ToPoliNano: Nanoarchitectures Design Made Real

Many facts about emerging nanotechnologies are yet to be assessed. There are still major concerns, for instance, about maximum achievable device density, or about which architecture is best fit for a specific application. Growing complexity requires taking into account many aspects of technology, application and architecture at the same time. Researchers face problems that are not new per se, but are now subject to very different constraints, that need to be captured by design tools. Among the emerging nanotechnologies, two-dimensional nanowire based arrays represent promising nanostructures, especially for massively parallel computing architectures. Few attempts have been done, aimed at giving the possibility to explore architectural solutions, deriving information from extensive and reliable nanoarray characterization. Moreover, in the nanotechnology arena there is still not a clear winner, so it is important to be able to target different technologies, not to miss the next big thing. We present a tool, ToPoliNano, that enables such a multi-technological characterization in terms of logic behavior, power and timing performance, area and layout constraints, on the basis of specific technological and topological descriptions. This tool can aid the design process, beside providing a comprehensive simulation framework for DC and timing simulations, and detailed power analysis. Design and simulation results will be shown for nanoarray-based circuits. ToPoliNano is the first real design tool that tackles the top down design of a circuit based on emerging technologie

Efficient Simulation of Structural Faults for the Reliability Evaluation at System-Level

In recent technology nodes, reliability is considered a part of the standard design ¿ow at all levels of embedded system design. While techniques that use only low-level models at gate- and register transfer-level offer high accuracy, they are too inefficient to consider the overall application of the embedded system. Multi-level models with high abstraction are essential to efficiently evaluate the impact of physical defects on the system. This paper provides a methodology that leverages state-of-the-art techniques for efficient fault simulation of structural faults together with transaction-level modeling. This way it is possible to accurately evaluate the impact of the faults on the entire hardware/software system. A case study of a system consisting of hardware and software for image compression and data encryption is presented and the method is compared to a standard gate/RT mixed-level approac

Quantum Dot Cellular Automata Check Node Implementation for LDPC Decoders

The quantum dot Cellular Automata (QCA) is an emerging nanotechnology that has gained significant research interest in recent years. Extremely small feature sizes, ultralow power consumption, and high clock frequency make QCA a potentially attractive solution for implementing computing architectures at the nanoscale. To be considered as a suitable CMOS substitute, the QCA technology must be able to implement complex real-time applications with affordable complexity. Low density parity check (LDPC) decoding is one of such applications. The core of LDPC decoding lies in the check node (CN) processing element which executes actual decoding algorithm and contributes toward overall performance and complexity of the LDPC decoder. This study presents a novel QCA architecture for partial parallel, layered LDPC check node. The CN executes Normalized Min Sum decoding algorithm and is flexible to support CN degree dc up to 20. The CN is constructed using a VHDL behavioral model of QCA elementary circuits which provides a hierarchical bottom up approach to evaluate the logical behavior, area, and power dissipation of the whole design. Performance evaluations are reported for the two main implementations of QCA i.e. molecular and magneti

The Rolf of Test Chips in Coordinating Logic and Circuit Design and Layout Aids for VLSI

This paper emphasizes the need for multipurpose test chips and comprehensive procedures for use in supplying accurate input data to both logic and circuit simulators and chip layout aids. It is shown that the location of test structures within test chips is critical in obtaining representative data, because geometrical distortions introduced during the photomasking process can lead to significant intrachip parameter variations. In order to transfer test chip designs quickly, accurately, and economically, a commonly accepted portable chip layout notation and commonly accepted parametric tester language are needed. In order to measure test chips more accurately and more rapidly, parametric testers with improved architecture need to be developed in conjunction with innovative test structures with on-chip signal conditioning

Dynamic Voltage Scaling Aware Delay Fault Testing

The application of Dynamic Voltage Scaling (DVS) to reduce energy consumption may have a detrimental impact on the quality of manufacturing tests employed to detect permanent faults. This paper analyses the influence of different voltage/frequency settings on fault detection within a DVS application. In particular, the effect of supply voltage on different types of delay faults is considered. This paper presents a study of these problems with simulation results. We have demonstrated that the test application time increases as we reduce the test voltage. We have also shown that for newer technologies we do not have to go to very low voltage levels for delay fault testing. We conclude that it is necessary to test at more than one operating voltage and that the lowest operating voltage does not necessarily give the best fault cover

Oscillation-Based Test Structure and Method for OTA-C Filters

“This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder." “Copyright IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.”This paper describes a design for testability technique for operational transconductance amplifier and capacitor filters using an oscillation-based test topology. The oscillation-based test structure is a vectorless output test strategy easily extendable to built-in self-test. The proposed methodology converts filter under test into a quadrature oscillator using very simple techniques and measures the output frequency. The oscillation frequency may be considered as a digital signal and it can be evaluated using digital circuitry therefore the test time is very small. These characteristics imply that the proposed method is very suitable for catastrophic and parametric faults testing and also effective in detecting single and multiple faults. The validity of the proposed method has been verified using comparison between faulty and fault-free simulation results of two integrator loop and Tow-Thomas filters. Simulation results in 0.25 mum CMOS technology show that the proposed oscillation-based test strategy for OTA-C filters has 87% fault coverage and with a minimum number of extra components, requires a negligible area overhead