Testing a Quantum Computer

The problem of quantum test is formally addressed. The presented method attempts the quantum role of classical test generation and test set reduction methods known from standard binary and analog circuits. QuFault, the authors software package generates test plans for arbitrary quantum circuits using the very efficient simulator QuIDDPro[1]. The quantum fault table is introduced and mathematically formalized, and the test generation method explained.Comment: 15 pages, 17 equations, 27 tables, 8 figure

Design and Development of Genetic Circuit Optimizer

Analog designers are interested in using optimization tools which may automate the process of transistor sizing. Genetic Algorithm (GA) uses the length and width variables of MOSFET to optimize the size of transistors in Matlab environment. The interface of few MOSFET parameters from circuit simulator PSpice to GA in Matlab was designed and demonstrated by a simple circuit

Zero DC offset active RC filter designs.

A class of RC active filters in which the DC offset of the operational amplifier (op-amp) is completely absent from the filter output [1]. Individual filter configurations (Low Pass, High Pass, Band Pass, Band Stop, All Pass) are discussed and corresponding transfer functions are defined. The effects of op-amp gain bandwidth product on filter responses are accounted for and presented in a table. In order to understand the upper limit of dynamic responses, maximum signal magnitude and corresponding frequency of maximum magnitude are calculated. The effects of noise generating components are defined and included, thus establishing the lower limit of dynamic responses for all filter configurations. Step-by-step design procedures are given for most common filter configurations. Sample filters are designed based on chosen values for critical frequency ù 0 and filter quality factor Q. Filter schematics are captured and their frequency responses are simulated using circuit simulation software. Sample filters are built and their frequency responses are confirmed using a network analyzer. Extension to higher order filters is discussed and demonstrated

Dispersive Fourier Transformation for Versatile Microwave Photonics Applications

Abstract: Dispersive Fourier transformation (DFT) maps the broadband spectrum of an ultrashort optical pulse into a time stretched waveform with its intensity profile mirroring the spectrum using chromatic dispersion. Owing to its capability of continuous pulse-by-pulse spectroscopic measurement and manipulation, DFT has become an emerging technique for ultrafast signal generation and processing, and high-throughput real-time measurements, where the speed of traditional optical instruments falls short. In this paper, the principle and implementation methods of DFT are first introduced and the recent development in employing DFT technique for widespread microwave photonics applications are presented, with emphasis on real-time spectroscopy, microwave arbitrary waveform generation, and microwave spectrum sensing. Finally, possible future research directions for DFT-based microwave photonics techniques are discussed as well

Testing a Quantum Computer

We address the problem of quantum test set generation using measurement from a single basis and the single fault model. Experimental physicists currently test quantum circuits exhaustively, meaning that each n-bit permutative circuit requires ζ x 2n tests to assure functionality, and for an m stage permutative circuit proven not to function properly the current method requires ζ x 2n x m tests as the upper bound for fault localization, where zeta varies with physical implementation. Indeed, the exhaustive methods complexity grows exponentially with the number of qubits, proportionally to the number of stages in a quantum circuit and directly with zeta. This testability bound grows still exponentially with the attempted verification of quantum effects, such as the emission of a quantum source. The exhaustive method will soon not be feasible for practical application provided the number of qubits increases even a small number from the current state of the art. An algorithm is presented making fault detection feasible both now and in the foreseeable future for quantum circuits. The presented method attempts the quantum role of classical test generation and test set reduction methods known from standard binary and analog circuits. The quantum fault table is introduced, and the test generation method explained, we show that all faults can be detected that impact calculations from the computational basis. It is believed that this fundamental research will lead to the simplification of testing for commercial quantum computers

A 3-D LUT Design for Transient Error Detection Via Inter-Tier In-Silicon Radiation Sensor

Three-dimensional Integrated Circuits (3-D ICs) have gained much attention as a promising approach to increase IC performance due to their several advantages in terms of integration density, power dissipation, and achievable clock frequencies. However, achieving a 3-D ICs resilient to soft errors resulting from radiation effects is a challenging problem. Traditional Radiation-Hardened-by-Design (RHBD) techniques are costly in terms of area, power, and performance overheads. In this work, we propose a new 3-D LUT design integrating error detection capabilities. The LUT has been designed on a two tiers IC model improving radiation resiliency by selective upsizing of sensitive transistors. Besides, an in-silicon radiation sensor adopting inverters chain has been implemented within the free volume of the 3-D structure. The proposed design shows a 37% reduction in sensitivity to SETs and an effective error detection rate of 83% without introducing any area overhead