13,432 research outputs found

    Fault Models for Quantum Mechanical Switching Networks

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    The difference between faults and errors is that, unlike faults, errors can be corrected using control codes. In classical test and verification one develops a test set separating a correct circuit from a circuit containing any considered fault. Classical faults are modelled at the logical level by fault models that act on classical states. The stuck fault model, thought of as a lead connected to a power rail or to a ground, is most typically considered. A classical test set complete for the stuck fault model propagates both binary basis states, 0 and 1, through all nodes in a network and is known to detect many physical faults. A classical test set complete for the stuck fault model allows all circuit nodes to be completely tested and verifies the function of many gates. It is natural to ask if one may adapt any of the known classical methods to test quantum circuits. Of course, classical fault models do not capture all the logical failures found in quantum circuits. The first obstacle faced when using methods from classical test is developing a set of realistic quantum-logical fault models. Developing fault models to abstract the test problem away from the device level motivated our study. Several results are established. First, we describe typical modes of failure present in the physical design of quantum circuits. From this we develop fault models for quantum binary circuits that enable testing at the logical level. The application of these fault models is shown by adapting the classical test set generation technique known as constructing a fault table to generate quantum test sets. A test set developed using this method is shown to detect each of the considered faults.Comment: (almost) Forgotten rewrite from 200

    Steganalytic Methods for the Detection of Histogram Shifting Data Hiding Schemes

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    Peer-reviewedIn this paper, several steganalytic techniques designed to detect the existence of hidden messages using histogram shifting schemes are presented. Firstly, three techniques to identify specific histogram shifting data hiding schemes, based on detectable visible alterations on the histogram or abnormal statistical distributions, are suggested. Afterwards, a general technique capable of detecting all the analyzed histogram shifting data hiding methods is suggested. This technique is based on the effect of histogram shifting methods on the ¿volatility¿ of the histogram of the difference image. The different behavior of volatility whenever new data are hidden makes it possible to identify stego and cover images

    Analysis and application of digital spectral warping in analog and mixed-signal testing

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    Spectral warping is a digital signal processing transform which shifts the frequencies contained within a signal along the frequency axis. The Fourier transform coefficients of a warped signal correspond to frequency-domain 'samples' of the original signal which are unevenly spaced along the frequency axis. This property allows the technique to be efficiently used for DSP-based analog and mixed-signal testing. The analysis and application of spectral warping for test signal generation, response analysis, filter design, frequency response evaluation, etc. are discussed in this paper along with examples of the software and hardware implementation
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