Affine extractors over large fields with exponential error

We describe a construction of explicit affine extractors over large finite fields with exponentially small error and linear output length. Our construction relies on a deep theorem of Deligne giving tight estimates for exponential sums over smooth varieties in high dimensions.Comment: To appear in Comput. Comple

Almost-Uniform Sampling of Points on High-Dimensional Algebraic Varieties

We consider the problem of uniform sampling of points on an algebraic variety. Specifically, we develop a randomized algorithm that, given a small set of multivariate polynomials over a sufficiently large finite field, produces a common zero of the polynomials almost uniformly at random. The statistical distance between the output distribution of the algorithm and the uniform distribution on the set of common zeros is polynomially small in the field size, and the running time of the algorithm is polynomial in the description of the polynomials and their degrees provided that the number of the polynomials is a constant

Algebraic Independence and Blackbox Identity Testing

Algebraic independence is an advanced notion in commutative algebra that generalizes independence of linear polynomials to higher degree. Polynomials {f_1, ..., f_m} \subset \F[x_1, ..., x_n] are called algebraically independent if there is no non-zero polynomial F such that F(f_1, ..., f_m) = 0. The transcendence degree, trdeg{f_1, ..., f_m}, is the maximal number r of algebraically independent polynomials in the set. In this paper we design blackbox and efficient linear maps \phi that reduce the number of variables from n to r but maintain trdeg{\phi(f_i)}_i = r, assuming f_i's sparse and small r. We apply these fundamental maps to solve several cases of blackbox identity testing: (1) Given a polynomial-degree circuit C and sparse polynomials f_1, ..., f_m with trdeg r, we can test blackbox D := C(f_1, ..., f_m) for zeroness in poly(size(D))^r time. (2) Define a spsp_\delta(k,s,n) circuit C to be of the form \sum_{i=1}^k \prod_{j=1}^s f_{i,j}, where f_{i,j} are sparse n-variate polynomials of degree at most \delta. For k = 2 we give a poly(sn\delta)^{\delta^2} time blackbox identity test. (3) For a general depth-4 circuit we define a notion of rank. Assuming there is a rank bound R for minimal simple spsp_\delta(k,s,n) identities, we give a poly(snR\delta)^{Rk\delta^2} time blackbox identity test for spsp_\delta(k,s,n) circuits. This partially generalizes the state of the art of depth-3 to depth-4 circuits. The notion of trdeg works best with large or zero characteristic, but we also give versions of our results for arbitrary fields.Comment: 32 pages, preliminary versio