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3 research outputs found
Characterization and analysis of electrical trap related effects on the reliability of AlInN/GaN HEMTs
Author
Berthet F.
Boudart B.
+5Â more
Gaquiere C.
Guhel Y.
Mary P.
Petitdidier S.
Trolet J.L.
Publication venue
'Elsevier BV'
Publication date
01/01/2015
Field of study
No full text
International audienc
HAL - Normandie Université
‘Characterization and analysis of electrical trap related effects on the reliability of AlInN/GaN HEMTs’
Author
Berthet F.
Boudart B.
+5Â more
Gaquiere C.
Guhel Y.
Mary P.
Petitdidier S.
Trolet J.L.
Publication venue
'Elsevier BV'
Publication date
01/01/2015
Field of study
No full text
International audienc
HAL - Normandie Université
Characterization and analysis of electrical trap related effects on the reliability of AlInN/GaN HEMTs
Author
B. Boudart
Berthet
+13Â more
C. Gaquière
Chikhaoui
F. Berthet
J.L. Trolet
Kuzmik
Kuzmik
Meneghesso
P. Mary
S. Petitdidier
Sarazin
Tapajna
Wang
Y. Guhel
Publication venue
'Elsevier BV'
Publication date
Field of study
No full text
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