Spectrum-Based Fault Localization in Model Transformations

Model transformations play a cornerstone role in Model-Driven Engineering (MDE), as they provide the essential mechanisms for manipulating and transforming models. The correctness of software built using MDE techniques greatly relies on the correctness of model transformations. However, it is challenging and error prone to debug them, and the situation gets more critical as the size and complexity of model transformations grow, where manual debugging is no longer possible. Spectrum-Based Fault Localization (SBFL) uses the results of test cases and their corresponding code coverage information to estimate the likelihood of each program component (e.g., statements) of being faulty. In this article we present an approach to apply SBFL for locating the faulty rules in model transformations. We evaluate the feasibility and accuracy of the approach by comparing the effectiveness of 18 different stateof- the-art SBFL techniques at locating faults in model transformations. Evaluation results revealed that the best techniques, namely Kulcynski2, Mountford, Ochiai, and Zoltar, lead the debugger to inspect a maximum of three rules to locate the bug in around 74% of the cases. Furthermore, we compare our approach with a static approach for fault localization in model transformations, observing a clear superiority of the proposed SBFL-based method.Comisión Interministerial de Ciencia y Tecnología TIN2015-70560-RJunta de Andalucía P12-TIC-186

Mitigating the effect of coincidental correctness in spectrum based fault localization

2013 Summer.Includes bibliographical references.Coincidentally correct test cases are those that execute faulty program statements but do not result in failures. The presence of such test cases in a test suite reduces the effectiveness of spectrum-based fault localization approaches, such as Ochiai and Tarantula, which localize faulty statements by calculating a suspiciousness score for every program statement from test coverage information. The goal of this dissertation is to improve the understanding of how the presence of coincidentally correct test cases impacts the effectiveness of spectrum-based fault localization approaches and to develop a family of approaches that improve fault localization effectiveness by mitigating the effect of coincidentally correct test cases. Each approach (1)~classifies coincidentally correct test cases using test coverage information, and (2)~recalculates a suspiciousness score for every program statement using the classification information. We developed classification approaches using test coverage metrics at different levels of granularity, such as statement, branch, and function. We developed a new approach for ranking program statements using suspiciousness scores calculated based on the heuristic that the statements covered by more failing and coincidentally correct test cases are more suspicious. We extended the family of fault localization approaches to support multiple faults. We developed an approach to incorporate tester feedback to mitigate the effect of coincidental correctness. The approach analyzes tester feedback to determine a lower bound for the number of coincidentally correct test cases present in a test suite. The lower bound is also used to determine when classification of coincidentally correct test cases can improve fault localization effectiveness. We evaluated the fault localization effectiveness of our approaches and studied how the effectiveness changes for varying characteristics of test suites, such as size, test suite type (e.g., random, coverage adequate), and the percentage of passing test cases that are coincidentally correct. Our key findings are summarized as follows. Mitigating the effect of coincidentally correct test cases improved fault localization effectiveness. The extent of the improvement increased with an increase in the percentage of passing test cases that were coincidentally correct, although no improvement was observed when most passing test cases in a test suite were coincidentally correct. When random test suites were used to localize faults, a coarse-grained coverage spectrum, such as function coverage, resulted in better classification than fine-grained coverage spectra, such as statement and branch coverage. Utilizing tester feedback improved the precision of classification. Mitigating the effect of coincidental correctness in the presence of two faults improved the effectiveness for both faults simultaneously for most faulty programs. Faulty statements that were harder to reach and that affected fewer program statements resulted in fewer coincidentally correct test cases and were more effectively localized

Amortising the Cost of Mutation Based Fault Localisation using Statistical Inference

Mutation analysis can effectively capture the dependency between source code and test results. This has been exploited by Mutation Based Fault Localisation (MBFL) techniques. However, MBFL techniques suffer from the need to expend the high cost of mutation analysis after the observation of failures, which may present a challenge for its practical adoption. We introduce SIMFL (Statistical Inference for Mutation-based Fault Localisation), an MBFL technique that allows users to perform the mutation analysis in advance against an earlier version of the system. SIMFL uses mutants as artificial faults and aims to learn the failure patterns among test cases against different locations of mutations. Once a failure is observed, SIMFL requires either almost no or very small additional cost for analysis, depending on the used inference model. An empirical evaluation of SIMFL using 355 faults in Defects4J shows that SIMFL can successfully localise up to 103 faults at the top, and 152 faults within the top five, on par with state-of-the-art alternatives. The cost of mutation analysis can be further reduced by mutation sampling: SIMFL retains over 80% of its localisation accuracy at the top rank when using only 10% of generated mutants, compared to results obtained without sampling