13,652 research outputs found

    The MOSSIM Simulation Engine Architecture and Design

    Get PDF
    As the complexity of VLSI circuits approaches 10 to the power of 6 devices, the computational requirements of design verification are exceeding the capacity of general purpose computers. To provide the computing power required to verify these complex VLSI chips, special purpose hardware for performing simulation is required. Existing simulation engines which perform logic simulation are inadequate for MOS VLSI because they cannot accurately model MOS circuits. Switch-level simulation, on the other hand, models the affects of capacitance and transistor ratios at speeds comparable to logic simulation. The MOSSDM Simulation Engine (MSE) is a special purpose processor for performing switch-level simulation of MOS VLSI circuits. A single processor MSE perfonns switch=level simulation 200 to 500 times faster than a VAX 11/780. Several MSE processors can be connected in pallel to achieve additional speedup. A virtual processor mechanism allows the MSE to simulate large circuits with the size of the circuit limited only by the amount of backing store available t o hold the circuit description. Functional simulation is provided on the MSE to facilitate the efficient simulation of large circuits

    Tool for fast mismatch analysis of analog circuits

    Get PDF
    A tool is presented that evaluates statistical deviations in performance characteristics of analog circuits, starting from statistical deviations in the technological parameters of MOS transistors. Performance is demonstrated via the analysis of a Miller OTA in two different configurations and a linearized CMOS transconductor. The CPU time is reduced by a factor of 25 to 90 with respect to conventional Monte Carlo simulation, while maintaining similar accuracy in the computations

    A new nonlinear time-domain op-amp macromodel using threshold functions and digitally controlled network elements

    Get PDF
    A general-purpose nonlinear macromodel for the time-domain simulation of integrated circuit operational amplifiers (op amps), either bipolar or MOS, is presented. Three main differences exist between the macromodel and those previously reported in the literature for the time domain. First, all the op-amp nonlinearities are simulated using threshold elements and digital components, thus making them well suited for a mixed electrical/logical simulator. Secondly, the macromodel exhibits a superior performance in those cases where the op amp is driven by a large signal. Finally, the macromodel is advantageous in terms of CPU time. Several examples are included illustrating all of these advantages. The main application of this macromodel is for the accurate simulation of the analog part of a combined analog/digital integrated circui

    Design of a tunable multi-band differential LC VCO using 0.35 mu m SiGe BiCMOS technology for multi-standard wireless communication systems

    Get PDF
    In this paper, an integrated 2.2-5.7GHz multi-band differential LC VCO for multi-standard wireless communication systems was designed utilizing 0.35 mu m SiGe BiCMOS technology. The topology, which combines the switching inductors and capacitors together in the same circuit, is a novel approach for wideband VCOs. Based on the post-layout simulation results, the VCO can be tuned using a DC voltage of 0 to 3.3 V for 5 different frequency bands (2.27-2.51 GHz, 2.48-2.78 GHz, 3.22-3.53 GHz, 3.48-3.91 GHz and 4.528-5.7 GHz) with a maximum bandwidth of 1.36 GHz and a minimum bandwidth of 300 MHz. The designed and simulated VCO can generate a differential output power between 0.992 and -6.087 dBm with an average power consumption of 44.21 mW including the buffers. The average second and third harmonics level were obtained as -37.21 and -47.6 dBm, respectively. The phase noise between -110.45 and -122.5 dBc/Hz, that was simulated at 1 MHz offset, can be obtained through the frequency of interest. Additionally, the figure of merit (FOM), that includes all important parameters such as the phase noise, the power consumption and the ratio of the operating frequency to the offset frequency, is between -176.48 and -181.16 and comparable or better than the ones with the other current VCOs. The main advantage of this study in comparison with the other VCOs, is covering 5 frequency bands starting from 2.27 up to 5.76 GHz without FOM and area abandonment. Output power of the fundamental frequency changes between -6.087 and 0.992 dBm, depending on the bias conditions (operating bands). Based on the post-layout simulation results, the core VCO circuit draws a current between 2.4-6.3 mA and between 11.4 and 15.3 mA with the buffer circuit from 3.3 V supply. The circuit occupies an area of 1.477 mm(2) on Si substrate, including DC, digital and RF pads

    Oscillation-based DFT for Second-order Bandpass OTA-C Filters

    Get PDF
    This document is the Accepted Manuscript version. Under embargo until 6 September 2018. The final publication is available at Springer via https://doi.org/10.1007/s00034-017-0648-9.This paper describes a design for testability technique for second-order bandpass operational transconductance amplifier and capacitor filters using an oscillation-based test topology. The oscillation-based test structure is a vectorless output test strategy easily extendable to built-in self-test. The proposed methodology converts filter under test into a quadrature oscillator using very simple techniques and measures the output frequency. Using feedback loops with nonlinear block, the filter-to-oscillator conversion techniques easily convert the bandpass OTA-C filter into an oscillator. With a minimum number of extra components, the proposed scheme requires a negligible area overhead. The validity of the proposed method has been verified using comparison between faulty and fault-free simulation results of Tow-Thomas and KHN OTA-C filters. Simulation results in 0.25μm CMOS technology show that the proposed oscillation-based test strategy for OTA-C filters is suitable for catastrophic and parametric faults testing and also effective in detecting single and multiple faults with high fault coverage.Peer reviewedFinal Accepted Versio
    corecore