Noise shaping Asynchronous SAR ADC based time to digital converter

Time-to-digital converters (TDCs) are key elements for the digitization of timing information in modern mixed-signal circuits such as digital PLLs, DLLs, ADCs, and on-chip jitter-monitoring circuits. Especially, high-resolution TDCs are increasingly employed in on-chip timing tests, such as jitter and clock skew measurements, as advanced fabrication technologies allow fine on-chip time resolutions. Its main purpose is to quantize the time interval of a pulse signal or the time interval between the rising edges of two clock signals. Similarly to ADCs, the performance of TDCs are also primarily characterized by Resolution, Sampling Rate, FOM, SNDR, Dynamic Range and DNL/INL. This work proposes and demonstrates 2nd order noise shaping Asynchronous SAR ADC based TDC architecture with highest resolution of 0.25 ps among current state of art designs with respect to post-layout simulation results. This circuit is a combination of low power/High Resolution 2nd Order Noise Shaped Asynchronous SAR ADC backend with simple Time to Amplitude converter (TAC) front-end and is implemented in 40nm CMOS technology. Additionally, special emphasis is given on the discussion on various current state of art TDC architectures.Electrical and Computer Engineerin

A 6.0-mW 10.0-Gb/s Receiver With Switched-Capacitor Summation DFE

A low-power receiver with a one-tap decision feedback equalization (DFE) was fabricated in 90-nm CMOS technology. The speculative equalization is performed using switched-capacitor-based addition at the front-end sample-hold circuit. In order to further reduce the power consumption, an analog multiplexer is used in the speculation technique implementation. A quarter-rate-clocking scheme facilitates the use of low-power front-end circuitry and CMOS clock buffers. The receiver was tested over channels with different levels of ISI. The signaling rate with BER<10^-12 was significantly increased with the use of DFE for short- to medium-distance PCB traces. At 10-Gb/s data rate, the receiver consumes less than 6.0 mW from a 1.0-V supply. This includes the power consumed in all quarter-rate clock buffers, but not the power of a clock recovery loop. The input clock phase and the DFE taps are adjusted externally

Comparator Design in Sensors for Environmental Monitoring

This paper presents circuit design considerations of comparator in analog-to-digital converters (ADC) applied for a portable, low-cost and high performance nano-sensor chip which can be applied to detect the airborne magnetite pollution nano particulate matter (PM) for environmental monitoring. High-resolution ADC plays a vital important role in high perfor-mance nano-sensor, while high-resolution comparator is a key component in ADC. In this work, some important design issues related to comparators in analog-to-digital converters (ADCs) are discussed, simulation results show that the resolution of the comparator proposed can achieve 5µV , and it is appropriate for high-resolution application

Reconfigurable low power robust pipeline ADC for Biomedical applications

Demand for high-performance analog-to-digital converter (ADC) integrated circuits (ICs) with optimal combined specifications of resolution, sampling rate and power consumption becomes dominant due to emerging applications in wireless communications, broad band transceivers, digital-intermediate frequency (IF) receivers and countless of digital devices. This research is dedicated to develop a pipeline ADC design methodology with minimum power dissipation, while keeping relatively high speed and high resolution

Fast synchronization 3R burst-mode receivers for passive optical networks

This paper gives a tutorial overview on high speed burst-mode receiver (BM-RX) requirements, specific for time division multiplexing passive optical networks, and design issues of such BM-RXs as well as their advanced design techniques. It focuses on how to design BM-RXs with short burst overhead for fast synchronization. We present design principles and circuit architectures of various types of burst-mode transimpedance amplifiers, burst-mode limiting amplifiers and burst-mode clock and data recovery circuits. The recent development of 10 Gb/s BM-RXs is highlighted also including dual-rate operation for coexistence with deployed PONs and on-chip auto reset generation to eliminate external timing-critical control signals provided by a PON medium access control. Finally sub-system integration and state-of-the-art system performance for 10 Gb/s PONs are reviewed

A 10-Gb/s two-dimensional eye-opening monitor in 0.13-μm standard CMOS

An eye-opening monitor (EOM) architecture that can capture a two-dimensional (2-D) map of the eye diagram of a high-speed data signal has been developed. Two single-quadrant phase rotators and one digital-to-analog converter (DAC) are used to generate rectangular masks with variable sizes and aspect ratios. Each mask is overlapped with the received eye diagram and the number of signal transitions inside the mask is recorded as error. The combination of rectangular masks with the same error creates error contours that overall provide a 2-D map of the eye. The authors have implemented a prototype circuit in 0.13-μm standard CMOS technology that operates up to 12.5 Gb/s at 1.2-V supply. The EOM maps the input eye to a 2-D error diagram with up to 68-dB mask error dynamic range. The left and right halves of the eyes are monitored separately to capture horizontally asymmetric eyes. The chip consumes 330 mW and operates reliably with supply voltages as low as 1 V at 10 Gb/s. The authors also present a detailed analysis that verifies if the measurements are in good agreement with the expected results