Submicron Systems Architecture Project : Semiannual Technical Report

The Mosaic C is an experimental fine-grain multicomputer based on single-chip nodes. The Mosaic C chip includes 64KB of fast dynamic RAM, processor, packet interface, ROM for bootstrap and self-test, and a two-dimensional selftimed router. The chip architecture provides low-overhead and low-latency handling of message packets, and high memory and network bandwidth. Sixty-four Mosaic chips are packaged by tape-automated bonding (TAB) in an 8 x 8 array on circuit boards that can, in turn, be arrayed in two dimensions to build arbitrarily large machines. These 8 x 8 boards are now in prototype production under a subcontract with Hewlett-Packard. We are planning to construct a 16K-node Mosaic C system from 256 of these boards. The suite of Mosaic C hardware also includes host-interface boards and high-speed communication cables. The hardware developments and activities of the past eight months are described in section 2.1. The programming system that we are developing for the Mosaic C is based on the same message-passing, reactive-process, computational model that we have used with earlier multicomputers, but the model is implemented for the Mosaic in a way that supports finegrain concurrency. A process executes only in response to receiving a message, and may in execution send messages, create new processes, and modify its persistent variables before it either exits or becomes dormant in preparation for receiving another message. These computations are expressed in an object-oriented programming notation, a derivative of C++ called C+-. The computational model and the C+- programming notation are described in section 2.2. The Mosaic C runtime system, which is written in C+-, provides automatic process placement and highly distributed management of system resources. The Mosaic C runtime system is described in section 2.3

Desynchronization: Synthesis of asynchronous circuits from synchronous specifications

Asynchronous implementation techniques, which measure logic delays at run time and activate registers accordingly, are inherently more robust than their synchronous counterparts, which estimate worst-case delays at design time, and constrain the clock cycle accordingly. De-synchronization is a new paradigm to automate the design of asynchronous circuits from synchronous specifications, thus permitting widespread adoption of asynchronicity, without requiring special design skills or tools. In this paper, we first of all study different protocols for de-synchronization and formally prove their correctness, using techniques originally developed for distributed deployment of synchronous language specifications. We also provide a taxonomy of existing protocols for asynchronous latch controllers, covering in particular the four-phase handshake protocols devised in the literature for micro-pipelines. We then propose a new controller which exhibits provably maximal concurrency, and analyze the performance of desynchronized circuits with respect to the original synchronous optimized implementation. We finally prove the feasibility and effectiveness of our approach, by showing its application to a set of real designs, including a complete implementation of the DLX microprocessor architectur

Distribution-graph based approach and extended tree growing technique in power-constrained block-test scheduling

A distribution-graph based scheduling algorithm is proposed together with an extended tree growing technique to deal with the problem of unequal-length block-test scheduling under power dissipation constraints. The extended tree growing technique is used in combination with the classical scheduling approach in order to improve the test concurrency having assigned power dissipation limits. Its goal is to achieve a balanced test power dissipation by employing a least mean square error function. The least mean square error function is a distribution-graph based global priority function. Test scheduling examples and experiments highlight in the end the efficiency of this approach towards a system-level test scheduling algorithm

Submicron Systems Architecture: Semiannual Technical Report

No abstract available

Concepts for on-board satellite image registration. Volume 3: Impact of VLSI/VHSIC on satellite on-board signal processing

Anticipated major advances in integrated circuit technology in the near future are described as well as their impact on satellite onboard signal processing systems. Dramatic improvements in chip density, speed, power consumption, and system reliability are expected from very large scale integration. Improvements are expected from very large scale integration enable more intelligence to be placed on remote sensing platforms in space, meeting the goals of NASA's information adaptive system concept, a major component of the NASA End-to-End Data System program. A forecast of VLSI technological advances is presented, including a description of the Defense Department's very high speed integrated circuit program, a seven-year research and development effort

Fault-tolerant sub-lithographic design with rollback recovery

Shrinking feature sizes and energy levels coupled with high clock rates and decreasing node capacitance lead us into a regime where transient errors in logic cannot be ignored. Consequently, several recent studies have focused on feed-forward spatial redundancy techniques to combat these high transient fault rates. To complement these studies, we analyze fine-grained rollback techniques and show that they can offer lower spatial redundancy factors with no significant impact on system performance for fault rates up to one fault per device per ten million cycles of operation (Pf = 10^-7) in systems with 10^12 susceptible devices. Further, we concretely demonstrate these claims on nanowire-based programmable logic arrays. Despite expensive rollback buffers and general-purpose, conservative analysis, we show the area overhead factor of our technique is roughly an order of magnitude lower than a gate level feed-forward redundancy scheme

Submicron Systems Architecture Project: Semiannual Technical Report

No abstract available

Submicron Systems Architecture Project: Semiannual Technial Report

No abstract available

UA2TPG: An untestability analyzer and test pattern generator for SEUs in the configuration memory of SRAM-based FPGAs

This paper presents UA2TPG, a static analysis tool for the untestability proof and automatic test pattern generation for SEUs in the configuration memory of SRAM-based FPGA systems. The tool is based on the model-checking verification technique. An accurate fault model for both logic components and routing structures is adopted. Experimental results show that many circuits have a significant number of untestable faults, and their detection enables more efficient test pattern generation and on-line testing. The tool is mainly intended to support on-line testing of critical components in FPGA fault-tolerant systems