14,692 research outputs found

    Generalized Completed Local Binary Patterns for Time-Efficient Steel Surface Defect Classification

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    © 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted ncomponent of this work in other works.Efficient defect classification is one of the most important preconditions to achieve online quality inspection for hot-rolled strip steels. It is extremely challenging owing to various defect appearances, large intraclass variation, ambiguous interclass distance, and unstable gray values. In this paper, a generalized completed local binary patterns (GCLBP) framework is proposed. Two variants of improved completed local binary patterns (ICLBP) and improved completed noise-invariant local-structure patterns (ICNLP) under the GCLBP framework are developed for steel surface defect classification. Different from conventional local binary patterns variants, descriptive information hidden in nonuniform patterns is innovatively excavated for the better defect representation. This paper focuses on the following aspects. First, a lightweight searching algorithm is established for exploiting the dominant nonuniform patterns (DNUPs). Second, a hybrid pattern code mapping mechanism is proposed to encode all the uniform patterns and DNUPs. Third, feature extraction is carried out under the GCLBP framework. Finally, histogram matching is efficiently accomplished by simple nearest-neighbor classifier. The classification accuracy and time efficiency are verified on a widely recognized texture database (Outex) and a real-world steel surface defect database [Northeastern University (NEU)]. The experimental results promise that the proposed method can be widely applied in online automatic optical inspection instruments for hot-rolled strip steel.Peer reviewe

    Surface Defect Classification for Hot-Rolled Steel Strips by Selectively Dominant Local Binary Patterns

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    Developments in defect descriptors and computer vision-based algorithms for automatic optical inspection (AOI) allows for further development in image-based measurements. Defect classification is a vital part of an optical-imaging-based surface quality measuring instrument. The high-speed production rhythm of hot continuous rolling requires an ultra-rapid response to every component as well as algorithms in AOI instrument. In this paper, a simple, fast, yet robust texture descriptor, namely selectively dominant local binary patterns (SDLBPs), is proposed for defect classification. First, an intelligent searching algorithm with a quantitative thresholding mechanism is built to excavate the dominant non-uniform patterns (DNUPs). Second, two convertible schemes of pattern code mapping are developed for binary encoding of all uniform patterns and DNUPs. Third, feature extraction is carried out under SDLBP framework. Finally, an adaptive region weighting method is built for further strengthening the original nearest neighbor classifier in the feature matching stage. The extensive experiments carried out on an open texture database (Outex) and an actual surface defect database (Dragon) indicates that our proposed SDLBP yields promising performance on both classification accuracy and time efficiencyPeer reviewe

    A Hybrid Deep Learning Approach for Texture Analysis

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    Texture classification is a problem that has various applications such as remote sensing and forest species recognition. Solutions tend to be custom fit to the dataset used but fails to generalize. The Convolutional Neural Network (CNN) in combination with Support Vector Machine (SVM) form a robust selection between powerful invariant feature extractor and accurate classifier. The fusion of experts provides stability in classification rates among different datasets

    Supervised learning with hybrid global optimisation methods

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    Binary Patterns Encoded Convolutional Neural Networks for Texture Recognition and Remote Sensing Scene Classification

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    Designing discriminative powerful texture features robust to realistic imaging conditions is a challenging computer vision problem with many applications, including material recognition and analysis of satellite or aerial imagery. In the past, most texture description approaches were based on dense orderless statistical distribution of local features. However, most recent approaches to texture recognition and remote sensing scene classification are based on Convolutional Neural Networks (CNNs). The d facto practice when learning these CNN models is to use RGB patches as input with training performed on large amounts of labeled data (ImageNet). In this paper, we show that Binary Patterns encoded CNN models, codenamed TEX-Nets, trained using mapped coded images with explicit texture information provide complementary information to the standard RGB deep models. Additionally, two deep architectures, namely early and late fusion, are investigated to combine the texture and color information. To the best of our knowledge, we are the first to investigate Binary Patterns encoded CNNs and different deep network fusion architectures for texture recognition and remote sensing scene classification. We perform comprehensive experiments on four texture recognition datasets and four remote sensing scene classification benchmarks: UC-Merced with 21 scene categories, WHU-RS19 with 19 scene classes, RSSCN7 with 7 categories and the recently introduced large scale aerial image dataset (AID) with 30 aerial scene types. We demonstrate that TEX-Nets provide complementary information to standard RGB deep model of the same network architecture. Our late fusion TEX-Net architecture always improves the overall performance compared to the standard RGB network on both recognition problems. Our final combination outperforms the state-of-the-art without employing fine-tuning or ensemble of RGB network architectures.Comment: To appear in ISPRS Journal of Photogrammetry and Remote Sensin
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