On Timing Model Extraction and Hierarchical Statistical Timing Analysis

In this paper, we investigate the challenges to apply Statistical Static Timing Analysis (SSTA) in hierarchical design flow, where modules supplied by IP vendors are used to hide design details for IP protection and to reduce the complexity of design and verification. For the three basic circuit types, combinational, flip-flop-based and latch-controlled, we propose methods to extract timing models which contain interfacing as well as compressed internal constraints. Using these compact timing models the runtime of full-chip timing analysis can be reduced, while circuit details from IP vendors are not exposed. We also propose a method to reconstruct the correlation between modules during full-chip timing analysis. This correlation can not be incorporated into timing models because it depends on the layout of the corresponding modules in the chip. In addition, we investigate how to apply the extracted timing models with the reconstructed correlation to evaluate the performance of the complete design. Experiments demonstrate that using the extracted timing models and reconstructed correlation full-chip timing analysis can be several times faster than applying the flattened circuit directly, while the accuracy of statistical timing analysis is still well maintained

Evolving more efficient digital circuits by allowing circuit layout evolution and multi-objective fitness

We use evolutionary search to design combinational logic circuits. The technique is based on evolving the functionality and connectivity of a rectangular array of logic cells whose dimension is defined by the circuit layout. The main idea of this approach is to improve quality of the circuits evolved by the GA by reducing the number of active gates used. We accomplish this by combining two ideas: 1) using multi-objective fitness function; 2) evolving circuit layout. It will be shown that using these two approaches allows us to increase the quality of evolved circuits. The circuits are evolved in two phases. Initially the genome fitness in given by the percentage of output bits that are correct. Once 100% functional circuits have been evolved, the number of gates actually used in the circuit is taken into account in the fitness function. This allows us to evolve circuits with 100% functionality and minimise the number of active gates in circuit structure. The population is initialised with heterogeneous circuit layouts and the circuit layout is allowed to vary during the evolutionary process. Evolving the circuit layout together with the function is one of the distinctive features of proposed approach. The experimental results show that allowing the circuit layout to be flexible is useful when we want to evolve circuits with the smallest number of gates used. We find that it is better to use a fixed circuit layout when the objective is to achieve the highest number of 100% functional circuits. The two-fitness strategy is most effective when we allow a large number of generations

Circuit layout evolution: An evolvable hardware approach

The evolvable hardware technique is based on evolving the functionality and connectivity of a rectangular array of logic cells in addition to the layout of this may. The evolutionary process contains two main steps. Initially the genome fitness in given by the percentage of output bits, which are correct. Once 100% functional circuits have been evolved, the number of gates actually used in the circuit is taken into account in the fitness function. This allows us to evolve circuit with 100% functionality and minimise the number of active gates in circuit structure. We perform a number of experiments to investigate the behaviour of the second fitness function and the circuit layout during evolution. We find that the gate usage is linearly related to the total number of gates in the chromosome

OPTIMIZING LARGE COMBINATIONAL NETWORKS FOR K-LUT BASED FPGA MAPPING

Optimizing by partitioning is a central problem in VLSI design automation, addressing circuit’s manufacturability. Circuit partitioning has multiple applications in VLSI design. One of the most common is that of dividing combinational circuits (usually large ones) that will not fit on a single package among a number of packages. Partitioning is of practical importance for k-LUT based FPGA circuit implementation. In this work is presented multilevel a multi-resource partitioning algorithm for partitioning large combinational circuits in order to efficiently use existing and commercially available FPGAs packagestwo-way partitioning, multi-way partitioning, recursive partitioning, flat partitioning, critical path, cutting cones, bottom-up clusters, top-down min-cut

Gate Delay Fault Test Generation for Non-Scan Circuits

This article presents a technique for the extension of delay fault test pattern generation to synchronous sequential circuits without making use of scan techniques. The technique relies on the coupling of TDgen, a robust combinational test pattern generator for delay faults, and SEMILET, a sequential test pattern generator for several static fault models. The approach uses a forward propagation-backward justification technique: The test pattern generation is started at the fault location, and after successful ¿local¿ test generation fault effect propagation is performed and finally a synchronising sequence to the required state is computed. The algorithm is complete for a robust gate delay fault model, which means that for every testable fault a test will be generated, assuming sufficient time. Experimental results for the ISCAS'89 benchmarks are presented in this pape

LOT: Logic Optimization with Testability - new transformations for logic synthesis

A new approach to optimize multilevel logic circuits is introduced. Given a multilevel circuit, the synthesis method optimizes its area while simultaneously enhancing its random pattern testability. The method is based on structural transformations at the gate level. New transformations involving EX-OR gates as well as Reed–Muller expansions have been introduced in the synthesis of multilevel circuits. This method is augmented with transformations that specifically enhance random-pattern testability while reducing the area. Testability enhancement is an integral part of our synthesis methodology. Experimental results show that the proposed methodology not only can achieve lower area than other similar tools, but that it achieves better testability compared to available testability enhancement tools such as tstfx. Specifically for ISCAS-85 benchmark circuits, it was observed that EX-OR gate-based transformations successfully contributed toward generating smaller circuits compared to other state-of-the-art logic optimization tools