A Self-Calibrating Eddy-Current Instrument

The calibration of eddy-current measurement systems is a long-standing problem in nondestructive evaluation. Calibration serves a number of purposes: for equipment setup and validation, for equalizing responses from different probes and instruments, for setting detection thresholds, and for quantitative flaw sizing. The most commonly used calibration method is to scan the probe to be calibrated over simulated defects such as electrical-discharge machined (EDM) slots, saw cuts, or laboratory-produced fatigue cracks. This method has the virtue of calibrating probe and instrument at the same time on the same material as that to be inspected. But it has a number of disadvantages as well. First, a large number of artifact standards must be generated, certified, and maintained in the typical inspection organization; this can result in considerable expense. Second, the signals from EDM slots and saw cuts are not equivalent to the signals from actual defects, as discussed in another paper in these proceedings [1]. Third, quantitative flaw sizing can only be accomplished over a limited range with such calibration methodology, and the accuracy of sizing flaws with this method is brought into question by the aforementioned inequality of slots and cracks. Even if laboratory-produced cracks were to be used routinely for calibration (a prohibitively expensive option), quantitative sizing could be compromised by the occurrence of crack closure effects [2]

Bridges Structural Health Monitoring and Deterioration Detection Synthesis of Knowledge and Technology

INE/AUTC 10.0

Cumulative Index to NASA Tech Briefs, 1963 - 1966

Cumulative index of NASA Tech Briefs dealing with electrical and electronic, physical science and energy sources, materials and chemistry, life science, and mechanical innovation

Index to NASA Tech Briefs, 1975

This index contains abstracts and four indexes--subject, personal author, originating Center, and Tech Brief number--for 1975 Tech Briefs

Electrical and electronic devices and components: A compilation

Components and techniques which may be useful in the electronics industry are described. Topics discussed include transducer technology, printed-circuit technology, solid state devices, MOS transistors, Gunn device, microwave antennas, and position indicators

Magnetic sensors and gradiometers for detection of objects

Disertační práce popisuje vývoj nových detekčních zařízení s anizotropními magnetorezistoryThis thesis describes development of innovative sensor systems based on anisotropi

Eddy current testing - Classroom training handbook

Eddy current principles, equipment, methods, and applications in nondestructive testing reviewed in classroom training textboo

Technology applications

A summary of NASA Technology Utilization programs for the period of 1 December 1971 through 31 May 1972 is presented. An abbreviated description of the overall Technology Utilization Applications Program is provided as a background for the specific applications examples. Subjects discussed are in the broad headings of: (1) cancer, (2) cardiovascular disease, (2) medical instrumentation, (4) urinary system disorders, (5) rehabilitation medicine, (6) air and water pollution, (7) housing and urban construction, (8) fire safety, (9) law enforcement and criminalistics, (10) transportation, and (11) mine safety