Radiation-Induced Error Criticality in Modern HPC Parallel Accelerators

In this paper, we evaluate the error criticality of radiation-induced errors on modern High-Performance Computing (HPC) accelerators (Intel Xeon Phi and NVIDIA K40) through a dedicated set of metrics. We show that, as long as imprecise computing is concerned, the simple mismatch detection is not sufficient to evaluate and compare the radiation sensitivity of HPC devices and algorithms. Our analysis quantifies and qualifies radiation effects on applications’ output correlating the number of corrupted elements with their spatial locality. Also, we provide the mean relative error (dataset-wise) to evaluate radiation-induced error magnitude. We apply the selected metrics to experimental results obtained in various radiation test campaigns for a total of more than 400 hours of beam time per device. The amount of data we gathered allows us to evaluate the error criticality of a representative set of algorithms from HPC suites. Additionally, based on the characteristics of the tested algorithms, we draw generic reliability conclusions for broader classes of codes. We show that arithmetic operations are less critical for the K40, while Xeon Phi is more reliable when executing particles interactions solved through Finite Difference Methods. Finally, iterative stencil operations seem the most reliable on both architectures.This work was supported by the STIC-AmSud/CAPES scientific cooperation program under the EnergySFE research project grant 99999.007556/2015-02, EU H2020 Programme, and MCTI/RNP-Brazil under the HPC4E Project, grant agreement n° 689772. Tested K40 boards were donated thanks to Steve Keckler, Timothy Tsai, and Siva Hari from NVIDIA.Postprint (author's final draft

Soft Error Effects on Arm Microprocessors: Early Estimations versus Chip Measurements

Extensive research efforts are being carried out to evaluate and improve the reliability of computing devices either through beam experiments or simulation-based fault injection. Unfortunately, it is still largely unclear to which extend fault injection can provide an accurate error rate estimation at early stages and if beam experiments can be used to identify the weakest resources in a device. The importance and challenges associated with a timely, but yet realistic reliability evaluation grow with the increase of complexity in both the hardware domain, with the integration of different types of cores in an SoC (System-on-Chip), and the software domain, with the OS (operating system) required to take full advantage of the available resources. In this paper, we combine and analyze data gathered with extensive beam experiments (on the final physical CPU hardware) and microarchitectural fault injections (on early microarchitectural CPU models). We target a standalone Arm Cortex-A5 CPU and an Arm Cortex-A9 CPU integrated into an SoC and evaluate their reliability in bare-metal and Linux-based configurations. Combining experimental data that covers more than 18 million years of device time with the result of more than 176,000 injections we find that both the SoC integration and the presence of the OS increase the system DUEs (Detected Unrecoverable Errors) rate (for different reasons) but do not significantly impact the SDCs (Silent Data Corruptions) rate which is solely attributed to the CPU core. Our reliability analysis demonstrates that even considering SoC integration and OS inclusion, early, pre-silicon microarchitecture-level fault injection delivers accurate SDC rates estimations and lower bounds for the DUE rates

Control Caching : a fault-tolerant architecture for SEU mitigation in microprocessor control logic

The importance of fault tolerance at the processor architecture level has been made increasingly important due to rapid advancements in the design and usage of high performance devices and embedded processors. System level solutions to the challenge of fault tolerance flag errors and utilize penalty cycles to recover through the re-execution of instructions. This motivates the need for a hybrid technique providing fault detection as well as fault masking, with minimal penalty cycles for recovery from detected errors. In this research, we propose Control Caching, an architectural technique comprising of three schemes to protect the control logic of microprocessors against Single Event Upsets (SEUs). High fault coverage with relatively low hardware overhead is obtained by using both fault detection with recovery and fault masking. Control signals are classified as either static or dynamic, and static signals are further classified as opcode dependent and instruction dependent. The strategy for protecting static instruction dependent control signals utilizes a distributed cache of the history of the control bits along with the Triple Modular Redundancy (TMR) concept, while the opcode dependent control signals are protected by a distributed cache which can be used to flag errors. Dynamic signals are protected by selective duplication of datapath components. The techniques are implemented on the OpenRISC 1200 processor. Our simulation results show that fault detection with single cycle recovery is provided for 92% of all instruction executions. FPGA synthesis is performed to analyze the associated cycle time and area overheads

Reliable Linear, Sesquilinear and Bijective Operations On Integer Data Streams Via Numerical Entanglement

A new technique is proposed for fault-tolerant linear, sesquilinear and bijective (LSB) operations on $M$ integer data streams ($M\geq3$), such as: scaling, additions/subtractions, inner or outer vector products, permutations and convolutions. In the proposed method, the $M$ input integer data streams are linearly superimposed to form $M$ numerically-entangled integer data streams that are stored in-place of the original inputs. A series of LSB operations can then be performed directly using these entangled data streams. The results are extracted from the $M$ entangled output streams by additions and arithmetic shifts. Any soft errors affecting any single disentangled output stream are guaranteed to be detectable via a specific post-computation reliability check. In addition, when utilizing a separate processor core for each of the $M$ streams, the proposed approach can recover all outputs after any single fail-stop failure. Importantly, unlike algorithm-based fault tolerance (ABFT) methods, the number of operations required for the entanglement, extraction and validation of the results is linearly related to the number of the inputs and does not depend on the complexity of the performed LSB operations. We have validated our proposal in an Intel processor (Haswell architecture with AVX2 support) via fast Fourier transforms, circular convolutions, and matrix multiplication operations. Our analysis and experiments reveal that the proposed approach incurs between $0.03\%$ to $7\%$ reduction in processing throughput for a wide variety of LSB operations. This overhead is 5 to 1000 times smaller than that of the equivalent ABFT method that uses a checksum stream. Thus, our proposal can be used in fault-generating processor hardware or safety-critical applications, where high reliability is required without the cost of ABFT or modular redundancy.Comment: to appear in IEEE Trans. on Signal Processing, 201

SafeLS: An open source implementation of a lockstep NOEL-V RISC-V core

Microcontrollers running safety-critical applications with high integrity requirements must provide appropriate safety measures to manage random hardware faults. For instance, automotive safety regulations (e.g., ISO26262) impose the use of diverse redundancy for items at the highest automotive safety integrity level (ASIL), ASIL-D. In the case of computing cores, this is realized with dual core lockstep (DCLS). The advent of the RISC-VISA has made open source hardware gain popularity. However, there are few industrial open source SoCs meeting the requirements of safety-critical systems, and, to our knowledge, none of them provides lockstep cores. This paper presents the realization of a RISC-V open source lockstep core based on Gaisler's NOEL-V core for the space domain, as well as its integration in the SELENE SoC that provides a complete microcontroller synthesizable on FPGA successfully assessed against space, automotive and railway safety-critical applications in the past.This work is part of the European Union’s Horizon 2020 Programme under project KDT Joint Undertaking (JU) under grant agreement No 101112274 (ISOLDE). This work has also been partially supported by the Spanish Ministry of Science and Innovation under grant PID2019-107255GB-C21 funded by MCIN/AEI/10.13039/501100011033.Peer ReviewedPostprint (author's final draft

Study of the effects of SEU-induced faults on a pipeline protected microprocessor

This paper presents a detailed analysis of the behavior of a novel fault-tolerant 32-bit embedded CPU as compared to a default (non-fault-tolerant) implementation of the same processor during a fault injection campaign of single and double faults. The fault-tolerant processor tested is characterized by per-cycle voting of microarchitectural and the flop-based architectural states, redundancy at the pipeline level, and a distributed voting scheme. Its fault-tolerant behavior is characterized for three different workloads from the automotive application domain. The study proposes statistical methods for both the single and dual fault injection campaigns and demonstrates the fault-tolerant capability of both processors in terms of fault latencies, the probability of fault manifestation, and the behavior of latent faults

Algorithm-Directed Crash Consistence in Non-Volatile Memory for HPC

Fault tolerance is one of the major design goals for HPC. The emergence of non-volatile memories (NVM) provides a solution to build fault tolerant HPC. Data in NVM-based main memory are not lost when the system crashes because of the non-volatility nature of NVM. However, because of volatile caches, data must be logged and explicitly flushed from caches into NVM to ensure consistence and correctness before crashes, which can cause large runtime overhead. In this paper, we introduce an algorithm-based method to establish crash consistence in NVM for HPC applications. We slightly extend application data structures or sparsely flush cache blocks, which introduce ignorable runtime overhead. Such extension or cache flushing allows us to use algorithm knowledge to \textit{reason} data consistence or correct inconsistent data when the application crashes. We demonstrate the effectiveness of our method for three algorithms, including an iterative solver, dense matrix multiplication, and Monte-Carlo simulation. Based on comprehensive performance evaluation on a variety of test environments, we demonstrate that our approach has very small runtime overhead (at most 8.2\% and less than 3\% in most cases), much smaller than that of traditional checkpoint, while having the same or less recomputation cost.Comment: 12 page

SMCV: a Methodology for Detecting Transient Faults in Multicore Clusters

The challenge of improving the performance of current processors is achieved by increasing the integration scale. This carries a growing vulnerability to transient faults, which increase their impact on multicore clusters running large scientific parallel applications. The  requirement for enhancing the reliability of these systems, coupled with the high cost of rerunning the application from the beginning, create the motivation for having specific software strategies for the target systems. This paper introduces SMCV, which is a fully distributed technique that provides fault detection for message-passing parallel applications, by validating the contents of the messages to be sent, preventing the transmission of errors to other processes and leveraging the intrinsic hardware redundancy of the multicore. SMCV achieves a wide robustness against transient faults with a reduced overhead, and accomplishes a trade-off between moderate detection latency and low additional workload.Instituto de Investigación en Informátic

Cross layer reliability estimation for digital systems

Forthcoming manufacturing technologies hold the promise to increase multifuctional computing systems performance and functionality thanks to a remarkable growth of the device integration density. Despite the benefits introduced by this technology improvements, reliability is becoming a key challenge for the semiconductor industry. With transistor size reaching the atomic dimensions, vulnerability to unavoidable fluctuations in the manufacturing process and environmental stress rise dramatically. Failing to meet a reliability requirement may add excessive re-design cost to recover and may have severe consequences on the success of a product. %Worst-case design with large margins to guarantee reliable operation has been employed for long time. However, it is reaching a limit that makes it economically unsustainable due to its performance, area, and power cost. One of the open challenges for future technologies is building ``dependable'' systems on top of unreliable components, which will degrade and even fail during normal lifetime of the chip. Conventional design techniques are highly inefficient. They expend significant amount of energy to tolerate the device unpredictability by adding safety margins to a circuit's operating voltage, clock frequency or charge stored per bit. Unfortunately, the additional cost introduced to compensate unreliability are rapidly becoming unacceptable in today's environment where power consumption is often the limiting factor for integrated circuit performance, and energy efficiency is a top concern. Attention should be payed to tailor techniques to improve the reliability of a system on the basis of its requirements, ending up with cost-effective solutions favoring the success of the product on the market. Cross-layer reliability is one of the most promising approaches to achieve this goal. Cross-layer reliability techniques take into account the interactions between the layers composing a complex system (i.e., technology, hardware and software layers) to implement efficient cross-layer fault mitigation mechanisms. Fault tolerance mechanism are carefully implemented at different layers starting from the technology up to the software layer to carefully optimize the system by exploiting the inner capability of each layer to mask lower level faults. For this purpose, cross-layer reliability design techniques need to be complemented with cross-layer reliability evaluation tools, able to precisely assess the reliability level of a selected design early in the design cycle. Accurate and early reliability estimates would enable the exploration of the system design space and the optimization of multiple constraints such as performance, power consumption, cost and reliability. This Ph.D. thesis is devoted to the development of new methodologies and tools to evaluate and optimize the reliability of complex digital systems during the early design stages. More specifically, techniques addressing hardware accelerators (i.e., FPGAs and GPUs), microprocessors and full systems are discussed. All developed methodologies are presented in conjunction with their application to real-world use cases belonging to different computational domains

Affordable techniques for dependable microprocessor design

As high computing power is available at an affordable cost, we rely on microprocessor-based systems for much greater variety of applications. This dependence indicates that a processor failure could have more diverse impacts on our daily lives. Therefore, dependability is becoming an increasingly important quality measure of microprocessors.;Temporary hardware malfunctions caused by unstable environmental conditions can lead the processor to an incorrect state. This is referred to as a transient error or soft error. Studies have shown that soft errors are the major source of system failures. This dissertation characterizes the soft error behavior on microprocessors and presents new microarchitectural approaches that can realize high dependability with low overhead.;Our fault injection studies using RISC processors have demonstrated that different functional blocks of the processor have distinct susceptibilities to soft errors. The error susceptibility information must be reflected in devising fault tolerance schemes for cost-sensitive applications. Considering the common use of on-chip caches in modern processors, we investigated area-efficient protection schemes for memory arrays. The idea of caching redundant information was exploited to optimize resource utilization for increased dependability. We also developed a mechanism to verify the integrity of data transfer from lower level memories to the primary caches. The results of this study show that by exploiting bus idle cycles and the information redundancy, an almost complete check for the initial memory data transfer is possible without incurring a performance penalty.;For protecting the processor\u27s control logic, which usually remains unprotected, we propose a low-cost reliability enhancement strategy. We classified control logic signals into static and dynamic control depending on their changeability, and applied various techniques including commit-time checking, signature caching, component-level duplication, and control flow monitoring. Our schemes can achieve more than 99% coverage with a very small hardware addition. Finally, a virtual duplex architecture for superscalar processors is presented. In this system-level approach, the processor pipeline is backed up by a partially replicated pipeline. The replication-based checker minimizes the design and verification overheads. For a large-scale superscalar processor, the proposed architecture can bring 61.4% reduction in die area while sustaining the maximum performance