A Survey on Integrated Circuit Trojans

Traditionally, computer security has been associated with the software security, or the information-data security. Surprisingly, the hardware on which the software executes or the information stored-processed-transmitted has been assumed to be a trusted base of security. The main building blocks of any electronic device are Integrated circuits (ICs) which form the fabric of a computer system. Lately, the use of ICs has expanded from handheld calculators and personal computers (PCs) to smartphones, servers, and Internet-of-Things (IoT) devices. However, this significant growth in the IC market created intense competition among IC vendors, leading to new trends in IC manufacturing. System-on-chip (SoC) design based on intellectual property (IP), a globally spread supply chain of production and distribution of ICs are the foremost of these trends. The emerging trends have resulted in many security and trust weaknesses and vulnerabilities, in computer systems. This includes Hardware Trojans attacks, side-channel attacks, Reverse-engineering, IP piracy, IC counterfeiting, micro probing, physical tampering, and acquisition of private or valuable assets by debugging and testing. IC security and trust vulnerabilities may cause loss of private information, modified/altered functions, which may cause a great economical hazard and big damage to society. Thus, it is crucial to examine the security and trust threats existing in the IC lifecycle and build defense mechanisms against IC Trojan threats. In this article, we examine the IC supply chain and define the possible IC Trojan threats for the parties involved. Then we survey the latest progress of research in the area of countermeasures against the IC Trojan attacks and discuss the challenges and expectations in this area. Keywords: IC supply chain, IC security, IP privacy, hardware trojans, IC trojans DOI: 10.7176/CEIS/12-2-01 Publication date: April 30th 202

Effectiveness of HT-assisted Sinkhole and Blackhole Denial of Service Attacks Targeting Mesh Networks-on-chip

There are ample opportunities at both design and manufacturing phases to meddle in a many-core chip system, especially its underlining communication fabric, known as the networks-on-chip (NoC), through the inclusion of malicious hardware Trojans (HT). In this paper, we focus on studying two specific HT-assisted Denial-of-Service (DoS) attacks, namely the sinkhole and blackhole attacks, that directly target the NoC of a many-core chip. As of the blackhole attacks, those intermediate routers with inserted HTs can stop forwarding data packets/flits towards the packets’ destination; instead, packets are either dropped from the network or diverted to some other malicious nodes. Sinkhole attacks, which exhibit similar attack effects as blackhole attacks, can occur when the NoC supports adaptive routing. In this case, a malicious node actively solicits packets from its neighbor nodes by pretending to have sufficient free buffer slots. Effects and efficiencies of both sinkhole and blackhole DoS attacks are modeled and quantified in this paper, and a few factors that influence attack effects are found to be critical. Through fine-tuning of these parameters, both attacks are shown to cause more damages to the NoC, measured as over 30% increase in packet loss rate. Even with current detection and defense methods in place, the packet loss rate is still remarkably high, suggesting the need of new and more effective detection and defense methods against the enhanced blackhole and sinkhole attacks as described in the paper

Emerging Security Threats in Modern Digital Computing Systems: A Power Management Perspective

Design of computing systems — from pocket-sized smart phones to massive cloud based data-centers — have one common daunting challenge : minimizing the power consumption. In this effort, power management sector is undergoing a rapid and profound transformation to promote clean and energy proportional computing. At the hardware end of system design, there is proliferation of specialized, feature rich and complex power management hardware components. Similarly, in the software design layer complex power management suites are growing rapidly. Concurrent to this development, there has been an upsurge in the integration of third-party components to counter the pressures of shorter time-to-market. These trends collectively raise serious concerns about trust and security of power management solutions. In recent times, problems such as overheating, performance degradation and poor battery life, have dogged the mobile devices market, including the infamous recall of Samsung Note 7. Power outage in the data-center of a major airline left innumerable passengers stranded, with thousands of canceled flights costing over 100 million dollars. This research examines whether such events of unintentional reliability failure, can be replicated using targeted attacks by exploiting the security loopholes in the complex power management infrastructure of a computing system. At its core, this research answers an imminent research question: How can system designers ensure secure and reliable operation of third-party power management units? Specifically, this work investigates possible attack vectors, and novel non-invasive detection and defense mechanisms to safeguard system against malicious power attacks. By a joint exploration of the threat model and techniques to seamlessly detect and protect against power attacks, this project can have a lasting impact, by enabling the design of secure and cost-effective next generation hardware platforms

A Novel Methodology for Testing Hardware Security and Trust Exploiting On-Chip Power Noise Measurements (Extended Version)

Testing of electronic components is indispensable to minimize malfunction and failure of complex electronic systems. Currently, functionality and performance of these electronic components are the main parameters tested. However, validation of performance is not enough when the applications are safety or security critical. Therefore the security and trust of devices must also be tested before validation for such applications. In this paper, we promote the use of On-Chip Power noise Measurements (OCM), in order to test security using side-channel techniques. We then propose for the first time a standard side-channel measurement setup using OCM. Finally, we provide some key ideas on methodology to integrate the validation of hardware security and trust in the standard testing flow, exploiting OCM

Techniques for Improving Security and Trustworthiness of Integrated Circuits

The integrated circuit (IC) development process is becoming increasingly vulnerable to malicious activities because untrusted parties could be involved in this IC development flow. There are four typical problems that impact the security and trustworthiness of ICs used in military, financial, transportation, or other critical systems: (i) Malicious inclusions and alterations, known as hardware Trojans, can be inserted into a design by modifying the design during GDSII development and fabrication. Hardware Trojans in ICs may cause malfunctions, lower the reliability of ICs, leak confidential information to adversaries or even destroy the system under specifically designed conditions. (ii) The number of circuit-related counterfeiting incidents reported by component manufacturers has increased significantly over the past few years with recycled ICs contributing the largest percentage of the total reported counterfeiting incidents. Since these recycled ICs have been used in the field before, the performance and reliability of such ICs has been degraded by aging effects and harsh recycling process. (iii) Reverse engineering (RE) is process of extracting a circuit’s gate-level netlist, and/or inferring its functionality. The RE causes threats to the design because attackers can steal and pirate a design (IP piracy), identify the device technology, or facilitate other hardware attacks. (iv) Traditional tools for uniquely identifying devices are vulnerable to non-invasive or invasive physical attacks. Securing the ID/key is of utmost importance since leakage of even a single device ID/key could be exploited by an adversary to hack other devices or produce pirated devices. In this work, we have developed a series of design and test methodologies to deal with these four challenging issues and thus enhance the security, trustworthiness and reliability of ICs. The techniques proposed in this thesis include: a path delay fingerprinting technique for detection of hardware Trojans, recycled ICs, and other types counterfeit ICs including remarked, overproduced, and cloned ICs with their unique identifiers; a Built-In Self-Authentication (BISA) technique to prevent hardware Trojan insertions by untrusted fabrication facilities; an efficient and secure split manufacturing via Obfuscated Built-In Self-Authentication (OBISA) technique to prevent reverse engineering by untrusted fabrication facilities; and a novel bit selection approach for obtaining the most reliable bits for SRAM-based physical unclonable function (PUF) across environmental conditions and silicon aging effects