137,400 research outputs found

    The impact of random doping effects on CMOS SRAM cell

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    The SRAM has a very constrained cell area and is consequently sensitive to the intrinsic parameter fluctuations ubiquitous in decananometer scale MOSFETs. Using a statistical circuit simulation methodology, which can fully collate intrinsic parameter fluctuation information into compact model sets, the impact of random device doping on 6-T SRAM static noise margins, and read and write characteristics are investigated in detail for well-scaled 35 nm physical gate length devices. We conclude that intrinsic parameter fluctuations will become a major limitation to further conventional MOSFET SRAM scaling

    Impact of parameter variations on circuits and microarchitecture

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    Parameter variations, which are increasing along with advances in process technologies, affect both timing and power. Variability must be considered at both the circuit and microarchitectural design levels to keep pace with performance scaling and to keep power consumption within reasonable limits. This article presents an overview of the main sources of variability and surveys variation-tolerant circuit and microarchitectural approaches.Peer ReviewedPostprint (published version

    Acoustic noise radiated by PWM-controlled induction machine drives

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    This paper investigates the acoustic noise radiated from two nominally identical induction motors when fed from sinusoidal, and asymmetric regular sampling subharmonic and space-vector pulsewidth modulation (PWM) converters. The theory for analyzing the noise spectrum is developed further to account for the interaction between the motor and the drive. It is shown that manufacturing tolerances can result in significant differences in the noise level emitted from nominally identical motors, and that mechanical resonances can result in extremely high noise emissions. Such resonances can be induced by stator and rotor slot air-gap field harmonics due to the fundamental component of current, and by the interaction between the airgap field harmonics produced by the fundamental and the PWM harmonic currents. The significance of the effect of PWM strategy on the noise is closely related to the mechanical resonance with vibration mode order zero, while the PWM strategy will be critical only if the dominant cause of the emitted noise is the interaction of the fundamental air-gap field and PWM harmonic

    Macromodelling for analog design and robustness boosting in bio-inspired computing models

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    Setting specifications for the electronic implementation of biological neural-network-like vision systems on-chip is not straightforward, neither it is to simulate the resulting circuit. The structure of these systems leads to a netlist of more than 100.000 nodes for a small array of 100×150 pixels. Moreover, introducing an optical input in the low level simulation is nowadays not feasible with standard electrical simulation environments. Given that, to accomplish the task of integrating those systems in silicon to build compact, low power consuming, and reliable systems, a previous step in the standard analog electronic design flux should be introduced. Here a methodology to make the translation from the biological model to circuit-level specifications for electronic design is proposed. The purpose is to include non ideal effects as mismatching, noise, leakages, supply degradation, feedthrough, and temperature of operation in a high level description of the implementation, in order to accomplish behavioural simulations that require less computational effort and resources. A particular case study is presented, the analog electronic implementation of the locust's Lobula Giant Movement Detector (LGMD), a neural structure that fires a collision alarm based on visual information. The final goal is a collision threat detection vision system on-chip for automotive applications.European Union IST-2001-38097, TIC2003 - 09817-C02-0

    Analysis and equalization of data-dependent jitter

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    Data-dependent jitter limits the bit-error rate (BER) performance of broadband communication systems and aggravates synchronization in phase- and delay-locked loops used for data recovery. A method for calculating the data-dependent jitter in broadband systems from the pulse response is discussed. The impact of jitter on conventional clock and data recovery circuits is studied in the time and frequency domain. The deterministic nature of data-dependent jitter suggests equalization techniques suitable for high-speed circuits. Two equalizer circuit implementations are presented. The first is a SiGe clock and data recovery circuit modified to incorporate a deterministic jitter equalizer. This circuit demonstrates the reduction of jitter in the recovered clock. The second circuit is a MOS implementation of a jitter equalizer with independent control of the rising and falling edge timing. This equalizer demonstrates improvement of the timing margins that achieve 10/sup -12/ BER from 30 to 52 ps at 10 Gb/s

    Simulation of intrinsic parameter fluctuations in decananometer and nanometer-scale MOSFETs

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    Intrinsic parameter fluctuations introduced by discreteness of charge and matter will play an increasingly important role when semiconductor devices are scaled to decananometer and nanometer dimensions in next-generation integrated circuits and systems. In this paper, we review the analytical and the numerical simulation techniques used to study and predict such intrinsic parameters fluctuations. We consider random discrete dopants, trapped charges, atomic-scale interface roughness, and line edge roughness as sources of intrinsic parameter fluctuations. The presented theoretical approach based on Green's functions is restricted to the case of random discrete charges. The numerical simulation approaches based on the drift diffusion approximation with density gradient quantum corrections covers all of the listed sources of fluctuations. The results show that the intrinsic fluctuations in conventional MOSFETs, and later in double gate architectures, will reach levels that will affect the yield and the functionality of the next generation analog and digital circuits unless appropriate changes to the design are made. The future challenges that have to be addressed in order to improve the accuracy and the predictive power of the intrinsic fluctuation simulations are also discussed
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