9,280 research outputs found

    Parameter Identification of Pressure Sensors by Static and Dynamic Measurements

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    Fast identification methods of pressure sensors are investigated. With regard to a complete accurate sensor parameter identification two different measurement methods are combined. The approach consists on one hand in performing static measurements - an applied pressure results in a membrane deformation measured interferometrically and the corresponding output voltage. On the other hand optical measurements of the modal responses of the sensor membranes are performed. This information is used in an inverse identification algorithm to identify geometrical and material parameters based on a FE model. The number of parameters to be identified is thereby generally limited only by the number of measurable modal frequencies. A quantitative evaluation of the identification results permits furthermore the classification of processing errors like etching errors. Algorithms and identification results for membrane thickness, intrinsic stress and output voltage will be discussed in this contribution on the basis of the parameter identification of relative pressure sensors.Comment: Submitted on behalf of EDA Publishing Association (http://irevues.inist.fr/EDA-Publishing

    Photoelastic Stress Analysis

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    Evidence of robust 2D transport and Efros-Shklovskii variable range hopping in disordered topological insulator (Bi2Se3) nanowires

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    We report the experimental observation of variable range hopping conduction in focused-ion-beam (FIB) fabricated ultra-narrow nanowires of topological insulator (Bi2Se3). The value of the exponent in the hopping equation was extracted as ~ 1/2 for different widths of nanowires, which is the proof of the presence of Efros-Shklovskii hopping transport mechanism in a strongly disordered system. High localization lengths (0.5nm, 20nm) were calculated for the devices. A careful analysis of the temperature dependent fluctuations present in the magnetoresistance curves, using the standard Universal Conductance Fluctuation theory, indicates the presence of 2D topological surface states. Also, the surface state contribution to the conductance was found very close to one conductance quantum. We believe that our experimental findings shed light on the understanding of quantum transport in disordered topological insulator based nanostructures.Comment: 14pages, 4 figure

    New technique to measure the cavity defects of Fabry-Perot interferometers

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    (Abridged): We define and test a new technique to accurately measure the cavity defects of air-spaced FPIs, including distortions due to the spectral tuning process typical of astronomical observations. We further develop a correction technique to maintain the shape of the cavity as constant as possible during the spectral scan. These are necessary steps to optimize the spectral transmission profile of a two-dimensional spectrograph using one or more FPIs. We devise a generalization of the techniques developed for the so-called phase-shifting interferometry to the case of FPIs. The technique is applicable to any FPI that can be tuned via changing the cavity spacing (zz-axis), and can be used for any etalon regardless of the coating' reflectivity. The major strength of our method is the ability to fully characterize the cavity during a spectral scan, allowing for the determination of scan-dependent modifications of the plates. As a test, we have applied this technique to three 50 mm diameter interferometers, with cavity gaps ranging between 600 micron and 3 mm, coated for use in the visible range. We obtain accurate and reliable measures of the cavity defects of air-spaced FPIs, and of their evolution during the entire spectral scan. Our main, and unexpected, result is that the relative tilt between the two FPI plates varies significantly during the spectral scan, and can dominate the cavity defects; in particular, we observe that the tilt component at the extremes of the scan is sensibly larger than at the center of the scan. Exploiting the capability of the electronic controllers to set the reference plane at any given spectral step, we develop a correction technique that allows the minimization of the tilt during a complete spectral scan. The correction remains highly stable over long periods, well beyond the typical duration of astronomical observations.Comment: 15 pages, 20+ figures, accepted for publication in A&A. Two additional movies are available in the online version of the pape
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