5,278 research outputs found

    DeSyRe: on-Demand System Reliability

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    The DeSyRe project builds on-demand adaptive and reliable Systems-on-Chips (SoCs). As fabrication technology scales down, chips are becoming less reliable, thereby incurring increased power and performance costs for fault tolerance. To make matters worse, power density is becoming a significant limiting factor in SoC design, in general. In the face of such changes in the technological landscape, current solutions for fault tolerance are expected to introduce excessive overheads in future systems. Moreover, attempting to design and manufacture a totally defect and fault-free system, would impact heavily, even prohibitively, the design, manufacturing, and testing costs, as well as the system performance and power consumption. In this context, DeSyRe delivers a new generation of systems that are reliable by design at well-balanced power, performance, and design costs. In our attempt to reduce the overheads of fault-tolerance, only a small fraction of the chip is built to be fault-free. This fault-free part is then employed to manage the remaining fault-prone resources of the SoC. The DeSyRe framework is applied to two medical systems with high safety requirements (measured using the IEC 61508 functional safety standard) and tight power and performance constraints

    Dependable Computing on Inexact Hardware through Anomaly Detection.

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    Reliability of transistors is on the decline as transistors continue to shrink in size. Aggressive voltage scaling is making the problem even worse. Scaled-down transistors are more susceptible to transient faults as well as permanent in-field hardware failures. In order to continue to reap the benefits of technology scaling, it has become imperative to tackle the challenges risen due to the decreasing reliability of devices for the mainstream commodity market. Along with the worsening reliability, achieving energy efficiency and performance improvement by scaling is increasingly providing diminishing marginal returns. More than any other time in history, the semiconductor industry faces the crossroad of unreliability and the need to improve energy efficiency. These challenges of technology scaling can be tackled by categorizing the target applications in the following two categories: traditional applications that have relatively strict correctness requirement on outputs and emerging class of soft applications, from various domains such as multimedia, machine learning, and computer vision, that are inherently inaccuracy tolerant to a certain degree. Traditional applications can be protected against hardware failures by low-cost detection and protection methods while soft applications can trade off quality of outputs to achieve better performance or energy efficiency. For traditional applications, I propose an efficient, software-only application analysis and transformation solution to detect data and control flow transient faults. The intelligence of the data flow solution lies in the use of dynamic application information such as control flow, memory and value profiling. The control flow protection technique achieves its efficiency by simplifying signature calculations in each basic block and by performing checking at a coarse-grain level. For soft applications, I develop a quality control technique. The quality control technique employs continuous, light-weight checkers to ensure that the approximation is controlled and application output is acceptable. Overall, I show that the use of low-cost checkers to produce dependable results on commodity systems---constructed from inexact hardware components---is efficient and practical.PhDComputer Science and EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttp://deepblue.lib.umich.edu/bitstream/2027.42/113341/1/dskhudia_1.pd

    Achieving Functional Correctness in Large Interconnect Systems.

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    In today's semi-conductor industry, large chip-multiprocessors and systems-on-chip are being developed, integrating a large number of components on a single chip. The sheer size of these designs and the intricacy of the communication patterns they exhibit have propelled the development of network-on-chip (NoC) interconnects as the basis for the communication infrastructure in these systems. Faced with the interconnect's growing size and complexity, several challenges hinder its effective validation. During the interconnect's development, the functional verification process relies heavily on the use of emulation and post-silicon validation platforms. However, detecting and debugging errors on these platforms is a difficult endeavour due to the limited observability, and in turn the low verification capabilities, they provide. Additionally, with the inherent incompleteness of design-time validation efforts, the potential of design bugs escaping into the interconnect of a released product is also a concern, as these bugs can threaten the viability of the entire system. This dissertation provides solutions to enable the development of functionally correct interconnect designs. We first address the challenges encountered during design-time verification efforts, by providing two complementary mechanisms that allow emulation and post-silicon verification frameworks to capture a detailed overview of the functional behaviour of the interconnect. Our first solution re-purposes the contents of in-flight traffic to log debug data from the interconnect's execution. This approach enables the validation of the interconnect using synthetic traffic workloads, while attaining over 80% observability of the routes followed by packets and capturing valuable debugging information. We also develop an alternative mechanism that boosts observability by taking periodic snapshots of execution, thus extending the verification capabilities to run both synthetic traffic and real-application workloads. The collected snapshots enhance detection and debugging support, and they provide observability of over 50% of packets and reconstructs at least half of each of their routes. Moreover, we also develop error detection and recovery solutions to address the threat of design bugs escaping into the interconnect's runtime operation. Our runtime techniques can overcome communication errors without needing to store replicate copies of all in-flight packets, thereby achieving correctness at minimal area costsPhDComputer Science and EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttp://deepblue.lib.umich.edu/bitstream/2027.42/116741/1/rawanak_1.pd

    Extensions of Task-based Runtime for High Performance Dense Linear Algebra Applications

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    On the road to exascale computing, the gap between hardware peak performance and application performance is increasing as system scale, chip density and inherent complexity of modern supercomputers are expanding. Even if we put aside the difficulty to express algorithmic parallelism and to efficiently execute applications at large scale, other open questions remain. The ever-growing scale of modern supercomputers induces a fast decline of the Mean Time To Failure. A generic, low-overhead, resilient extension becomes a desired aptitude for any programming paradigm. This dissertation addresses these two critical issues, designing an efficient unified linear algebra development environment using a task-based runtime, and extending a task-based runtime with fault tolerant capabilities to build a generic framework providing both soft and hard error resilience to task-based programming paradigm. To bridge the gap between hardware peak performance and application perfor- mance, a unified programming model is designed to take advantage of a lightweight task-based runtime to manage the resource-specific workload, and to control the data ow and parallel execution of tasks. Under this unified development, linear algebra tasks are abstracted across different underlying heterogeneous resources, including multicore CPUs, GPUs and Intel Xeon Phi coprocessors. Performance portability is guaranteed and this programming model is adapted to a wide range of accelerators, supporting both shared and distributed-memory environments. To solve the resilient challenges on large scale systems, fault tolerant mechanisms are designed for a task-based runtime to protect applications against both soft and hard errors. For soft errors, three additions to a task-based runtime are explored. The first recovers the application by re-executing minimum number of tasks, the second logs intermediary data between tasks to minimize the necessary re-execution, while the last one takes advantage of algorithmic properties to recover the data without re- execution. For hard errors, we propose two generic approaches, which augment the data logging mechanism for soft errors. The first utilizes non-volatile storage device to save logged data, while the second saves local logged data on a remote node to protect against node failure. Experimental results have confirmed that our soft and hard error fault tolerant mechanisms exhibit the expected correctness and efficiency

    Compiler-Aided Methodology for Low Overhead On-line Testing

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    Reliability is emerging as an important design criterion in modern systems due to increasing transient fault rates. Hardware fault-tolerance techniques, commonly used to address this, introduce high design costs. As alternative, software Signature-Monitoring (SM) schemes based on compiler assertions are an efficient method for control-flow-error detection. Existing SM techniques do not consider application-specific-information causing unnecessary overheads. In this paper, compile-time Control-Flow-Graph (CFG) topology analysis is used to place best-suited assertions at optimal locations of the assembly code to reduce overheads. Our evaluation with representative workloads shows fault-coverage increase with overheads close to Assertion- based Control-Flow Correction (ACFC), the method with lowest overhead. Compared to ACFC, our technique improves (on average) fault coverage by 17%, performance overhead by 5% and power-consumption by 3% with equal code-size overhead
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