Deep learning for paint loss detection with a multiscale, translation invariant network

We explore the potential of deep learning in digital painting analysis to facilitate condition reporting and to support restoration treatments. We address the problem of paint loss detection and develop a multiscale deep learning system with dilated convolutions that enables a large receptive field with limited training parameters to avoid overtraining. Our model handles efficiently multimodal data that are typically acquired in art investigation. As a case study we use multimodal data of the Ghent Altarpiece. Our results indicate huge potential of the proposed approach in terms of accuracy and also its fast execution, which allows interactivity and continuous learning

WSSL: Weighted Self-supervised Learning Framework For Image-inpainting

Image inpainting is the process of regenerating lost parts of the image. Supervised algorithm-based methods have shown excellent results but have two significant drawbacks. They do not perform well when tested with unseen data. They fail to capture the global context of the image, resulting in a visually unappealing result. We propose a novel self-supervised learning framework for image-inpainting: Weighted Self-Supervised Learning (WSSL) to tackle these problems. We designed WSSL to learn features from multiple weighted pretext tasks. These features are then utilized for the downstream task, image-inpainting. To improve the performance of our framework and produce more visually appealing images, we also present a novel loss function for image inpainting. The loss function takes advantage of both reconstruction loss and perceptual loss functions to regenerate the image. Our experimentation shows WSSL outperforms previous methods, and our loss function helps produce better results.Comment: 9 Pages, document submitted for publication at CGVCVIP 202

Context-aware patch-based image inpainting using Markov random field modeling

In this paper, we first introduce a general approach for context-aware patch-based image inpainting, where textural descriptors are used to guide and accelerate the search for well-matching (candidate) patches. A novel top-down splitting procedure divides the image into variable size blocks according to their context, constraining thereby the search for candidate patches to non-local image regions with matching context. This approach can be employed to improve the speed and performance of virtually any (patch-based) inpainting method. We apply this approach to the so-called global image inpainting with the Markov random field (MRF) prior, where MRF encodes a priori knowledge about consistency of neighbouring image patches. We solve the resulting optimization problem with an efficient low-complexity inference method. Experimental results demonstrate the potential of the proposed approach in inpainting applications like scratch, text and object removal. Improvement and significant acceleration of a related global MRF-based inpainting method is also eviden

3D exemplar-based image inpainting in electron microscopy

In electron microscopy (EM) a common problem is the non-availability of data, which causes artefacts in reconstructions. In this thesis the goal is to generate artificial data where missing in EM by using exemplar-based inpainting (EBI). We implement an accelerated 3D version tailored to applications in EM, which reduces reconstruction times from days to minutes. We develop intelligent sampling strategies to find optimal data as input for reconstruction methods. Further, we investigate approaches to reduce electron dose and acquisition time. Sparse sampling followed by inpainting is the most promising approach. As common evaluation measures may lead to misinterpretation of results in EM and falsify a subsequent analysis, we propose to use application driven metrics and demonstrate this in a segmentation task. A further application of our technique is the artificial generation of projections in tiltbased EM. EBI is used to generate missing projections, such that the full angular range is covered. Subsequent reconstructions are significantly enhanced in terms of resolution, which facilitates further analysis of samples. In conclusion, EBI proves promising when used as an additional data generation step to tackle the non-availability of data in EM, which is evaluated in selected applications. Enhancing adaptive sampling methods and refining EBI, especially considering the mutual influence, promotes higher throughput in EM using less electron dose while not lessening quality.Ein häufig vorkommendes Problem in der Elektronenmikroskopie (EM) ist die Nichtverfügbarkeit von Daten, was zu Artefakten in Rekonstruktionen führt. In dieser Arbeit ist es das Ziel fehlende Daten in der EM künstlich zu erzeugen, was durch Exemplar-basiertes Inpainting (EBI) realisiert wird. Wir implementieren eine auf EM zugeschnittene beschleunigte 3D Version, welche es ermöglicht, Rekonstruktionszeiten von Tagen auf Minuten zu reduzieren. Wir entwickeln intelligente Abtaststrategien, um optimale Datenpunkte für die Rekonstruktion zu erhalten. Ansätze zur Reduzierung von Elektronendosis und Aufnahmezeit werden untersucht. Unterabtastung gefolgt von Inpainting führt zu den besten Resultaten. Evaluationsmaße zur Beurteilung der Rekonstruktionsqualität helfen in der EM oft nicht und können zu falschen Schlüssen führen, weswegen anwendungsbasierte Metriken die bessere Wahl darstellen. Dies demonstrieren wir anhand eines Beispiels. Die künstliche Erzeugung von Projektionen in der neigungsbasierten Elektronentomographie ist eine weitere Anwendung. EBI wird verwendet um fehlende Projektionen zu generieren. Daraus resultierende Rekonstruktionen weisen eine deutlich erhöhte Auflösung auf. EBI ist ein vielversprechender Ansatz, um nicht verfügbare Daten in der EM zu generieren. Dies wird auf Basis verschiedener Anwendungen gezeigt und evaluiert. Adaptive Aufnahmestrategien und EBI können also zu einem höheren Durchsatz in der EM führen, ohne die Bildqualität merklich zu verschlechtern