On testing VLSI chips for the big Viterbi decoder

A general technique that can be used in testing very large scale integrated (VLSI) chips for the Big Viterbi Decoder (BVD) system is described. The test technique is divided into functional testing and fault-coverage testing. The purpose of functional testing is to verify that the design works functionally. Functional test vectors are converted from outputs of software simulations which simulate the BVD functionally. Fault-coverage testing is used to detect and, in some cases, to locate faulty components caused by bad fabrication. This type of testing is useful in screening out bad chips. Finally, design for testability, which is included in the BVD VLSI chip design, is described in considerable detail. Both the observability and controllability of a VLSI chip are greatly enhanced by including the design for the testability feature

Layered cellular automata for pseudorandom number generation

The proposed Layered Cellular Automata (L-LCA), which comprises of a main CA with L additional layers of memory registers, has simple local interconnections and high operating speed. The time-varying L-LCA transformation at each clock can be reduced to a single transformation in the set formed by the transformation matrix of a maximum length Cellular Automata (CA), and the entire transformation sequence for a single period can be obtained. The analysis for the period characteristics of state sequences is simplified by analyzing representative transformation sequences determined by the phase difference between the initial states for each layer. The L-LCA model can be extended by adding more layers of memory or through the use of a larger main CA based on widely available maximum length CA. Several L-LCA (L=1,2,3,4) with 10- to 48-bit main CA are subjected to the DIEHARD test suite and better results are obtained over other CA designs reported in the literature. The experiments are repeated using the well-known nonlinear functions and in place of the linear function used in the L-LCA. Linear complexity is significantly increased when or is used

Advanced modulation technology development for earth station demodulator applications. Coded modulation system development

A jointly optimized coded modulation system is described which was designed, built, and tested by COMSAT Laboratories for NASA LeRC which provides a bandwidth efficiency of 2 bits/s/Hz at an information rate of 160 Mbit/s. A high speed rate 8/9 encoder with a Viterbi decoder and an Octal PSK modem are used to achieve this. The BER performance is approximately 1 dB from the theoretically calculated value for this system at a BER of 5 E-7 under nominal conditions. The system operates in burst mode for downlink applications and tests have demonstrated very little degradation in performance with frequency and level offset. Unique word miss rate measurements were conducted which demonstrate reliable acquisition at low values of Eb/No. Codec self tests have verified the performance of this subsystem in a stand alone mode. The codec is capable of operation at a 200 Mbit/s information rate as demonstrated using a codec test set which introduces noise digitally. The measured performance is within 0.2 dB of the computer simulated predictions. A gate array implementation of the most time critical element of the high speed Viterbi decoder was completed. This gate array add-compare-select chip significantly reduces the power consumption and improves the manufacturability of the decoder. This chip has general application in the implementation of high speed Viterbi decoders

Revisiting LFSMs

Linear Finite State Machines (LFSMs) are particular primitives widely used in information theory, coding theory and cryptography. Among those linear automata, a particular case of study is Linear Feedback Shift Registers (LFSRs) used in many cryptographic applications such as design of stream ciphers or pseudo-random generation. LFSRs could be seen as particular LFSMs without inputs. In this paper, we first recall the description of LFSMs using traditional matrices representation. Then, we introduce a new matrices representation with polynomial fractional coefficients. This new representation leads to sparse representations and implementations. As direct applications, we focus our work on the Windmill LFSRs case, used for example in the E0 stream cipher and on other general applications that use this new representation. In a second part, a new design criterion called diffusion delay for LFSRs is introduced and well compared with existing related notions. This criterion represents the diffusion capacity of an LFSR. Thus, using the matrices representation, we present a new algorithm to randomly pick LFSRs with good properties (including the new one) and sparse descriptions dedicated to hardware and software designs. We present some examples of LFSRs generated using our algorithm to show the relevance of our approach.Comment: Submitted to IEEE-I

Online self-repair of FIR filters

Chip-level failure detection has been a target of research for some time, but today's very deep-submicron technology is forcing such research to move beyond detection. Repair, especially self-repair, has become very important for containing the susceptibility of today's chips. This article introduces a self-repair-solution for the digital FIR filter, one of the key blocks used in DSPs

Genetic algorithm as self-test path and circular self-test path design method

The paper presents the use of Genetic Algorithm to search for non-linear Autonomous Test Structures (ATS) in Built-In Testing approach. Such structures can include essentially STP and CSTP and their modifications. Non-linear structures are more difficult to analyze than the widely used structures such as independent Test Pattern Generator and the Test Response Compactor realized by Linear Feedback Shift Registers. To reduce time-consuming test simulation of sequential circuit, it was used an approach based on the stochastic model of pseudo-random testing. The use of stochastic model significantly affects the time effectiveness of the search for evolutionary autonomous structures. In test simulation procedure, the block of sequential circuit memory is not disconnected. This approach does not require a special selection of memory registers such as BILBOs. A series of studies to test circuits set ISCAS’89 are made. The results of the study are very promising

FPGA ARCHITECTURE AND VERIFICATION OF BUILT IN SELF-TEST (BIST) FOR 32-BIT ADDER/SUBTRACTER USING DE0-NANO FPGA AND ANALOG DISCOVERY 2 HARDWARE

The integrated circuit (IC) is an integral part of everyday modern technology, and its application is very attractive to hardware and software design engineers because of its versatility, integration, power consumption, cost, and board area reduction. IC is available in various types such as Field Programming Gate Array (FPGA), Application Specific Integrated Circuit (ASIC), System on Chip (SoC) architecture, Digital Signal Processing (DSP), microcontrollers (μC), and many more. With technology demand focused on faster, low power consumption, efficient IC application, design engineers are facing tremendous challenges in developing and testing integrated circuits that guaranty functionality, high fault coverage, and reliability as the transistor technology is shrinking to the point where manufacturing defects of ICs are affecting yield which associates with the increased cost of the part. The competitive IC market is pressuring manufactures of ICs to develop and market IC in a relatively quick turnaround which in return requires design and verification engineers to develop an integrated self-test structure that would ensure fault-free and the quality product is delivered on the market. 70-80% of IC design is spent on verification and testing to ensure high quality and reliability for the enduser. To test complex and sophisticated IC designs, the verification engineers must produce laborious and costly test fixtures which affect the cost of the part on the competitive market. To avoid increasing the part cost due to yield and test time to the end-user and to keep up with the competitive market many IC design engineers are deviating from complex external test fixture approach and are focusing on integrating Built-in Self-Test (BIST) or Design for Test (DFT) techniques onto IC’s which would reduce time to market but still guarantee high coverage for the product. Understanding the BIST, the architecture, as well as the application of IC, must be understood before developing IC. The architecture of FPGA is elaborated in this paper followed by several BIST techniques and applications of those BIST relative to FPGA, SoC, analog to digital (ADC), or digital to analog converters (DAC) that are integrated on IC. Paper is concluded with verification of BIST for the 32-bit adder/subtracter designed in Quartus II software using the Analog Discovery 2 module as stimulus and DE0-NANO FPGA board for verification