Fully Synthesizable Low-Area Digital-to-Analog Converter With Graceful Degradation and Dynamic Power-Resolution Scaling

In this paper, a fully synthesizable digital-to-analog converter (DAC) is proposed. Based on a digital standard cell approach, the proposed DAC allows very low design effort, enables digital-like shrinkage across CMOS generations, low area at down-scaled technologies, and operation down to near-threshold voltages. The proposed DAC can operate at supply voltages that are significantly lower and/or at clock frequencies that are significantly greater than the intended design point, at the expense of moderate resolution degradation. In a 12-bit 40-nm testchip, graceful degradation of 0.3bit/100mV is achieved when V_DD is over-scaled down to 0.8V, and 1.4bit/100mV when further scaled down to 0.6V. The proposed DAC enables dynamic power-resolution tradeoff with 3X (2X) power saving for 1-bit resolution degradation at iso-sample rate (iso-resolution). A 12-bit DAC testchip designed with a fully automated standard cell flow in 40nm consumes 55µW at 27kS/s (9.1µW at 13.5kS/s) at a compact area of 500µm^2 and low voltage of 0.55V

Standard Cell-Based Ultra-Compact DACs in 40-nm CMOS

In this paper, very compact, standard cell-based Digital-to-Analog converters (DACs) based on the Dyadic Digital Pulse Modulation (DDPM) are presented. As fundamental contribution, an optimal sampling condition is analytically derived to enhance DDPM conversion with inherent suppression of spurious harmonics. Operation under such optimal condition is experimentally demonstrated to assure resolution up to 16 bits, with 9.4–239X area reduction compared to prior art. The digital nature of the circuits also allows extremely low design effort in the order of 10 man-hours, portability across CMOS generations, and operation at the lowest supply voltage reported to date. The limitations of DDPM converters, the benefits of the optimal sampling condition and digital calibration were explored through the optimized design and the experimental characterization of two DACs with moderate and high resolution. The first is a general-purpose DAC for baseband signals achieving 12-bit (11.6 ENOB) resolution at 110kS/s sample rate and consuming $50.8\mu \text{W}$ , the second is a DAC for DC calibration achieving 16-bit resolution with 3.1-LSB INL, 2.5-LSB DNL, $45\mu \text{W}$ power, at only $530\mu \text{m}^{2}$ area