18 research outputs found

    A monolithic resonant terahertz sensor element comprising a metamaterial absorber and micro-bolometer

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    In this article a monolithic resonant terahertz sensor element with a noise equivalent power superior to that of typical commercial room temperature single pixel terahertz detectors and capable of close to real time read-out rates is presented. The detector is constructed via the integration of a metamaterial absorber and a micro-bolometer sensor. An absorption magnitude of 57% at 2.5 THz, a minimum NEP of inline image and a thermal time constant of 68 ms for the sensor are measured. As a demonstration of detector capability, it is employed in a practical Nipkow terahertz imaging system. The monolithic resonant terahertz detector is readily scaled to focal plane array formats by adding standard read-out and addressing circuitry enabling compact, low-cost terahertz imaging

    On evolution of CMOS image sensors

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    CMOS Image Sensors have become the principal technology in majority of digital cameras. They started replacing the film and Charge Coupled Devices in the last decade with the promise of lower cost, lower power requirement, higher integration and the potential of focal plane processing. However, the principal factor behind their success has been the ability to utilise the shrinkage in CMOS technology to make smaller pixels, and thereby have more resolution without increasing the cost. With the market of image sensors exploding courtesy their inte- gration with communication and computation devices, technology developers improved the CMOS processes to have better optical performance. Nevertheless, the promises of focal plane processing as well as on-chip integration have not been fulfilled. The market is still being pushed by the desire of having higher number of pixels and better image quality, however, differentiation is being difficult for any image sensor manufacturer. In the paper, we will explore potential disruptive growth directions for CMOS Image sensors and ways to achieve the same

    A linear-array of 300-GHz antenna integrated GFET detectors on a flexible substrate

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    Terahertz imaging has potential in a variety of applications, such as non-invasive inspection, medical examination, and security. Many of these applications call for flexible focalplane arrays with large fields of view. Here, we demonstrate the implementation of a flexible, 300 GHz, 1 6 linear detector array based on graphene field-effect transistors and integrated bowtie antennas. Conservative estimates based on room temperature measurements at 300 GHz show element voltage responsivities in he range from 20 V/W to 70 V/W, and noise equivalent powers in the range from 0.06 nW/Hz0.5 to 0.2 nW/Hz0.5. Measured radiation patterns, showing good agreement with simulations, reveal half-power beamwidths of 45 and 60 for H- and E-planes, respectively. Characterization of the antenna array in a curved configuration shows that the voltage response is reduced up to 3 dB compared to the flat configuration due to a decrease of the antenna directivity. We believe that our preliminary results could serve as an enabling platform for the future development of flexible antenna arrays based on GFETs for curved focal plane imaging, important for wearable sensors and many other applications

    Advances on CMOS image sensors

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    This paper offers an introduction to the technological advances of image sensors designed using complementary metal–oxide–semiconductor (CMOS) processes along the last decades. We review some of those technological advances and examine potential disruptive growth directions for CMOS image sensors and proposed ways to achieve them. Those advances include breakthroughs on image quality such as resolution, capture speed, light sensitivity and color detection and advances on the computational imaging. The current trend is to push the innovation efforts even further as the market requires higher resolution, higher speed, lower power consumption and, mainly, lower cost sensors. Although CMOS image sensors are currently used in several different applications from consumer to defense to medical diagnosis, product differentiation is becoming both a requirement and a difficult goal for any image sensor manufacturer. The unique properties of CMOS process allows the integration of several signal processing techniques and are driving the impressive advancement of the computational imaging. With this paper, we offer a very comprehensive review of methods, techniques, designs and fabrication of CMOS image sensors that have impacted or might will impact the images sensor applications and markets

    On Evolution of CMOS Image Sensors

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    Terahertz responsivity of field-effect transistors under arbitrary biasing conditions

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    Current biased photoresponse model of long channel field-effect transistor (FET) detectors is introduced to describe the low frequency behavior in complex circuit environment. The model is applicable in all FET working regions, including subthreshold, linear, saturated modes, includes bulk potential variations, and handles the simultaneous gate-source and drain-source detection or source-driven topologies. The model is based on the phenomenological representation that links the photoresponse to the gate transconductance over drain current ratio (gm/ID) and circuit theory. A derived method is provided to analyze the detector behavior, to characterize existing antenna coupled detectors, and to predict the photoresponse in a complex circuit. The model is validated by measurements of 180 nm gate length silicon and GaAs high electron mobility FETs

    Packages for Terahertz Electronics

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    In the last couple of decades, solid-state device technologies, particularly electronic semiconductor devices, have been greatly advanced and investigated for possible adoption in various terahertz (THz) applications, such as imaging, security, and wireless communications. In tandem with these investigations, researchers have been exploring ways to package those THz electronic devices and integrated circuits for practical use. Packages are fundamentally expected to provide a physical housing for devices and integrated circuits (ICs) and reliable signal interconnections from the inside to the outside or vice versa. However, as frequency increases, we face several challenges associated with signal loss, dimensions, and fabrication. This paper provides a broad overview of recent progress in interconnections and packaging technologies dealing with these issues for THz electronics. In particular, emerging concepts based on commercial ceramic technologies, micromachining, and 3-D printing technologies for compact and lightweight packaging in practical applications are highlighted, along with metallic split blocks with rectangular waveguides, which are still considered the most valid and reliable approach.119Ysciescopu
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