images are split into several periodic blocks and GLCMs are computed after quantizing the gray levels from 0-255 to 0-63 to keep the size of GLCM compact and to reduce computation time. Dissimilarity matrix derived from chi-square distances of the GLCMs is subjected to hierarchical clustering to automatically identify defective and defect-free blocks. Effectiveness of the proposed method is demonstrated through experiments on defective real-fabric images of 2 major wallpaper groups (pmm and p4m groups).Comment: IJCVR, Vol. 2, No. 4, 2011, pp. 302-31

Improving Unsupervised Defect Segmentation by Applying Structural Similarity to Autoencoders

Convolutional autoencoders have emerged as popular methods for unsupervised defect segmentation on image data. Most commonly, this task is performed by thresholding a pixel-wise reconstruction error based on an $\ell^p$ distance. This procedure, however, leads to large residuals whenever the reconstruction encompasses slight localization inaccuracies around edges. It also fails to reveal defective regions that have been visually altered when intensity values stay roughly consistent. We show that these problems prevent these approaches from being applied to complex real-world scenarios and that it cannot be easily avoided by employing more elaborate architectures such as variational or feature matching autoencoders. We propose to use a perceptual loss function based on structural similarity which examines inter-dependencies between local image regions, taking into account luminance, contrast and structural information, instead of simply comparing single pixel values. It achieves significant performance gains on a challenging real-world dataset of nanofibrous materials and a novel dataset of two woven fabrics over the state of the art approaches for unsupervised defect segmentation that use pixel-wise reconstruction error metrics

Automatic Color Inspection for Colored Wires in Electric Cables

In this paper, an automatic optical inspection system for checking the sequence of colored wires in electric cable is presented. The system is able to inspect cables with flat connectors differing in the type and number of wires. This variability is managed in an automatic way by means of a self-learning subsystem and does not require manual input from the operator or loading new data to the machine. The system is coupled to a connector crimping machine and once the model of a correct cable is learned, it can automatically inspect each cable assembled by the machine. The main contributions of this paper are: (i) the self-learning system; (ii) a robust segmentation algorithm for extracting wires from images even if they are strongly bent and partially overlapped; (iii) a color recognition algorithm able to cope with highlights and different finishing of the wire insulation. We report the system evaluation over a period of several months during the actual production of large batches of different cables; tests demonstrated a high level of accuracy and the absence of false negatives, which is a key point in order to guarantee defect-free productions

Real-time portable system for fabric defect detection using an ARM processor

Modern textile industry seeks to produce textiles as little defective as possible since the presence of defects can decrease the final price of products from 45% to 65%. Automated visual inspection (AVI) systems, based on image analysis, have become an important alternative for replacing traditional inspections methods that involve human tasks. An AVI system gives the advantage of repeatability when implemented within defined constrains, offering more objective and reliable results for particular tasks than human inspection. Costs of automated inspection systems development can be reduced using modular solutions with embedded systems, in which an important advantage is the low energy consumption. Among the possibilities for developing embedded systems, the ARM processor has been explored for acquisition, monitoring and simple signal processing tasks. In a recent approach we have explored the use of the ARM processor for defects detection by implementing the wavelet transform. However, the computation speed of the preprocessing was not yet sufficient for real time applications. In this approach we significantly improve the preprocessing speed of the algorithm, by optimizing matrix operations, such that it is adequate for a real time application. The system was tested for defect detection using different defect types. The paper is focused in giving a detailed description of the basis of the algorithm implementation, such that other algorithms may use of the ARM operations for fast implementations

Fabric defect detection using the wavelet transform in an ARM processor

Small devices used in our day life are constructed with powerful architectures that can be used for industrial applications when requiring portability and communication facilities. We present in this paper an example of the use of an embedded system, the Zeus epic 520 single board computer, for defect detection in textiles using image processing. We implement the Haar wavelet transform using the embedded visual C++ 4.0 compiler for Windows CE 5. The algorithm was tested for defect detection using images of fabrics with five types of defects. An average of 95% in terms of correct defect detection was obtained, achieving a similar performance than using processors with float point arithmetic calculations

2-D iteratively reweighted least squares lattice algorithm and its application to defect detection in textured images

In this paper, a 2-D iteratively reweighted least squares lattice algorithm, which is robust to the outliers, is introduced and is applied to defect detection problem in textured images. First, the philosophy of using different optimization functions that results in weighted least squares solution in the theory of 1-D robust regression is extended to 2-D. Then a new algorithm is derived which combines 2-D robust regression concepts with the 2-D recursive least squares lattice algorithm. With this approach, whatever the probability distribution of the prediction error may be, small weights are assigned to the outliers so that the least squares algorithm will be less sensitive to the outliers. Implementation of the proposed iteratively reweighted least squares lattice algorithm to the problem of defect detection in textured images is then considered. The performance evaluation, in terms of defect detection rate, demonstrates the importance of the proposed algorithm in reducing the effect of the outliers that generally correspond to false alarms in classification of textures as defective or nondefective