9 research outputs found

    Temperature rise measurement for power-loss comparison of an aluminum electrolytic capacitor between sinusoidal and square-wave current injections

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    DC-link capacitors are a major factor of degrading reliability of power electric converters because they usually have a shorter lifetime and higher failure rate than those of semiconductor devices or magnetic devices. Characteristics of the capacitors are usually evaluated by a single sinusoidal current waveform. However, actual current flowing out of the converter into the capacitor is a modulated square current waveform. This paper provides experimental comparison of the power loss dissipated in an aluminum electrolytic capacitor between sinusoidal and square-wave current injections. Power loss is estimated by temperature rise of the capacitor. Experimental results confirm that power losses of the square-wave current injection were always lower than those of the sinusoidal current injection by 10–20%. Moreover, the power losses of the square-wave current injection can be estimated by a synthesis of fundamental and harmonic currents based on the Fourier series expansion, which brings a high accuracy less than 1% when more than fifth harmonic current is introduced. This comparison will be useful for estimating power loss and life time of electrolytic capacitors

    DC-bias-voltage dependence of degradation of aluminum electrolytic capacitors

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    Attention has been paid to reliability-related issues for dc-link capacitors such as monitoring methods, powerloss estimation, and ageing tests. The degradation of the capacitors depends on their operating condition including temperature, ripple current, and dc-bias voltage, which has a strong influence on failures as well. In design stages of power converters, it is desirable to know the relation between the degradation and electrolytic parameters. This paper makes an intensive discussion on the voltage dependence of the degradation of a small aluminum electrolytic capacitor with an ageing test and a leakage-current measurement. The ageing test reveals that a higher dc-bias voltage brings a faster increase in ESR but results in a slower drop in capacitance in a range within the rated voltage. This result implies that either capacitance or ESR cannot be a unique indicator of the lifetime. Attention should be paid both to the ESR and to the capacitance when one monitors the capacitor condition. On the other hand, more than the rated voltage leads a rapid degradation of the capacitor, which can be confirmed by a leakage-current measurement instead of the ageing test

    ESR and capacitance monitoring of a dc-link capacitor used in a three-phase PWM inverter with a front-end diode rectifier

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    Condition monitoring plays an important role in estimating health condition of capacitors because the ageing of the capacitors is usually accompanied by an increase in equivalent series resistance (ESR) and a decrease in capacitance. Either capacitance or ESR cannot be a unique indicator of the lifetime of capacitors in some cases. This paper presents a condition monitoring method of a dc-link capacitor used in a three-phase PWM inverter with a front-end diode rectifier intended for motor drives. The monitoring method extracts both the ESR and capacitance of a capacitor under test from the actual ripple current and voltage without disconnecting the capacitor nor injecting an additional current. The monitoring method, therefore, can be implemented online. Experimental results verify that the monitoring method independently obtains the ESR and capacitance changes of the capacitor under test. This contributes to accurate lifetime estimation of dc-link capacitors

    Power Cycling Test Methods for Reliability Assessment of Power Device Modules in Respect to Temperature Stress

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    Power Electronics Reliability: State of the Art and Outlook

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    Condition Monitoring of Capacitors for DC-link Application in Power Electronic Converters

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    STUDIES ON IGBT MODULE TO IMPROVE THE RELIABILITY OF POWER ELECTRONIC SYSTEMS

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