Topological characterization of antireflective and hydrophobic rough surfaces: are random process theory and fractal modeling applicable?

The random process theory (RPT) has been widely applied to predict the joint probability distribution functions (PDFs) of asperity heights and curvatures of rough surfaces. A check of the predictions of RPT against the actual statistics of numerically generated random fractal surfaces and of real rough surfaces has been only partially undertaken. The present experimental and numerical study provides a deep critical comparison on this matter, providing some insight into the capabilities and limitations in applying RPT and fractal modeling to antireflective and hydrophobic rough surfaces, two important types of textured surfaces. A multi-resolution experimental campaign by using a confocal profilometer with different lenses is carried out and a comprehensive software for the statistical description of rough surfaces is developed. It is found that the topology of the analyzed textured surfaces cannot be fully described according to RPT and fractal modeling. The following complexities emerge: (i) the presence of cut-offs or bi-fractality in the power-law power-spectral density (PSD) functions; (ii) a more pronounced shift of the PSD by changing resolution as compared to what expected from fractal modeling; (iii) inaccuracy of the RPT in describing the joint PDFs of asperity heights and curvatures of textured surfaces; (iv) lack of resolution-invariance of joint PDFs of textured surfaces in case of special surface treatments, not accounted by fractal modeling.Comment: 21 pages, 13 figure

On the nature of surface roughness with application to contact mechanics, sealing, rubber friction and adhesion

Surface roughness has a huge impact on many important phenomena. The most important property of rough surfaces is the surface roughness power spectrum C(q). We present surface roughness power spectra of many surfaces of practical importance, obtained from the surface height profile measured using optical methods and the Atomic Force Microscope. We show how the power spectrum determines the contact area between two solids. We also present applications to sealing, rubber friction and adhesion for rough surfaces, where the power spectrum enters as an important input.Comment: Topical review; 82 pages, 61 figures; Format: Latex (iopart). Some figures are in Postscript Level

Loading-unloading hysteresis loop of randomly rough adhesive contacts

In this paper we investigate the loading and unloading behavior of soft solids in adhesive contact with randomly rough profiles. The roughness is assumed to be described by a self-affine fractal on a limited range of wave-vectors. A spectral method is exploited to generate such randomly rough surfaces. The results are statistically averaged, and the calculated contact area and applied load are shown as a function of the penetration, for loading and unloading conditions. We found that the combination of adhesion forces and roughness leads to a hysteresis loading-unloading loop. This shows that energy can be lost simply as a consequence of roughness and van der Waals forces, as in this case a large number of local energy minima exist and the system may be trapped in metastable states. We numerically quantify the hysteretic loss and assess the influence of the surface statistical properties and the energy of adhesion on the hysteresis process.Comment: 8 pages, 9 figures, published on Physical Review E, Volume 92, Issue 6, 8 December 2015, Article number 06240

Light scattering from self-affine fractal silver surfaces with nanoscale cutoff: Far-field and near-field calculations

We study the light scattered from randomly rough, one-dimensional self-affine fractal silver surfaces with nanoscale lower cutoff, illuminated by s- or p-polarized Gaussian beams a few microns wide. By means of rigorous numerical calculations based on the Green theorem integral equation formulation, we obtain both the far- and near-field scattered intensities. The influence of diminishing the fractal lower scale cutoff (from below a hundred, down to a few nanometers) is analyzed in the case of both single realizations and ensemble average magnitudes. For s polarization, variations are small in the far field, being only significant in the higher spatial frequency components of evanescent character in the near field. In the case of p polarization, however, the nanoscale cutoff has remarkable effects stemming from the roughness-induced excitation of surface-plasmon polaritons. In the far field, the effect is noticed both in the speckle pattern variation and in the decrease of the total reflected energy upon ensemble averaging, due to increased absorption. In the near field, more efficient excitation of localized optical modes is achieved with smaller cutoff, which in turn leads to huge surface electric field enhancements.Comment: REVTeX 4, 10 page

A multiscale Molecular Dynamics approach to Contact Mechanics

The friction and adhesion between elastic bodies are strongly influenced by the roughness of the surfaces in contact. Here we develop a multiscale molecular dynamics approach to contact mechanics, which can be used also when the surfaces have roughness on many different length-scales, e.g., for self affine fractal surfaces. As an illustration we consider the contact between randomly rough surfaces, and show that the contact area varies linearly with the load for small load. We also analyze the contact morphology and the pressure distribution at different magnification, both with and without adhesion. The calculations are compared with analytical contact mechanics models based on continuum mechanics.Comment: Format Revtex4, two columns, 13 pages, 19 pictures. Submitted for publication in the European Physical Journal E. Third revision with minimal changes: Corrected a few mistypin

Earthquake statistics and fractal faults

We introduce a Self-affine Asperity Model (SAM) for the seismicity that mimics the fault friction by means of two fractional Brownian profiles (fBm) that slide one over the other. An earthquake occurs when there is an overlap of the two profiles representing the two fault faces and its energy is assumed proportional to the overlap surface. The SAM exhibits the Gutenberg-Richter law with an exponent $\beta$ related to the roughness index of the profiles. Apart from being analytically treatable, the model exhibits a non-trivial clustering in the spatio-temporal distribution of epicenters that strongly resembles the experimentally observed one. A generalized and more realistic version of the model exhibits the Omori scaling for the distribution of the aftershocks. The SAM lies in a different perspective with respect to usual models for seismicity. In this case, in fact, the critical behaviour is not Self-Organized but stems from the fractal geometry of the faults, which, on its turn, is supposed to arise as a consequence of geological processes on very long time scales with respect to the seismic dynamics. The explicit introduction of the fault geometry, as an active element of this complex phenomenology, represents the real novelty of our approach.Comment: 40 pages (Tex file plus 8 postscript figures), LaTeX, submitted to Phys. Rev.

Multi-scale roughness transfer in cold metal rolling

We report on a comparative Atomic Force Microscope (AFM) multi-scale roughness analysis of cold rolled Al alloy and steel roll, in order to characterize the roughness transfer from the steel roll to the workpiece in cold strip rolling processes. More than three orders of length-scale magnitudes were investigated from 100 microns to 50 nanometers on both types of surfaces. The analysis reveals that both types of surfaces are anisotropic self-affine surfaces. Transverse and longitudinal height profiles exhibit a different roughness exponent (Hurst exponent) z֊=0.93±0.03 and zʈ=0.5±0.05 Different length-scale cut-offs are obtained in each direction lsup=50mm, lsupՆ100mm. Height and slope distributions are also computed to complement this study. The above mentionned self-affine characteresitics are found to be very similar for the roll and the strip surfaces, which suggest that roughness transfer takes place from the macroscopic (100 µm) to the very small scale (50 nm)