On-Line Instruction-checking in Pipelined Microprocessors

Microprocessors performances have increased by more than five orders of magnitude in the last three decades. As technology scales down, these components become inherently unreliable posing major design and test challenges. This paper proposes an instruction-checking architecture to detect erroneous instruction executions caused by both permanent and transient errors in the internal logic of a microprocessor. Monitoring the correct activation sequence of a set of predefined microprocessor control/status signals allow distinguishing between correctly and not correctly executed instruction

Cross-layer system reliability assessment framework for hardware faults

System reliability estimation during early design phases facilitates informed decisions for the integration of effective protection mechanisms against different classes of hardware faults. When not all system abstraction layers (technology, circuit, microarchitecture, software) are factored in such an estimation model, the delivered reliability reports must be excessively pessimistic and thus lead to unacceptably expensive, over-designed systems. We propose a scalable, cross-layer methodology and supporting suite of tools for accurate but fast estimations of computing systems reliability. The backbone of the methodology is a component-based Bayesian model, which effectively calculates system reliability based on the masking probabilities of individual hardware and software components considering their complex interactions. Our detailed experimental evaluation for different technologies, microarchitectures, and benchmarks demonstrates that the proposed model delivers very accurate reliability estimations (FIT rates) compared to statistically significant but slow fault injection campaigns at the microarchitecture level.Peer ReviewedPostprint (author's final draft

Reusing Logic Masking to Facilitate Hardware Trojan Detection

Hardware Trojan (HT) and Integrated Circuit (IC)/ Intellectual Property (IP) piracy are important threats which may happen in untrusted fabrication foundries. Modifying structurally the ICs/IPs design to counter the HT threats has been proposed, and it is known as Design-For-Hardware-Trust (DFHT). DFHT methods are used in order to facilitate HT detection methods. In addition, logic masking methods modify the IPs/ICs design to harden them against the IP/IC piracy. These methods modify a circuit such that it does not work correctly without applying the correct key. In this paper, we propose DFHT methods leveraging logic masking approach

A survey of the state of the art and focused research in range systems, task 2

Many communication, control, and information processing subsystems are modeled by linear systems incorporating tapped delay lines (TDL). Such optimized subsystems result in full precision multiplications in the TDL. In order to reduce complexity and cost in a microprocessor implementation, these multiplications can be replaced by single-shift instructions which are equivalent to powers of two multiplications. Since, in general, the obvious operation of rounding the infinite precision TDL coefficients to the nearest powers of two usually yield quite poor system performance, the optimum powers of two coefficient solution was considered. Detailed explanations on the use of branch-and-bound algorithms for finding the optimum powers of two solutions are given. Specific demonstration of this methodology to the design of a linear data equalizer and its implementation in assembly language on a 8080 microprocessor with a 12 bit A/D converter are reported. This simple microprocessor implementation with optimized TDL coefficients achieves a system performance comparable to the optimum linear equalization with full precision multiplications for an input data rate of 300 baud. The philosophy demonstrated in this implementation is dully applicable to many other microprocessor controlled information processing systems

From FPGA to ASIC: A RISC-V processor experience

This work document a correct design flow using these tools in the Lagarto RISC- V Processor and the RTL design considerations that must be taken into account, to move from a design for FPGA to design for ASIC

Software-Based Self-Test of Set-Associative Cache Memories

Embedded microprocessor cache memories suffer from limited observability and controllability creating problems during in-system tests. This paper presents a procedure to transform traditional march tests into software-based self-test programs for set-associative cache memories with LRU replacement. Among all the different cache blocks in a microprocessor, testing instruction caches represents a major challenge due to limitations in two areas: 1) test patterns which must be composed of valid instruction opcodes and 2) test result observability: the results can only be observed through the results of executed instructions. For these reasons, the proposed methodology will concentrate on the implementation of test programs for instruction caches. The main contribution of this work lies in the possibility of applying state-of-the-art memory test algorithms to embedded cache memories without introducing any hardware or performance overheads and guaranteeing the detection of typical faults arising in nanometer CMOS technologie