Enhancing Power Efficient Design Techniques in Deep Submicron Era

Excessive power dissipation has been one of the major bottlenecks for design and manufacture in the past couple of decades. Power efficient design has become more and more challenging when technology scales down to the deep submicron era that features the dominance of leakage, the manufacture variation, the on-chip temperature variation and higher reliability requirements, among others. Most of the computer aided design (CAD) tools and algorithms currently used in industry were developed in the pre deep submicron era and did not consider the new features explicitly and adequately. Recent research advances in deep submicron design, such as the mechanisms of leakage, the source and characterization of manufacture variation, the cause and models of on-chip temperature variation, provide us the opportunity to incorporate these important issues in power efficient design. We explore this opportunity in this dissertation by demonstrating that significant power reduction can be achieved with only minor modification to the existing CAD tools and algorithms. First, we consider peak current, which has become critical for circuit's reliability in deep submicron design. Traditional low power design techniques focus on the reduction of average power. We propose to reduce peak current while keeping the overhead on average power as small as possible. Second, dual Vt technique and gate sizing have been used simultaneously for leakage savings. However, this approach becomes less effective in deep submicron design. We propose to use the newly developed process-induced mechanical stress to enhance its performance. Finally, in deep submicron design, the impact of on-chip temperature variation on leakage and performance becomes more and more significant. We propose a temperature-aware dual Vt approach to alleviate hot spots and achieve further leakage reduction. We also consider this leakage-temperature dependency in the dynamic voltage scaling approach and discover that a commonly accepted result is incorrect for the current technology. We conduct extensive experiments with popular design benchmarks, using the latest industry CAD tools and design libraries. The results show that our proposed enhancements are promising in power saving and are practical to solve the low power design challenges in deep submicron era

Practical advances in asynchronous design

Journal ArticleRecent practical advances in asynchronous circuit and system design have resulted in renewed interest by circuit designers. Asynchronous systems are being viewed as in increasingly viable alternative to globally synchronous system organization. This tutorial will present the current state of the art in asynchronous circuit and system design in three different areas. The first section details asynchronous control systems. The second describes a variety of approaches to asynchronous datapaths. The third section is on asynchronous and self-timed circuits applied to the design of general purpose processors

High-Speed Area-Efficient Hardware Architecture for the Efficient Detection of Faults in a Bit-Parallel Multiplier Utilizing the Polynomial Basis of GF(2m)

The utilization of finite field multipliers is pervasive in contemporary digital systems, with hardware implementation for bit parallel operation often necessitating millions of logic gates. However, various digital design issues, whether natural or stemming from soft errors, can result in gate malfunction, ultimately leading to erroneous multiplier outputs. Thus, to prevent susceptibility to error, it is imperative to employ an effective finite field multiplier implementation that boasts a robust fault detection capability. This study proposes a novel fault detection scheme for a recent bit-parallel polynomial basis multiplier over GF(2m), intended to achieve optimal fault detection performance for finite field multipliers while simultaneously maintaining a low-complexity implementation, a favored attribute in resource-constrained applications like smart cards. The primary concept behind the proposed approach is centered on the implementation of a BCH decoder that utilizes re-encoding technique and FIBM algorithm in its first and second sub-modules, respectively. This approach serves to address hardware complexity concerns while also making use of Berlekamp-Rumsey-Solomon (BRS) algorithm and Chien search method in the third sub-module of the decoder to effectively locate errors with minimal delay. The results of our synthesis indicate that our proposed error detection and correction architecture for a 45-bit multiplier with 5-bit errors achieves a 37% and 49% reduction in critical path delay compared to existing designs. Furthermore, the hardware complexity associated with a 45-bit multiplicand that contains 5 errors is confined to a mere 80%, which is significantly lower than the most exceptional BCH-based fault recognition methodologies, including TMR, Hamming's single error correction, and LDPC-based procedures within the realm of finite field multiplication.Comment: 9 pages, 4 figures. arXiv admin note: substantial text overlap with arXiv:2209.1338

Custom Integrated Circuits

Contains reports on twelve research projects.Analog Devices, Inc.International Business Machines, Inc.Joint Services Electronics Program (Contract DAAL03-86-K-0002)Joint Services Electronics Program (Contract DAAL03-89-C-0001)U.S. Air Force - Office of Scientific Research (Grant AFOSR 86-0164)Rockwell International CorporationOKI Semiconductor, Inc.U.S. Navy - Office of Naval Research (Contract N00014-81-K-0742)Charles Stark Draper LaboratoryNational Science Foundation (Grant MIP 84-07285)National Science Foundation (Grant MIP 87-14969)Battelle LaboratoriesNational Science Foundation (Grant MIP 88-14612)DuPont CorporationDefense Advanced Research Projects Agency/U.S. Navy - Office of Naval Research (Contract N00014-87-K-0825)American Telephone and TelegraphDigital Equipment CorporationNational Science Foundation (Grant MIP-88-58764

Fast algorithms for retiming large digital circuits

The increasing complexity of VLSI systems and shrinking time to market requirements demand good optimization tools capable of handling large circuits. Retiming is a powerful transformation that preserves functionality, and can be used to optimize sequential circuits for a wide range of objective functions by judiciously relocating the memory elements. Leiserson and Saxe, who introduced the concept, presented algorithms for period optimization (minperiod retiming) and area optimization (minarea retiming). The ASTRA algorithm proposed an alternative view of retiming using the equivalence between retiming and clock skew optimization;The first part of this thesis defines the relationship between the Leiserson-Saxe and the ASTRA approaches and utilizes it for efficient minarea retiming of large circuits. The new algorithm, Minaret, uses the same linear program formulation as the Leiserson-Saxe approach. The underlying philosophy of the ASTRA approach is incorporated to reduce the number of variables and constraints in this linear program. This allows minarea retiming of circuits with over 56,000 gates in under fifteen minutes;The movement of flip-flops in control logic changes the state encoding of finite state machines, requiring the preservation of initial (reset) states. In the next part of this work the problem of minimizing the number of flip-flops in control logic subject to a specified clock period and with the guarantee of an equivalent initial state, is formulated as a mixed integer linear program. Bounds on the retiming variables are used to guarantee an equivalent initial state in the retimed circuit. These bounds lead to a simple method for calculating an equivalent initial state for the retimed circuit;The transparent nature of level sensitive latches enables level-clocked circuits to operate faster and require less area. However, this transparency makes the operation of level-clocked circuits very complex, and optimization of level-clocked circuits is a difficult task. This thesis also presents efficient algorithms for retiming large level-clocked circuits. The relationship between retiming and clock skew optimization for level-clocked circuits is defined and utilized to develop efficient retiming algorithms for period and area optimization. Using these algorithms a circuit with 56,000 gates could be retimed for minimum period in under twenty seconds and for minimum area in under 1.5 hours

MorphIC: A 65-nm 738k-Synapse/mm2^2 Quad-Core Binary-Weight Digital Neuromorphic Processor with Stochastic Spike-Driven Online Learning

Recent trends in the field of neural network accelerators investigate weight quantization as a means to increase the resource- and power-efficiency of hardware devices. As full on-chip weight storage is necessary to avoid the high energy cost of off-chip memory accesses, memory reduction requirements for weight storage pushed toward the use of binary weights, which were demonstrated to have a limited accuracy reduction on many applications when quantization-aware training techniques are used. In parallel, spiking neural network (SNN) architectures are explored to further reduce power when processing sparse event-based data streams, while on-chip spike-based online learning appears as a key feature for applications constrained in power and resources during the training phase. However, designing power- and area-efficient spiking neural networks still requires the development of specific techniques in order to leverage on-chip online learning on binary weights without compromising the synapse density. In this work, we demonstrate MorphIC, a quad-core binary-weight digital neuromorphic processor embedding a stochastic version of the spike-driven synaptic plasticity (S-SDSP) learning rule and a hierarchical routing fabric for large-scale chip interconnection. The MorphIC SNN processor embeds a total of 2k leaky integrate-and-fire (LIF) neurons and more than two million plastic synapses for an active silicon area of 2.86mm$^2$ in 65nm CMOS, achieving a high density of 738k synapses/mm$^2$. MorphIC demonstrates an order-of-magnitude improvement in the area-accuracy tradeoff on the MNIST classification task compared to previously-proposed SNNs, while having no penalty in the energy-accuracy tradeoff.Comment: This document is the paper as accepted for publication in the IEEE Transactions on Biomedical Circuits and Systems journal (2019), the fully-edited paper is available at https://ieeexplore.ieee.org/document/876400